• 대한음성학회지:말소리
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• 제62호
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• pp.149-161
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• 2007

In this paper we proposed a modified reliability function for improving bimodal speaker identification(BSI) performance. The convectional reliability function, used by N. Fox[1], is extended by introducing an optimization factor. We evaluated the proposed method in BSI domain. A BSI system was implemented based on GMM and it was tested using VidTIMIT database. Through speaker identification experiments we verified the usefulness of our proposed method. The experiments showed the improved performance, i.e., the reduction of error rate by 39%.

• 대한임베디드공학회논문지
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• 제14권4호
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• pp.177-186
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• 2019

In wireless sensor networks, the transmission success ratio would be decreased when the scale of the WSNs increased. To defeat this problem, we propose a multipath routing based on opportunistic routing for improving end-to-end reliability in large-scale wireless sensor networks. The proposed scheme exploits the advantages of existing opportunistic routing and achieves high end-to-end success ratio by branching like a multipath routing through local decision without information of the whole network. As a result of the simulation result, the proposed scheme shows a similar or higher end-to-end transmission success ratio and less energy consumption rather than the existing scheme.

• International journal of advanced smart convergence
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• 제9권4호
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• pp.192-197
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• 2020

In this study, we try to find ways to recognize face recognition more stably and to improve the effectiveness and reliability of face recognition. In order to improve the face recognition rate, a lot of data must be used, but that does not necessarily mean that the recognition rate is improved. Another criterion for improving the recognition rate can be seen that the top/bottom of the recognition rate is determined depending on how accurately or precisely the degree of classification of the data to be used is made. There are various methods for classification analysis, but in this study, classification analysis is performed using a support vector machine (SVM). In this study, feature information is extracted using a normalized image with rotation information, and then projected onto the eigenspace to investigate the relationship between the feature values through the classification analysis of SVM. Verification through classification analysis can improve the effectiveness and reliability of various recognition fields such as object recognition as well as face recognition, and will be of great help in improving recognition rates.

• 한국신뢰성학회지:신뢰성응용연구
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• 제3권2호
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• pp.103-116
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• 2003

We carry out reliability tests and investigate the failure mechanisms. of the wafer level vacuum packaged MEMS gyroscope sensor using an accelerated degradation test. The accelerated degradation test (ADT) is used to evaluate reliability (and/or life) of the MEMS vacuum package and to select the accelerated test conditions, which reduce the reliability testing time. Using the failure distribution model and stress-life model, we are able to estimate the average life time of the vacuum package, which is well agreed with the measured data. After improving several package reliability issues such as prevention of gas diffusion through package, we carry out another set of accelerated tests at the chosen acceleration level. The results show that reliability of the vacuum packaged gyroscope has been greatly improved and can survive without degradation of performance, which is the Q-factor in gyroscope sensor, during environmental stress reliability tests.

• International Journal of Reliability and Applications
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• 제10권1호
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• pp.17-32
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• 2009

The aim of this work is to generalize reliability equivalence technique to apply it to a system consists of n independent and non-identical components connected in series system, that have mixing constant failure rates. We shall improve the system by using some reliability techniques: (i) reducing some failure rates; (ii) add hot reduncy components; (iii) add cold reduncy components; (iv) add cold reduncy components with imperfect switches. We start by establishing two different types of reliability equivalence factors, the survival equivalence (SRE), and mean reliability equivalence (MRE) factors. Also, we introduced some numerical results.

• 전기학회논문지
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• 제60권7호
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• pp.1354-1359
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• 2011

This paper presents a novel methodology for improving the reliability of electromagnetic devices and machines based on the reliability-based design optimization method. To achieve this, the method includes reliability analysis and optimization process taking into account uncertainties of design variables. One of the first-order reliability analysis techniques, called reliability index approach, is adopted to evaluate the reliability of performance functions with respect to probabilistic design variables. The proposed method has been successfully applied to designing a superconducting magnetic energy storage system. For verifying the efficiency and accuracy of the method, the results are compared with those of conventional optimization methods.

• 한국인터넷방송통신학회논문지
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• 제12권2호
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• pp.35-41
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• 2012

반도체 집적 기술의 발전은 단위 면적당 더 많은 캐쉬 메모리를 프로세서 내에 적재할 수 있도록 하였으나, 이로 인하여 프로세서는 소프트 에러에 대해 더 취약해지는 추세이며, 이는 설계 고려사항 중 신뢰성의 비중이 점점 더 커짐을 의미한다. 본 연구에서는 캐쉬 메모리 계층 중 소프트 에러에 가장 취약한 Last Level Cache에 대하여 낮은 에너지 소모와 공간 오버헤드를 갖는 저비용의 신뢰성 향상 기법에 대하여 제안하고 실험하였다. 실험 결과 소프트 에러에 대해 95.4%의 높은 에러 보호율을 보였으며, 성능은 단지 0.26%이하로 저하되었다. 또한 추가적인 에너지는 2.96%만 요구되었다.

• 한국전기전자재료학회논문지
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• 제18권5호
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• pp.431-438
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• 2005

In this paper, we propose the built-in current testing circuit for improving reliability As the integrated CMOS circuits in a chip are increased, the testability on design and fabrication should be considered to reduce the cost of testing and to guarantee the reliability In addition, the high degree of integration makes more failures which are different from conventional static failures and introduced by the short between transistor nodes and the bridging fault. The proposed built-in current testing method is useful for detecting not only these failures but also low current level failures and faster than conventional method. In normal mode, the detecting circuit is turned off to eliminate the degradation of CUT(Circuits Under Testing). The differential input stage in detecting circuit prevents the degradation of CUT in test mode. It is expected that this circuit improves the quality of semiconductor products, the reliability and the testability.

• 디지털산업정보학회논문지
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• 제16권4호
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• pp.111-121
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• 2020

This study analyzed the effects on system quality, learning commitment, and satisfaction in a mobile environment. A survey was conducted on 192 students enrolled in K University, and the research results are as follows. first, it was found that usefulness had an effect on learning commitment, but connectivity and reliability did not affect learning commitment. second, it was found that the usefulness and connectivity of the system quality had a significant effect on the satisfaction of use. third, the intermediary effect of learning immersion was verified as the connectivity, reliability, and usefulness of the system quality influence the satisfaction of use. connectivity and reliability had no mediating effect of learning commitment, and usefulness was found to play a partial mediating role in affecting user satisfaction. This study is meaningful in that it can provide a plan for improving the quality management of mobile learning and improving the learning effect by analyzing the effects on mobile learning from multiple perspectives.

• Nuclear Engineering and Technology
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• 제55권4호
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• pp.1528-1539
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• 2023

Since the leakage of sodium in an SFR (sodium-cooled fast reactor) causes an explosion upon reaction with air and water, sodium leakages represent an important safety issue. In this study, a novel technique for improving the reliability of sodium leakage detection applying DDVR (dynamic data validation and reconciliation) is proposed and verified to resolve this technical issue. DDVR is an approach that aims to improve the accuracy of a target system in a dynamic state by minimizing random errors, such as from the uncertainty of instruments and the surrounding environment, and by eliminating gross errors, such as instrument failure, miscalibration, or aging, using the spatial redundancy of measurements in a physical model and the reliability information of the instruments. DDVR also makes it possible to estimate the state of unmeasured points. To validate this approach for supporting sodium leakage detection, this study applies experimental data from a sodium leakage detection experiment performed by the Korea Atomic Energy Research Institute. The validation results show that the reliability of sodium leakage detection is improved by cooperation between DDVR and hardware measurements. Based on these findings, technology integrating software and hardware approaches is suggested to improve the reliability of sodium leakage detection by presenting the expected true state of the system.