• 한국자기학회:학술대회 개요집
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• 한국자기학회 2007년도 The 1st International Symposium on Advanced Magnetic Materials
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• pp.261.1-261.1
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• 2007

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2003년도 하계학술대회 논문집 Vol.4 No.1
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• pp.3-4
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• 2003

• 한국자기학회:학술대회 개요집
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• 한국자기학회 1993년도 춘계연구발표회 논문개요집
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• pp.84-85
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• 1993

• 한국자기학회:학술대회 개요집
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• 한국자기학회 1999년도 추계연구발표회 논문개요집
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• pp.134-135
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• 1999

• Applied Microscopy
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• 제38권3호
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• pp.185-193
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• 2008

전자 빔 조사 민감 물질인 gibbsite(${\gamma}-Al(OH)_3$)의 전자 빔 조사 상전이 연구에서 전자회절 자료의 기록에 대한 imaging plate와 필름의 기록 특성을 실험적으로 비교하였다. Imaging plate는 극단적으로 낮은 전자 강도와 높은 전자 강도를 동시 기록하기에 충분한 선형 dynamic range를 갖기 때문에, 매우 낮은 전자 조사 조건(${\leq}0.1\;e^-/{\mu}m^2$)에서 전자 회절 자료를 기록할 때 필름에 비해 회절 자료의 spatial frequency 범위가 두 배 이상 확장되었다. 심지어 이미 기록 포화된 투과 빔 주위의 신호 정보 레벨을 세분화하는 데에도 훨씬 우수한 분해 성능을 나타내었다. 따라서 본 연구 결과는 imaging plate가 극단적으로 낮은 전자 강도 기록이 필요한 전자 빔 조사 민감 물질이나 cryo-biological 시편들의 구조 연구 관점에서 가장 적절한 기록 매체임을 나타낸다.

• 한국전기전자재료학회논문지
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• 제11권4호
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• pp.314-320
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• 1998

In this study, we have investigated crystallization properties of $Te_x(Sb_{85}Ge_{15})_{100-x}$ (x=0.3, 0.5, 1.0) thin films prepared by thermal evaporation. The change of reflectance according to phase change from amorphous to crystalline phases with annealing and exposure of diode laser is measured b the n&k analyzer and the surface morphology between amorphous and crystalline phase is analyzed by SEM and AFM. The difference in reflectance($\DeltaR$) between amorphous and crystalline phase appears approximately 20% at the diode laser wavelength, 780nm in all prepared films. Especially, the reflectance difference,$\DeltaR$ comes up to about 30% in $Te_{0.5}(Sb_{85}Ge_{15})_{99.5}$ thin film. Also, amorphous-to-crystalline phase change is observed in all prepared films. As a result of the measurement of the reflectance using diode laser, the reflectance is increased in proportion to the laser power and exposure time in all films. As a result of observing each film with the SEM and AFM, the surface morphology of the annealed and the exposed films are evidently increased than those of as-deposited films. The fast crystallization is occurred by increasing in Te content. Therefore, we conclude that the $Te_{0.5}(Sb_{85}Ge_{15})_{99.5}$ and $Te_1(Sb_{85}Ge_{15})_{99}$ thin films can be evaluated as an attractive optical recording medium with high contast ratio and fast erasing time due to crystallization.

• 한국분말야금학회:학술대회논문집
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• 한국분말야금학회 1998년도 춘계학술대회 및 발표대회 강연 및 발표논문 초록집
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• pp.6-6
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• 1998

In 1957, the first magnetic disk drive compatible with a movable head was introduced as an external file memory device for computer system. Since then, magnetic disks have been improved by increasing the recording density, which has brought about the development of a high performance thin film magnetic head. The thin film magnetic head has a magnetic circuit on a ceramic substrate using IC technology. The physical property of the substrate material is very important because it influences the tribology of head/disk interface and also manufacturing process of the head. $Al_{2}O_{3}$-TiC ceramics, so called ALTIC, is known to be one of the best substrate materials which satisfies this property requirement. Even though the head is not in direct contact with the disk, frequent instantaneous contacts are unavoidable due to its high rotating speed and the close gap between them. This may cause damage in the magnetic recording media and, thus, it is very important that the magnetic head has a good wear resistance. $Al_{2}O_{3}$-TiC ceramics has an excellent tribological property in head/disk interface. Manufacturing process of thin film head is similar to that of IC, which requires extremely smooth and flat surface of the substrate. The substrate must be readily sliced into the heads without chipping. $Al_{2}O_{3}$-TiC ceramics has excellent machineability and mechanical properties. $Al_{2}O_{3}$-TiC ceramics was first developed at Nippon Tungsten Co. as cutting tool materials in 1968, which was further developed to be used as the substrate materials for thin film head in collaboration with Sumitomo Special Metals Co., Ltd. in 1981. Today, we supply more than 60% of the substrates for thin film head market in the world. In this paper, we would like to present the sintering process of $Al_{2}O_{3}$-TiC ceramics and its property in detail.

• ETRI Journal
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• 제25권4호
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• pp.253-257
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• 2003

This study investigated the photochromic properties and characterization of acetyl-substituted diarylethene (DAMBTF6)-doped fluoroacrylates media for holographic storage. For the rewritable holographic recording media, we prepared photochromic polymer films using an acrylate matrix by simple photocuring methods. Switching light sources from a visible (532 nm) to an ultraviolet (365 nm) produced transparent films that changed from pale yellow to red. Holographic recording was performed on the photochromic films by two interfering collimated plane wave beams. Excitation with a visible or ultraviolet light completely erased the records, and the film was rewritable either by 532 nm laser or by 325 nm laser within 2 seconds. Images were recorded onto a pixelated spatial light modulator with rectangular pixel apertures and reconstructed on the photochromic films to show recovery of the original images with high resolution.

• Bulletin of the Korean Chemical Society
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• 제23권4호
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• pp.571-574
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• 2002

The photorefractive polymeric composite with good performance was prepared. The carbazole-substituted polysiloxane sensitized by 2,4,7-trinitro-9-fluorenone was used as a photoconducting medium and 1-[4-(2-nitrovinyl)phenyl]piperidine was added as an optically nonlinear chromophore. The photorefractive property of polymer was determined by diffraction efficiency using a 100 ㎛-thick film. The maximum diffraction efficiency ( ηmax) of 71% was obtained at the electric field of 70 V/ ㎛. The potential of the current polymer material as a holographic recording medium was evaluated by the demonstration of holographic recording and subsequent reading of optical image.

• 정보저장시스템학회:학술대회논문집
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• 정보저장시스템학회 2005년도 추계학술대회 논문집
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• pp.185-189
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• 2005

We reported here nano-scale electrical phase-change recording in amorphous $Ge_2Sb_2Te_5$ media using an atomic force microscope (AFM) having conducting probes. In recording process, a pulse voltage is applied to the conductive probe that touches the media surface to change locally the electrical resistivity of a film. However, in contact operation, tip/media wear and contamination could major obstacles, which degraded SNR, reproducibility, and lifetime. In order to overcome tip/media wear and contamination in contact mode operation, we adopted the W incorporated diamond-like carbon (W-DLC) films as a protective layer. Optimized mutilayer media were prepared by a hybrid deposition system of PECVD and RF magnetron sputtering. When suitable electrical pulses were applied to media through the conducting probe, it was observed that data bits as small as 25 nm in diameter have been written and read with good reproducibility, which corresponds to a data density of $1 Tbit/inch^2$. We concluded that stable electrical phase-change recording was possible mainly due to W-DLC layer, which played a role not only capping layer but also resistive layer.