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http://dx.doi.org/10.1016/j.cap.2018.05.014

Resonant inelastic X-ray scattering of tantalum double perovskite structures  

Oh, Ju Hyun (Department of Physics, Pukyong National University)
Kim, Jung Ho (Advanced Photon Source, Argonne National Laboratory)
Jeong, Jung Hyun (Department of Physics, Pukyong National University)
Chang, Seo Hyoung (Department of Physics, Pukyong National University)
Publication Information
Current Applied Physics / v.18, no.11, 2018 , pp. 1225-1229 More about this Journal
Abstract
In this paper, we investigated the electronic structures and defect states of $SrLaMgTaO_6$ (SLMTO) double perovskite structures by using resonant inelastic x-ray scattering. Recently, $Eu^{3+}$ doped SLMTO red phosphors have been vigorously investigated due to their higher red emission efficiency compared to commercial white light emitting diodes (W-LED). However, a comprehensive understanding on the electronic structures and defect states of host SLMTO compounds, which are specifically related to the W-LED and photoluminescence (PL), is far from complete. Here, we found that the PL spectra of SLMTO powder compounds sintered at a higher temperature, $1400^{\circ}C$, were weaker in the blue emission regions (at around 400 nm) and became enhanced in near infrared (NIR) regions compared to those sintered at $1200^{\circ}C$. To elucidate the difference of the PL spectra, we performed resonant inelastic x-ray spectroscopy (RIXS) at Ta L-edge. Our RIXS result implies that the microscopic origin of different PL spectra is not relevant to the Ta-related defects and oxygen vacancies.
Keywords
Resonant inelastic X-ray scattering; $SrLaMgTaO_6$; Double perovskites; Light emitting diodes;
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