• Current Applied Physics
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• v.18 no.11
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• pp.1225-1229
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• 2018

In this paper, we investigated the electronic structures and defect states of $SrLaMgTaO_6$ (SLMTO) double perovskite structures by using resonant inelastic x-ray scattering. Recently, $Eu^{3+}$ doped SLMTO red phosphors have been vigorously investigated due to their higher red emission efficiency compared to commercial white light emitting diodes (W-LED). However, a comprehensive understanding on the electronic structures and defect states of host SLMTO compounds, which are specifically related to the W-LED and photoluminescence (PL), is far from complete. Here, we found that the PL spectra of SLMTO powder compounds sintered at a higher temperature, $1400^{\circ}C$, were weaker in the blue emission regions (at around 400 nm) and became enhanced in near infrared (NIR) regions compared to those sintered at $1200^{\circ}C$. To elucidate the difference of the PL spectra, we performed resonant inelastic x-ray spectroscopy (RIXS) at Ta L-edge. Our RIXS result implies that the microscopic origin of different PL spectra is not relevant to the Ta-related defects and oxygen vacancies.

• Proceedings of the Korean Magnestics Society Conference
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• 2017.05a
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• pp.16-16
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• 2017

• Proceedings of the Korean Vacuum Society Conference
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• 2010.08a
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• pp.61-61
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• 2010

By using high resolution x-ray photoelectron spectroscopy, we show that inelastic scattering of photoelectron at low temperature (30K~50K) generates two kinds of oxygen species on Pt (111) surface. Intense synchrotron radiation source dissociates oxygen molecules into chemisorbed atomic oxygen and induces the formation of PtO on surface. Estimated coverage of dissociated atomic oxygen is 0.5 ML, suggesting possible formation of p($2{\times}1$) surface structure, while PtO coverage shows saturation coverage of 0.5 ML. Molecular oxygen dosed at 30 K undergoes thermally activated transition from physisorbed to chemisorbed state at around 40K.

• 한국초전도학회:학술대회논문집
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• 2009.07a
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• pp.4-4
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• 2009

• Proceedings of the Korean Vacuum Society Conference
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• 2010.02a
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• pp.382-382
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• 2010

$TaO_2$ thin films as gate dielectrics have been proposed to overcome the problems of tunneling current and degradation mobility in achieving a thin equivalent oxide thickness. An extremely thin $SiO_2$ layer is used in order to separate the carrier in MOSFETchannel from the dielectric field fluctuation caused by phonons in the dielectric which decreases the carrier mobility. The electronic and optical properties influenced the device performance to a great extent. The atomic structure of amorphous and crystalline Tantalum oxide ($TaO_2$) gate dielectrics thin film on Si (100) were grown by utilizing atomic layer deposition method was examined using Ta-K edge x-ray absorption spectroscopy. By using X-ray photoelectron spectroscopy and reflection electron energy loss spectroscopy (REELS) the electronic and optical properties was obtained. In this study, the band gap (3.400.1 eV) and the optical properties of $TaO_2$ thin films were obtained from the experimental inelastic scattering cross section of reflection electron energy loss spectroscopy (REELS) spectra. EXAFS spectra show that the ordered bonding of Ta-Ta for c-$TaO_2$ which is not for c-$TaO_2$ thin film. The optical properties' e.g., index refractive (n), extinction coefficient (k) and dielectric function ($\varepsilon$) were obtained from REELS spectra by using QUEELS-$\varepsilon$(k, $\omega$)-REELS software shows good agreement with other results. The energy-dependent behaviors of reflection, absorption or transparency in $TaO_2$ thin films also have been determined from the optical properties.

• Geophysics and Geophysical Exploration
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• v.22 no.3
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• pp.149-159
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• 2019

Borehole elemental concentration logging, measuring neutron-induced gamma rays by inelastic scattering and neutron capture interactions between neutron and formation, delivers concentrations of the most common elements found in the minerals and fluids of subsurface formation. X-ray diffraction and X-ray fluorescence analysis from core samples are traditionally used to understand formation composition and mineralogy, but it represents only part of formations. Additionally, it is difficult to obtain elemental analysis over the whole intervals because of poor core recovery zones such as fractures or sand layers mainly responsible for groundwater flow. The development of borehole technique for in situ elemental analysis plays a key role in assessing subsurface environment. Although this technology has advanced consistently starting from conventional and unconventional resources evaluation, it has been considered as exclusive techniques of some major service company. As regards domestic research and development, it has still remained an unexplored field because of some barriers such as the deficiency of detailed information on tools and calibration facility for chemistry and mineralogy database. This article reviews the basic theory of spectroscopy measurements, system configuration, calibration facility, and current status. In addition, this article introduces the domestic researches and self-development status on borehole elemental concentration tools.