• Title/Summary/Keyword: microscale beams

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A unified consistent couple stress beam theory for functionally graded microscale beams

  • Chih-Ping Wu;Zhen Huang
    • Steel and Composite Structures
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    • v.51 no.2
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    • pp.103-116
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    • 2024
  • Based on the consistent couple stress theory (CCST), we develop a unified formulation for analyzing the static bending and free vibration behaviors of functionally graded (FG) microscale beams (MBs). The strong forms of the CCST-based Euler-Bernoulli, Timoshenko, and Reddy beam theories, as well as the CCST-based sinusoidal, exponential, and hyperbolic shear deformation beam theories, can be obtained by assigning some specific shape functions of the shear deformations varying through the thickness direction of the FGMBs in the unified formulation. The above theories are thus included as special cases of the unified CCST. A comparative study between the results obtained using a variety of CCST-based beam theories and those obtained using their modified couple stress theory-based counterparts is carried out. The impacts of some essential factors on the deformation, stress, and natural frequency parameters of the FGMBs are examined, including the material length-scale parameter, the aspect ratio, and the material-property gradient index.

Use of homogenization theory to build a beam element with thermo-mechanical microscale properties

  • Schrefler, B.A.;Lefik, M.
    • Structural Engineering and Mechanics
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    • v.4 no.6
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    • pp.613-630
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    • 1996
  • The homogenization method is used to develop a beam element in space for thermo-mechanical analysis of unidirectional composites. Local stress and temperature field in the microscale are described using the function of homogenization. The global (macroscopic) behaviour of the structure is supposed to be that of a beam. Beam-type kinematical hypotheses (including independent shear rotations) are hence applied and superposed on the microdescription. A macroscopic stiffness matrix for such a beam element is then developed which contains the microscale properties of the single cell of periodicity. The presented model enables us to analyse without too much computational effort complicated composite structures such as e.g. toroidal coils of a fusion reactor. We need only a FE mesh sufficiently fine for a correct description of the local geometry of a single cell and a few of the newly developed elements for the description of the global behaviour. An unsmearing procedure gives the stress and temperature field in the different materials of a single cell.

Focused Electron Beam-Controlled Graphene Field-Effect Transistor

  • Kim, Songkil
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.33 no.5
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    • pp.360-366
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    • 2020
  • Focused electron beams with high energy acceleration are versatile probes. Focused electron beams can be used for high-resolution imaging and multi-mode nanofabrication, in combination with, molecular precursor delivery, in an electron microscopy environment. A high degree of control with atomic-to-microscale resolution, a focused electron beam allows for precise engineering of a graphene-based field-effect transistor (FET). In this study, the effect of electron irradiation on a graphene FET was systematically investigated. A separate evaluation of the electron beam induced transport properties at the graphene channel and the graphene-metal contacts was conducted. This provided on-demand strategies for tuning transfer characteristics of graphene FETs by focused electron beam irradiation.

Effects of Temperature Coefficients for Dielectric Constants on Thermoreflectances and Thermal Responses of Metal Thin Films Exposed to Ultrashort Pulse Laser Beams

  • Seungho Park
    • International Journal of Air-Conditioning and Refrigeration
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    • v.10 no.1
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    • pp.1-9
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    • 2002
  • Effects of temperature coefficients fur dielectric constants on transient reflectances and thermal responses have been investigated for a metal(gold) thin-film during ultrashort pulse laser heating. Heating processes are simulated using the conventional conduction model(parabolic one-step, POS), the parabolic tow-step model(PTS), the hyperbolic two-step model(HTS). Results fro the HTS model are very similar to those from the PTS model, since the laser heating time in this study is considerably greater than the electron relaxation time. PTS and HTS models, however, result in completely different temperature profiles from those obtained by the POS model due to slow electron-lattice interactions compared to laser pulse duration. Transient reflectances are directly estimated from the linear relationship between electron temperature and complex dielectric constants, while conventional approaches assume that the change in reflectances is proportional to that in temperatuer. Reflectances at the front surface vary considerably for various dielectric constants, while those at the rear surface remain unchanged relatively.