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A Study on the Imperfect Debugging of Logistic Testing Function  

Che, Gyu-Shik (Bioengineering Dept. in Konyang University)
Moon, Myung-Ho (Bioengineering Dept. in Konyang University)
Yang, Kye-Tak (Information Security Dept. in Konyang University)
Abstract
The software reliability growth model(SRGM) has been developed in order to estimate such reliability measures as remaining fault number, failure rate and reliability for the developing stage software. Almost of them assumed that the faults detected during testing were eventually removed. Namely, they have studied SRGM based on the assumption that the faults detected during testing were perfectly removed. The fault removing efficiency, however, is imperfect and it is widely known as so in general. It is very difficult to remove detected fault perfectly because the fault detecting is not easy and new error may be introduced during debugging and correcting. Therefore, We want to study imperfect software testing effort for the logistic testing effort which is thought to be the most adequate in this paper.
Keywords
Testing effort function; Failure rate; The mean value function; Logistic testing function; Reliability;
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