• Journal of the Korea Academia-Industrial cooperation Society
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• v.12 no.11
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• pp.5172-5177
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• 2011

This paper presents a reflection coating design scheme in the thin-film silicon solar cell. The antireflection(high reflection) coating skill is needed in the front(back) panel of the thin-film solar cell to improve an efficiency of light absorbing. In the single structure a reflectivity is changed according to the thickness of coating for antireflection scheme and its minimum value can be obtained by controlling thickness of coating. In the symmetric multi layer structure low reflectivity can be obtained in the wide wavelength range. And we also find that high reflectivity can be obtained through multi layer structure, which has alternate layers of high and low material, for high reflection scheme in the back panel.

• Journal of Sensor Science and Technology
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• v.28 no.4
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• pp.262-265
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• 2019

The effect of inter-band transition on surface plasmon resonance in gold thin film was investigated. We induced localized inter-band transition in the film by using incident light on its surface from a green laser (532 nm) source, and the surface plasmon resonance for inter-band transition was investigated at different wavelengths. It was determined that the reflectivity of blue light (450 nm) was significantly reduced in the region where the green laser was incident. We demonstrated that this decrease is mainly due to the coupling between the blue light and the surface plasmon resonance of excited electrons in higher energy states, based on experimental results for the incident and polarization angle-dependent reflectivity of the blue light.

• Journal of Magnetics
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• v.18 no.2
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• pp.86-89
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• 2013

This paper shows a new effective approach to measure crystallization temperature of soft magnetic underlayer (SUL) for next generation of heat assisted perpendicular recording media. This approach uses temperature dependent reflectivity, which shows a clear jump when samples are crystallized. To achieve this measurement, an optical system is set up using hot plate and infrared laser. Reflectivity of SUL $(Co_{70}Fe_{30})_{92}Ta_3Zr_5$ shows a clear jump at its amorphous-crystalline transition temperature. Experiment results show this effect is clear in infrared region, and is weak for visible light.

• Journal of the Korean institute of surface engineering
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• v.43 no.4
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• pp.187-193
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• 2010

The colored films formed on 304 stainless steel plates by immersion treatment and electrochemical one in a solution containing sulphuric acids and chromic acids were studied by SEM, AES, and spectrophotometer. The thicknesses of the films by 20 minutes treatment were about 200 nm and it became thinner as the treatment times were increased. The surface texture showed a tortuous network of interlinking pathways. The color of the 304 steel surface changed from metallic white to gray, black, red, yellow-green, and green-blue, gradually, by the treatment time was increased. The reflectivity measured by UV-VIS-NIR spectrophotometer was reduced from max. 38% of basis metal to min. 3.5% of colored surface.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.181-181
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• 2013

Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

• Journal of the Korea Academia-Industrial cooperation Society
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• v.18 no.5
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• pp.565-570
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• 2017

The various techniques proposed previously to obtain a good antireflection(AR) coating induce a scattering of incident light by nanoparticles or control the refractive index by using different materials. This paper compares a suggested graded index profile with the quintic index profile previously suggested for producing an index profile that gives good performance from an AR coating. We assume the structure of the AR coating has three, six, and nine layers with 180 nm total thickness. The wavelength of incident light ranges from 300 nm to 1100 nm. We use the transfer matrix theory for a single layer to obtain the reflectivity of three, six, and nine layers. The reflectivity of two different index profiles with three, six, and nine layers is compared. As a result, the suggested graded index profile shows lower reflectivity than the quintic index profile with three layers, especially in the wavelength range from about 600 nm to 1100 nm. Therefore, we expect that these results can be applied to optical devices and filters in the range from visible(red) to near infrared.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.29 no.5
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• pp.229-237
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• 2019

For maintaining high visibility of lane, the high refractive index glass beads with excellent retro-reflectivity are usually applied on the road marking paint. The retro-reflectivity standard of general road marking is different in each country; it is defined as $240mcd/m^2{\cdot}lux$ based on white light in Korea and $250{\sim}300mcd/m^2{\cdot}lux$ in developed countries. In this paper, the recent trends on the manufacturing technology of glass beads suitable for autonomous driving age as well as the road marking regulations has been reviewed. Also, in preparation for the commercialization of autonomous vehicles in the future, the necessity of raising the standard value and improving the glass bead properties were proposed.

• Journal of the Microelectronics and Packaging Society
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• v.20 no.2
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• pp.29-32
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• 2013

The surface roughness and reflectivity of electroless-plated Sn-3.5 wt%Ag on a LED (light emitting diode) lead frame were investigated. Cu electroplating was carried out prior to electroless plating of Sn-3.5Ag to improve the reflectivity of the Sn-3.5Ag deposit. In order to investigate the effect of stirring speed and temperature of the plating solution, surface roughness and reflectivity was measured. The experimental results revealed that the thickness of the deposit layer increased with stirring speed and temperature of the plating solution. Stirring speed is increased from 100 to 300 rpm, the surface roughness was reduced from 0.513 to 0.266 ${\mu}m$, and the reflectivity increased from 1.67 to 1.84 GAM. As temperature of the plating solution increased from 25 to $45^{\circ}C$, the surface roughness reduced from 0.507 to 0.350 ${\mu}m$, and the reflectivity increased from 1.68 to 1.84 GAM.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2009.06a
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• pp.299-300
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• 2009

We have studied an organic layer and semitransparent Al cathode thickness dependent optical properties for top-emission organic light-emitting diodes. Device structure is ITO(170nm)/TPD(xnm)/$Alq_3$(ynm)/LiF(0.5nm)/Al(100nm) and Al(100nm)/TPD(xnm)/$Alq_3$(ynm)/LiF(0.5nm)/Al(25nm). While a thickness of total, organic layer was varied from 85nm to 165nm, a ratio of those two layers was kept to be about 2:3. Then it was compared with that of bottom devices. And a thickness of semitransparent Al cathode was varied from 20nm to 30nm for the device with an organic layer thickness of 140nm. We were able to control the emission spectra from the top-emission organic light-emitting diodes.

• Journal of the Korean Society for Precision Engineering
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• v.21 no.4
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• pp.79-87
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• 2004

The light pattern reflected from a machined surface contains some information like roughness and profile on the projected surface as expected in the Beckmann-Spizzichino model. In applying the theory into a real reliable measuring device, many parameters such as incident light power, wave length, spot size should be kept a constant optical value. However, the reflected light power is likely to change with the environmental noise, the variations of the light source, the reflectivity of the surface, etc. even though the incident light power is constant. In this study, a method for adjusting the incident light power to keep the reflected light power projected on a CMOS image sensor constant was proposed and a simple adjustment algorithm based on PI digital control was examined. Experiments verified that the proposed method made the surface roughness measurement better and more reliable even under variations of the height of light source.