• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.07a
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• pp.207-210
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• 2001

Electrical equipment for railway is always experiencing wear and degradation by mechanical, electrical and environmental stress in service and the fault or the accident of high voltage main circuit directly causes operation interruption. Particularly propulsion drive of high speed switching inverter takes the form of specific degradation mechanism such as fast rising transient surge, reflective overvoltage and harmonic stress, and it is known that it threatens the long life and the reliability of electrical equipment. In this paper, statistics of fault and accident on main electrical equipment for railway are presented and also insulation degradation mechanism, which governs end life of electrical device, is analyzed. Finally the method of fault respondence and reliability improvement on the main electrical equipments will be reviewed in order to prevent operation interruption.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2001.07a
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• pp.25-28
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• 2001

Recently, STI(Shallow Trench Isolation) process has attracted attention for high density of semiconductor device as a essential isolation technology. Without applying the conventional complex reverse moat process, CMP(Chemical Mechanical Polishing) has established the Process simplification. However, STI-CMP process have various defects such as nitride residue, torn oxide defect, damage of silicon active region, etc. To solve this problem, in this paper, we discussed to determine the control limit of process, which can entirely remove oxide on nitride from the moat area of high density as reducing the damage of moat area and minimizing dishing effect in the large field area. We, also, evaluated the reliability and reproducibility of STI-CMP process through the optimal process conditions.

• Proceedings of the Safety Management and Science Conference
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• 2009.04a
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• pp.153-165
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• 2009

It is hot issue to get the competitiveness of product through reliability-growth as well as availability and safety in almost high-technology industry including military, chemistry, nuclear, telecommunication, transportation service and so on. In advanced countries, they experienced remarkable growth based on reliability technology in materials&parts industry as well as high-tech industry. It has become a symbol of national competitiveness and created a higher value added. This paper is taking on effectively developing ways to deploy IEC 60300 dependability management system and the base technology that are needed to improve competitiveness of industries in Korea.

• Electronics and Telecommunications Trends
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• v.8 no.3
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• pp.39-52
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• 1993

This study involves a Common Cause Failure (CCF) problem on the ultra-high reliability required system development such as war game operations, nuclear power control, air traffic control, space shuttle missions, and large scale network communication system. The system situation problems are defined according to CCF, reliability and system fault identifications for the development cast verifications in the multi-version redundant software system. Then, CCF analysis of redundant system, system principles and statistical dependence are also described. This validation oh the CCF in the human software interaction system will notify software engineers to conceive what really is CCF contribution factor, not only the internal but the external ones.

• Journal of the Korean Ceramic Society
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• v.41 no.4
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• pp.273-276
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• 2004

Report ferroelectric memories based on 0.35$\mu\textrm{m}$ CMOS technology ensuring ten-year retention and imprint at 175$^{\circ}C$. This excellent reliability resulted from newly developed BT-based ferroelectric films with superior reliability performance at high temperatures, and also resulted from robust integration schemes free from ferroelectric degradation due to process impurities such as moisture and hydrogen. The superior reliabilities at high temperature of ferroelectric memories using BT-based films are due to the random orientation by special bake treatments.

• 한국정보디스플레이학회:학술대회논문집
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• 2005.07b
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• pp.1484-1486
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• 2005

To achieve the high reliability performance in IPS cell, finding a good combination of Liquid Crystal (LC) materials and Polyimide (PI) is very important as they play a key role in IPS cell. Several LC materials and PIs have been introduced for preparation of their different combinations. Electro optical characteristics such as voltage holding ratio, residual DC and AC image sticking have been investigated for the different system of the LC material and PI in the test panels in an attempt to find the effects on the display reliability performance and image sticking.1)3)

• Corrosion Science and Technology
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• v.11 no.5
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• pp.179-183
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• 2012

As one of promising solutions to overcome high oil price and energy crisis, the construction market of high value-added LNG plants is spotlighted world widely. The purpose of this study is to introduce LNG-RBI system to develop risk assessment technology with RAM(Reliability, Availability, Maintainability) modules against overseas monopolization. After analyzing relevant specific features and their technical levels, risk assessment program, non-destructive reliability evaluation strategy and safety criteria unification class are derived as core technologies. These IT-based convergence technologies can be used for enhancement of LNG plant efficiency, in which the modular parts are related to a system with artificial optimized algorithms as well as diverse databases of facility inspection and diagnosis fields.

• Nuclear Engineering and Technology
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• v.47 no.2
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• pp.157-164
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• 2015

Nuclear power plants have logical loop structures in their system configuration. This paper explains the method to solve a loop structure in reliability analysis. As examples of loop structured systems, the reactor core isolation cooling system and high-pressure core injection system of a boiling water reactor are considered and analyzed under a station blackout accident condition. The analysis results show the important role of loop structures under severe accidents. For the evaluation of the safety of nuclear power plants, it is necessary to accurately evaluate a loop structure's reliability.

• Transactions of the Korean Society of Mechanical Engineers A
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• v.30 no.12 s.255
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• pp.1534-1542
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• 2006

In this paper, the concept of accelerated life test, which is a popular research field nowadays, is applied to the shot peened material. To predict the efficient and exact room temperature fatigue characteristics from the high temperature fatigue data, the adequate accelerated model is investigated. Ono type rotary bending fatigue tester and high temperature chamber were used for the experiment. Room temperature fatigue lives were predicted by applying accelerated models and doing reliability evaluation. Room temperature fatigue tests were accomplished to check the effectiveness of predicted data and the adequate accelerated life test models were presented by considering errors. Experimental result using Arrhenius model, fatigue limit obtain almost 5.45% of error, inverse power law has about 1.36% of error, so we found that inverse power law is applied well to temperature-life relative of shot peened material.

• Proceedings of the KIEE Conference
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• 2002.11c
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• pp.472-475
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• 2002

This paper presents a high speed ethernet communication and depulication method of communication to prevent decrease of reliability that was generated by high speed communication. Thus communication reliability was improved and this paper was considered that if any physical breakdown of line of communication occurred, other line of communication could operate collect. This paper used Flash memory for setting storage of backup data at Electric Car that have an humidity and a temperature and an impact. also improved reliability and besides matching data format to windows data format realized to confirm application program at PC or note book computer.