• Title/Summary/Keyword: film property

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3-Dimensional Thermoforming Computer Simulation Considering Orthotropic Property of Film

  • Son, Hyun-Myung;Yoon, Seok-Ho;Lee, Ki-Ho;Lyu, Min-Young
    • Elastomers and Composites
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    • v.57 no.3
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    • pp.114-120
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    • 2022
  • The tensile properties of the extruded PC film were measured in the extrusion direction and perpendicular to the extrusion direction. The measured properties were the elastic modulus and Poisson's ratio at the glass transition temperature of PC. The measured orthotropic properties of the film were used for the computer simulation of vacuum forming. In this simulation, three mold shapes were tested: dome, trapezoid, and cubic, and the vacuum was applied between the mold surface and the heated film. The stress, strain, thickness, and stretch ratio distributions of the film in different mold shapes were observed and compared. The thermoforming simulation method used in this study and the obtained results, considering the determined orthotropic properties, can be applied to the thermoforming of various three-dimensional shapes.

Electrocaloric Effect in Pb0.865La0.09(Zr0.65Ti0.35)O3 Thin Film

  • Roh, Im-Jun;Kwon, Beomjin;Moon, Hi Gyu;Kim, Jin-Sang;Kang, Chong-Yun
    • Journal of Sensor Science and Technology
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    • v.23 no.4
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    • pp.224-228
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    • 2014
  • The electrocaloric effect of 9/65/35 PLZT thin film fabricated by the sol-gel method, which has not been studied yet, was investigated for its structural, electrical properties as well as temperature change property. The relaxor ferroelectric property of 9/65/35 PLZT thin film was confirmed by examining its dielectric and electrical properties. The relaxor property can cause a more pronounced electrocaloric effect (ECE) in a wider temperature range than normal ferroelectric film. To avoid errors caused by using an indirect measurement method, the leakage current generated by increasing temperatures was minimized by using the optimal maximum electric field ($350kVcm^{-1}$) in the thin film. The largest temperature change ${\delta}T$ (0.23 K) and the electrocaloric strength ${\xi}$ (0.68 mkcm/kV), calculated by equations were obtained. The maximum field change ${\delta}E$ ($191kVcm^{-1}$) was in the vicinity of the curie temperature ($200^{\circ}C$).

SINTERED $Al_{2}O_{3}$-TiC SUBSTRATE FOR THIN FILM MAGNETIC HEAD

  • Nakano, Osamu;Hirayama, Takasi
    • Proceedings of the Korean Powder Metallurgy Institute Conference
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    • 1998.04b
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    • pp.6-6
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    • 1998
  • In 1957, the first magnetic disk drive compatible with a movable head was introduced as an external file memory device for computer system. Since then, magnetic disks have been improved by increasing the recording density, which has brought about the development of a high performance thin film magnetic head. The thin film magnetic head has a magnetic circuit on a ceramic substrate using IC technology. The physical property of the substrate material is very important because it influences the tribology of head/disk interface and also manufacturing process of the head. $Al_{2}O_{3}$-TiC ceramics, so called ALTIC, is known to be one of the best substrate materials which satisfies this property requirement. Even though the head is not in direct contact with the disk, frequent instantaneous contacts are unavoidable due to its high rotating speed and the close gap between them. This may cause damage in the magnetic recording media and, thus, it is very important that the magnetic head has a good wear resistance. $Al_{2}O_{3}$-TiC ceramics has an excellent tribological property in head/disk interface. Manufacturing process of thin film head is similar to that of IC, which requires extremely smooth and flat surface of the substrate. The substrate must be readily sliced into the heads without chipping. $Al_{2}O_{3}$-TiC ceramics has excellent machineability and mechanical properties. $Al_{2}O_{3}$-TiC ceramics was first developed at Nippon Tungsten Co. as cutting tool materials in 1968, which was further developed to be used as the substrate materials for thin film head in collaboration with Sumitomo Special Metals Co., Ltd. in 1981. Today, we supply more than 60% of the substrates for thin film head market in the world. In this paper, we would like to present the sintering process of $Al_{2}O_{3}$-TiC ceramics and its property in detail.

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Reliability analysis test of high brightness micro optical component and module (고휘도 마이크로 광부품 / 모듈의 신뢰성 분석 시험)

  • Lee N.K.;Lee H.J.;Choi S.;Choi D.S.
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2006.05a
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    • pp.535-536
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    • 2006
  • Researches about micro technology travel lively in these days. Such many researches are concentrated in the field of materials and a process field. But properties of micro materials should be known to give results of research developed into still more. In these various material properties, reliability data such as mechanical, optical, thermal property, etc is the basic property. In this paper, it is measured that is material properties of main BLU(Back Light Unit) components in LCD(Liquid Crystal Display). The pattern shape of prism sheet, diffuser film and reflective plate are measured by variable 3D scanning equipments. It is researched which is the method to measure an optimal 3D pattern shape in each components.

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Effect of Plasma Surface Treatment on Electrical and Mechanical Properties of Poly(ethylene terephthalate ) Film (플라즈마 표면처리가 Poly(ethylene terephthalate) 필름의 전기적 및 기계적 성질에 미치는 영향)

  • 임경범;이덕출
    • Journal of the Korean Society of Safety
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    • v.16 no.3
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    • pp.61-67
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    • 2001
  • In this study the electrical and mechanical characteristics of PET films ore analyzed after plasma surface treatment. After plasma treatment, the surface potential decay, surface potential and dielectric property were evaluated to analyze the electrical insulating property, and the tensile strength was measured as the mechanical characteristic. When plasma treatment was conducted for less than 10 minutes, it was found that the electrical insulating property was improved through evaporation of low molecular weight materials md cleaning of surface. However, for more than 10 minutes, the insulating property of plasma treated PET films was decreased due to excessive discharge energy. The tensile strength was hardly changed by Plasma treatment.

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Performance of Squeeze Film Damper Using Magneto-Rheological Fluid (MR유체를 이용한 스퀴즈필름 댐퍼의 응답특성)

  • 안영공;양보석;신동춘;김동조
    • Proceedings of the Korean Society for Noise and Vibration Engineering Conference
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    • 2002.05a
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    • pp.67-70
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    • 2002
  • This paper presents the property of the Squeeze Film Damper (SFD) using Magneto-Rheological fluid (MR fluid). The damping property of a SFD for a flexible rotor system varied according to vibration mode. MR fluid is known as a functional fluid with controllable apparent viscosity of the fluid by applied magnetic field strength. When the MR fluid is applied in the SFD, the SFD using MR fluid can effectively reduce vibrations of the flexible rotor in a wide range of rotating speed by control of the applied magnetic field strength. To investigate in detail the SFD using MR fluid, the SFD to support one mass was constructed and its performance was experimentally investigated in the present study. The damping property of the SFD using MR fluid has viscous damping by Newtonian fluid, but not Coulomb friction by Bingham fluid. Therefore, The system damped by the SFD can be considered as a linear system.

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Cryogenic Behavior of Perovskite Materials

  • Paik, D.S.;Shin, H.Y.;Yoon, S.J.;Kim, H.J.;Park, C.Y.
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1999.05a
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    • pp.126-129
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    • 1999
  • Dielectric and piezoelectric properties of perovskite materials such as La modified $Pb(Zr,Ti)O_3$ ceramics and $Pb(Zn_{1/3}Nb_{2/3})O_3-PbTiO_3$ single crystals were investigated for cryogenic capacitor and actuator applications. Enhanced extrinsic contributions resulted in piezoelectric coefficient (d33) as high as 250 pC/N at 30 K, superior to that of PZT ($d_{33}$ ~ 100 pC/N). This cryogenic property enhancement was associated with retuning the MPB (or cryogenic temperatures. PZN-PT single crystals exhibited dramatic property improvements such as $d_{33}$ > 500 pC/N at 30 K as a result of an engineered domain state.

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Holographic Data Grating Formation of AsGeSeS Single & Ag/AsGeSeS Double Layer Thin Films with the Incident Beam Wavelength (입사빔의 파장에 따른 AsGeSes & Ag/AsGeSes 박막의 홀로그래픽 데이터 소거특성)

  • Koo, Yong-Woon;Chung, Hong-Bay
    • Proceedings of the KIEE Conference
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    • 2006.07c
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    • pp.1428-1429
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    • 2006
  • We investigated the diffraction efficiency, erasing property and rewriting property of diffraction grating with each wavelength of recording beam. A (P:P) polarized light was exposed on AsGeSeS and Ag/AsGeSeS thin film to form a diffraction grating by HeNe(635nm) laser and DPSS(532nm) laser. At the maximum efficiency condition, unpolarized HeNe laser beam was irradiated to erase 1ha generated diffraction grating. The HeNe laser showed more higher diffraction efficiency and the DPSS laser showed more faster diffraction grating time. At erasing and rewriting process, AsGeSeS(61%-85%)thin film showed better property than Ag doped Ag/AsGeSeS(53%-63%) double layer structured thin film.

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The Mechanical Property of Electroplated Cu Film

  • Cho, Chul-Ho;Ha, Seung-Mo;Ahn, Yoo-Min;Kim, Dae-Kun;Lee, Jae-Ho
    • Proceedings of the Korean Society of Tribologists and Lubrication Engineers Conference
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    • 2002.10b
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    • pp.139-140
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    • 2002
  • This paper discusses the effect of plating condition on the mechanical property of electroplated Cu film. Current density, the amount of the organic additives was found to affect the residual stress of electroplated copper film. The result show that, in the case of residual stress, the copper film deposited at higher additive result in lower residual stress and plating current by $15mA/cm^2$ induced a better result than any other ones.

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Field Electron Emission from Amorphous Carbon Thin Film Grown Using Rf Magnetron Sputtering Method (RF 마그네트론 스퍼터링법으로 성장된 Amorphous carbon 각막의 전계전자방출)

  • ;;K. Oura
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
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    • v.14 no.3
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    • pp.234-240
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    • 2001
  • Using RF magnetron sputtering, amorphous carbon(a-C) thin films as electron filed emitter were fabricated. these a-C thin films were deposited on Si(001) substrate at several temperatures. The field electron emission property of these a-C thin films was estimated by a diode technique. As the result, we observed that the field emission properties of the films were changed singnificantly with the substrate temperature and structural features of a-C film. The field emission properties were promoted by higher substrate temperatures. Furthermore N-doped a-C film exhibits more field emission property than that of undoped a-C film. These results are explained as change of surface morphology and structural properties of a-C film.

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