• Nuclear Engineering and Technology
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• v.32 no.5
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• pp.457-464
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• 2000

In this paper, we describe the results of various calculations performed for a design of the thickness gauges that use the gamma-ray backscattering method. The radiation source is assumed to be the $_{24}$1Am(60keV gamma-ray) and the detector is a single crystal scintillator in a cylindrical form. The source is located at the center of the detector with the collimator of a cylindrical shape. First, when gamma-rays are incident on a material with a constant angle, we compute the variations of the spectrum for the photons scattered into different angular intervals. Next, we compute for an optimal size for the collimator cylinder for a fixed detector size and an optimal distance from the detector to the material. Finally, we compute the number of observed photons for different thickness of two different materials, a plastic film and an Al foil.

• Journal of the Korean Institute of Telematics and Electronics D
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• v.34D no.4
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• pp.47-53
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• 1997

We fabricated gamma radiation detector using high resistive p-Cd$_{80}$Zn$_{20}$Te grown by high pressure bridgman method and forming au thin film electrode by chemically electroless deposition method. The device of Au/Cd$_{80}$Zn$_{20}$Te/Au is a typical MIM structure. The characteristic of current-voltage showed good linearity to 3kV/cm but it depend on the square of electric field over 3kV/cm. As the results of rutherford backscattering spectroscope(RBS) and auger spectroscope on the Au/Cd$_{80}$Zn$_{20}$Te, Au penetrated to the surface of Cd$_{80}$Zn$_{20}$Te detector absorbed slightly high energy radiation like a few hundred keV and showed good performance to detect low energy gamma ray.mma ray.

• Nuclear Engineering and Technology
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• v.43 no.1
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• pp.13-18
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• 2011

In this study, simulations were done of a 661.6 keV line from a point source of $^{137}Cs$ housed in a lead shield. When increasing the scattering angle from 60 to 120 degrees with a 6061 aluminum alloy target placed at angles of 30 and 45 degrees to the incident beam, the spectra showed that the single scattering component increases and that the multiple scattering component decreases. The investigation of the single and multiple scattering components was carried out using a MCNP5 simulation code. The component of the single Compton scattering photons is proportional to the target electron density at the point where the scattering occurs. The single scattering peak increases according to the thickness of the target and saturates at a certain thickness. The signal-to-noise ratio was found to decrease according to the target thickness. The simulation was experimentally validated by measurements. These results will be used to determine the best conditions under which this method can be applied to testing electron densities or to assess the thickness of samples to locate defects in them.

• Nuclear Engineering and Technology
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• v.49 no.7
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• pp.1571-1574
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• 2017

In the present work, the gamma ray backscattering technique was used to determine the effective atomic numbers for certain binary alloys. With the help of a muffle furnace, the binary alloys were synthesized using the melt quenching technique with different compositions of $_{82}Pb$, $_{50}Sn$, and $_{30}Zn$. The intensity distribution of backscattered photons from radioactive isotope $^{22}Na$ (511 keV) was recorded with the help of GAMMARAD5 [$76mm{\times}76mm$ NaI(Tl) scintillator detector] and analyzed as a function of both atomic number and thickness of the target material. The effective atomic numbers for the same binary alloys were also computed theoretically using the atomic to electronic cross-section method with the help of the mass attenuation coefficient database of WinXCom (2001). Good agreement was observed between theoretical and experimental results for the effective atomic numbers of all the selected alloys.

• Journal of the Korean Institute of Telematics and Electronics
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• v.3 no.1
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• pp.18-23
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• 1966

An experimental study of a steel plate thickness gauge by means of the measurements of backscatered gamma-rays has been carried out. The difference between this and other methods is that this method does not include any shilding matterials in the detecting probe, because the primary radiations and the backscattered radiations are detected simultaneously by an NaI (TI) scintillating crystal, and the activity of the Co-60 source used is low enough. In this thickness gauge, the thickness of the steel plates can be read directly on the counting ratemeter scale. The optimum conditions in the source-to-detector distance, window width of the analyzer, energy and strength of the gamma-ray source were found experimentally. The results have shown that the accuracy of the gauge was about $\pm$3% in the range of 3 to 8mm thickness. This gauge can be used to detect the pits or corrosions on the inner walls of the steel pipes.

• Radiation Oncology Journal
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• v.1 no.1
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• pp.21-24
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• 1983

The thickness of the part being irradiated is finite. Percent depth dose tables being used routinely are generally obtained from dosimetry in a phantom much thickner than usual patient. At or close to exit surface, the dose should be less than that obtained from the percent depth dose tables, because of insufficient volume for backscattering. To know the difference between the true absorbed dose and the dose obtained from percent depth dose table, the doses at or close to the exit surface were measured with plate type ionization chamber with volume of 0.5ml. The results are as follows; 1. In the case of $^{60}Co$, percent depth dose at a given depth increases with underlying phantom thickness up to the 5cm. 2. In the case of $^{60}Co$, the dose correction factor at exit surface which is less than 1, increases with part thickness and decreases with field size. 3. Exposure time may not be corrected when the part above 10cm in thickness is treated by $^{60}Co$. 4. In the case of 10MV x-ray, the dose correction factor is nearly 1 and constant for the underlying phantom thickness and field size, so the correction of monitor unit is not necessary for part thickness.