• 전자공학회논문지 IE
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• v.43 no.3
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• pp.6-12
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• 2006

This paper described an 8bit, 100Msample/s CMOS D/A converter using a glitch-time minimization technique for the high-speed sampling rate of 100MHz level. The proposed DAC was implemented in $0.35{\mu}m$ Hynix CMOS technology and adopts a current mode architecture to optimize sampling rate, resolution, chip area. The DAC linear characteristics was similar to the proposed specification and the prototype error between DNL and INL is less than $\pm$0.09LSB respectively. Also, the manufactured DAC chip was analyzed the cause of error operation and proposed the field considerations for chip test.