Current Applied Physics

Korean Physical Society (한국물리학회)
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Resonant inelastic X-ray scattering of tantalum double perovskite structures

  • Oh, Ju Hyun (Department of Physics, Pukyong National University) ;
  • Kim, Jung Ho (Advanced Photon Source, Argonne National Laboratory) ;
  • Jeong, Jung Hyun (Department of Physics, Pukyong National University) ;
  • Chang, Seo Hyoung (Department of Physics, Pukyong National University)
  • Received : 2018.04.15
  • Accepted : 2018.05.11
  • Published : 2018.11.30
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Abstract

In this paper, we investigated the electronic structures and defect states of $SrLaMgTaO_6$ (SLMTO) double perovskite structures by using resonant inelastic x-ray scattering. Recently, $Eu^{3+}$ doped SLMTO red phosphors have been vigorously investigated due to their higher red emission efficiency compared to commercial white light emitting diodes (W-LED). However, a comprehensive understanding on the electronic structures and defect states of host SLMTO compounds, which are specifically related to the W-LED and photoluminescence (PL), is far from complete. Here, we found that the PL spectra of SLMTO powder compounds sintered at a higher temperature, $1400^{\circ}C$, were weaker in the blue emission regions (at around 400 nm) and became enhanced in near infrared (NIR) regions compared to those sintered at $1200^{\circ}C$. To elucidate the difference of the PL spectra, we performed resonant inelastic x-ray spectroscopy (RIXS) at Ta L-edge. Our RIXS result implies that the microscopic origin of different PL spectra is not relevant to the Ta-related defects and oxygen vacancies.

Keywords

Acknowledgement

Supported by : Pukyong National University

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