• Title/Summary/Keyword: imperfect stage

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Identification of the Imperfect Stage of Mycosphaerella nawae Causing Circular Leaf Spot of Persimmon in Korea (감나무 둥근무늬낙엽병균 Mycosphaerella nawae의 불완전 세대 동정)

  • 권진혁;강수웅;박창석;김희규
    • Korean Journal Plant Pathology
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    • v.14 no.5
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    • pp.397-401
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    • 1998
  • Asexual spores of Mycosphaerella nawae were profusely produced on PDA after a prolonged incubation at $25^{\circ}C$ for 90 days. When persimmon trees were artificially inoculated by the conidial suspension, typical symptoms of circular leaf spot of persimmon appeared on the leaves two month later. The imperfect stag of the fungus was identified as Ramularia sp. based on following morphological characteristics examined under a light microscope and a scanning electron microscope. Conidia were mostly ellipsoid, but occasionally cylindrical, elongated oval, taro, peanut or gourd shapes and measured as 12.2~32.6$\times$6.1~10.2 ${\mu}{\textrm}{m}$. erect, hyaline, colorless-light brown. Conidia were formed solitarily or in chains on a medium and infected leaves. Conidiophore was erect, hyaline, colorless-light brown. and the size was 20.4~102.0$\times$3.1~10.2 ${\mu}{\textrm}{m}$, respectively. In this paper, we firstly demonstratrated that asexual spores of M. nawae induced persimmon circular leaf spot in nature as well as sexual spores of the fungus. Therefore, it is hypothesized that the imperfect stage of the fungus plays an important role in nature for epidemics as secondary inoculum.

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A Study on the Optimum Release Time Determination of Developing Software Considering Imperfect Debugging (불완전 디버깅을 고려한 개발 소프트웨어의 최적 인도 시기 결정 방법에 관한 연구)

  • Che Gyu Shik
    • The Transactions of the Korean Institute of Electrical Engineers D
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    • v.54 no.6
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    • pp.396-402
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    • 2005
  • The software reliability growth model(SRGM) has been developed in order to evaluate such measures as remaining fault number, fault rate, and reliability for the developing stage software. Most of the study literatures assumed that this detecting efficiency was perfect. However the actual fault detecting is generally imperfect, and widely known to many persons. It is not easy to develop and remove the fault existing in the software because the fault finding is difficult, and the exact solving method also not easy, and new fault may be introduced depending on the tester's capability. There, the fault removing efficiency influences the software reliability growth or developing cost of software. It is a very useful measure throughout the developing stage, much helpful for the developer to evaluate the debugging efficiency, and evaluate additional workload. Hence, the study for the imperfect debugging is important in point of software reliability and cost. This paper proposes that the fault debugging is imperfect and new fault may be introduced for the developing software during the developing stage.

Achieving High Accuracy and Precision Inkjet Drop Placement Using Imperfect Components in an Imperfect Environment

  • Xu, Tianzong;Albertalli, David
    • 한국정보디스플레이학회:학술대회논문집
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    • 2006.08a
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    • pp.1660-1665
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    • 2006
  • Drop placement accuracy and precision are the critical performance values of industrial ink jet deposition systems. Imperfect components and environments have severe impacts on drop placement. Litrex has identified over 120 error sources and developed engineering solutions to address the errors. In this paper, improved results using thermal compensation and stage mapping techniques are demonstrated. A recent progress in inkjet fabrication of multi-color electrophoretic display on flexible substrate with large distortion is also demonstrated.

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A Study on the Imperfect Debugging Effect on Release Time of Dedicated Develping Software (불완전디버깅이 주문형 개발소프트웨어의 인도시기에 미치는 영향 연구)

  • Che Gyu Shik
    • Journal of Information Technology Applications and Management
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    • v.11 no.4
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    • pp.87-94
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    • 2004
  • The software reliability growth model(SRGM) has been developed in order to estimate such reliability measures as remaining fault number, failure rate and reliability for the developing stage software. Almost of them assumed that the faults detected during testing were evetually removed. Namely, they have studied SRGM based on the assumption that the faults detected during testing were perfectly removed. The fault removing efficiency. however. IS imperfect and it is widely known as so in general. It is very difficult to remove detected fault perfectly because the fault detecting is not easy and new error may be introduced during debugging and correcting. Therefore, the fault detecting efficiency may influence the SRGM or cost of developing software. It is a very useful measure for the developing software. much helpful for the developer to evaluate the debugging efficiency, and, moreover, help to additional workloads necessary. Therefore. it is very important to evaluate the effect of imperfect dubugging in point of SRGM and cost. and may influence the optimal release time and operational budget. I extent and study the generally used reliability and cost models to the imperfect debugging range in this paper.

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A Study on the Imperfect Debugging of Logistic Testing Function (로지스틱 테스트함수의 불완전 디버깅에 관한 연구)

  • Che, Gyu-Shik;Moon, Myung-Ho;Yang, Kye-Tak
    • Journal of Advanced Navigation Technology
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    • v.14 no.1
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    • pp.119-126
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    • 2010
  • The software reliability growth model(SRGM) has been developed in order to estimate such reliability measures as remaining fault number, failure rate and reliability for the developing stage software. Almost of them assumed that the faults detected during testing were eventually removed. Namely, they have studied SRGM based on the assumption that the faults detected during testing were perfectly removed. The fault removing efficiency, however, is imperfect and it is widely known as so in general. It is very difficult to remove detected fault perfectly because the fault detecting is not easy and new error may be introduced during debugging and correcting. Therefore, We want to study imperfect software testing effort for the logistic testing effort which is thought to be the most adequate in this paper.

Scab Disease of Aralia elata Caused by Elsinoe araliae (Elsinoe araliae에 의한 두릅나무 더뎅이병)

  • 최준근;김종진;정태성
    • Korean Journal Plant Pathology
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    • v.14 no.5
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    • pp.545-547
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    • 1998
  • Scab disease of Aralia elata (Miq.) Seemann occurred severely in Kangwon province, Korea. First, brown spots were formed on leaves and enlarged along vein. The infected leaves including petiole and midrib were twisted forming scab and died eventually. Also the disease infected twigs and trunks of the tree forming scab. Conidia, ascospores and asci developed in locule were observed in the infected tissue. The causal organism of the scab disease of Araliae elata was isolated and identified as Elsinoe araliae Yamamoto (imperfect stage: Sphaceloma araliae Jenkins) based on the morphological and cultural characteristics, and pathogenic test.

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Performance of Parallel Interference Cancellation with Reverse-Link Synchronous Transmission Technique for DS-CDMA System in Multipath Fading Channels with Imperfect Power Control (불완전 전력 제어와 다중 경로 페이딩 채널에서 DS-CDMA 시스템을 위한 역방향링크 동기식 전송을 채용하는 병렬식 간섭 제거기의 성능)

  • Hwang Seung-Hoon;Kim Yong-Seok;Rhee Jin-Koo
    • Journal of the Institute of Electronics Engineers of Korea TC
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    • v.42 no.11
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    • pp.87-92
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    • 2005
  • This paper analyzes the performance for an improved multistage parallel interference cancellation (PIC) technique with a reverse-link synchronous transmission technique (RLSTT) for DS-CDMA system in a frequency-selective Rayleigh fading channel with an imperfect power control scheme. The performance degradation due to power control error (PCE), which is approximated by a log-normally distributed random variable, is estimated as a function of the standard deviation of the PCE. The uncoded bit error performance is evaluated in order to estimate the system capacity. Comparing with the conventional one-stage PIC system, we show achievable gain around $60\%$ by the RLSTT even in the presence of PCE. We conclude that the capacity can be further improved via RLSTT, which alleviates the detrimental effects of the PCE

Performance Improvement of Asunchronous DS-CDMA Systems with a Multistage Interference Canceller in the Presence of Timing and Phase Errors (칩 동기 에러와 위상 에러가 존재하는 환경에서 다단 간섭제거기에 의한 비동기 DS-CDMA 시스템의 성능 개선)

  • 김봉철;강근정;오창헌;조성준
    • The Journal of Korean Institute of Electromagnetic Engineering and Science
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    • v.12 no.1
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    • pp.1-10
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    • 2001
  • In this paper, a multistage parallel interference canceller (MPIC) and a partial multistage parallel interference canceller (PMPIC) are employed as a technique for improving the performance of the asynchronous DS-CDMA systems. The degree of the effect of the timing errors and phase errors on the interference cancellation capability of two types of cancellers is theoretically analyzed and the computer simulation is performed to confirm the analytical results. From the results, the large performance improvement is obtained by employing MPIC and PMPIC with perfect synchronization over the conventional matched filter, and the performance improvement obtained by MPIC and PMPIC is very close to each other as the number of the stage of MPIC and PMPIC increases. When the timing errors and phase errors are considered (in the case of imperfect synchronization), the performance improvement reduces as the performance degradation at the first stage (no cancellation) has a bad effect on the decision statistics at each stage. However MPIC and PMPIC have the strong interference cancellation capability in spite of imperfect synchronization as the number of the stage increases. An interference canceller, which has the strong interference cancellation capability as well as lower complexity for the implementation, is needed for practical systems with timing errors and phase errors because the perfect synchronization is impossible. Therefore, the excellent tradeoff between complexity and performance offered by PMPIC makes it an attractive approach for practical systems.

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T&E Process for Safety-Critical CNS/ATM Systems (안전필수항행시스템의 시험평가 프로세스)

  • Kang, Ja-Young;Kim, Mu-Geun;Kim, Young-Hoon;Lim, In-Kyu
    • Journal of Advanced Navigation Technology
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    • v.21 no.1
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    • pp.50-57
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    • 2017
  • Recently, safety-critical aviation system development programs promoted domestically have been terminated in the middle stage or they have not been put to practical use at the final stage. The program failure may be caused by various factors, but this study focused on imperfect test and evaluation(T&E) procedures. In general, T&E process of a safety-critical system must be distributed throughout the entire life-cycle of the system, have a continuity in phases, and can be implemented in a variety of ways depending on the maturity of the system development and acquisition strategy. This paper aims to present a new strategy by analyzing the domestic and overseas T&E processes to reduce the risk of domestic safety-critical CNS/ATM system development program and increase the success rate of program. First, we discuss the verification and validation techniques for safety-critical systems, analyze the T&E procedures of advanced institutes and the domestic situation, and then compare the domestic and overseas T&E processes to complement the imperfect testing procedure.

A new disease, powdery mildew, caused by Oidiopsis taurica on Capsium spp. (고추에 발생하는 흰가루병)

  • Cha Jae Soon;Ki Un Kye;Cho Back Ho;Kim Ki Chung
    • Korean journal of applied entomology
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    • v.19 no.4 s.45
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    • pp.240-242
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    • 1980
  • Recently, a powdery mildew on the leaves of Capsium spp., Pimento and pepper, occurred greatly in the vinyl-house at Seungchon area, Chonnam province. According to the field survey, the disease is severe at high temperature and high humidity conditions in the vinyl house. Diseased loaves were severely fallen and remained only several top leaves, thus the setting and thickening of fruits were greatly depressed. The pathogenic fungus was identified as Oidiopsis taurica(Lev.) Arn., imperfect stage of Leveillula taurica (Lev.) Arn., The perfect stage of fungus was not observed. Optimum temperatures for conidial germination ranged at $25-30^{\circ}C$ with high humidity.

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