• Title/Summary/Keyword: error correcting code

Search Result 179, Processing Time 0.023 seconds

REPEATED LOW-DENSITY BURST ERROR DETECTING CODES

  • Dass, Bal Kishan;Verma, Rashmi
    • Journal of the Korean Mathematical Society
    • /
    • v.48 no.3
    • /
    • pp.475-486
    • /
    • 2011
  • The paper deals with repeated low-density burst error detecting codes with a specied weight or less. Linear codes capable of detecting such errors have been studied. Further codes capable of correcting and simultaneously detecting such errors have also been dealt with. The paper obtains lower and upper bounds on the number of parity-check digits required for such codes. An example of such a code has also been provided.

Design of an Encoding-Decoding System using Majority-Logic Decodable Circuits of Reed-Muller Code (다수논리 결정자를 이용한 리드뮬러코드의 시스템 설계)

  • 김영곤;강창언
    • The Journal of Korean Institute of Communications and Information Sciences
    • /
    • v.10 no.5
    • /
    • pp.209-217
    • /
    • 1985
  • Using the Reed-Muller Codes, the encoder and decoder system has been designed and tested in this paper. The error correcting capability of this code is [J/2} or less and the error correcting procedure can be implemented easily by using simple logic circuitry. The encoding and decoding circuits are obtained by the cyclic property and for the O15, 11) Reed-Muller code majority-logic decoding is taken. The performance is measured in error probability and weight destribution. The encoder and decoder system has been designed, implemented and interfaced with the microcomputer by using the 8255 chip. Experimental results show that the system has single error-correcting capability and total execution time for a data is about 70usec. When the probability of channel error is $10^{-6}$~$10^{-4}$ the system using the (15, 11) Reed-Muller code works very good.

  • PDF

A Design of Viterbi Decoder by State Transition Double Detection Method for Mobile Communication (상태천이 이중검색방식의 이동통신용 Viterbi 디코더 설계)

  • 김용노;이상곤;정은택;류흥균
    • The Journal of Korean Institute of Communications and Information Sciences
    • /
    • v.19 no.4
    • /
    • pp.712-720
    • /
    • 1994
  • In digital mobile communication systems, the convolutional coding is considered as the optimum error correcting scheme. Recently, the Viterbi algorithm is widely used for the decoding of convolutional code. Most Viterbi decoder has been proposed in conde rate R=1/2 or 2/3 with memory components (m) less than 3. which degrades the error correcting capability because of small code constraints (K). We consider the design method for typical code rate R=1/2, K=7(171,133) convolutional code with memory components, m=6. In this paper, a novel construction method is presented which combines maximum likelihood decoding with a state transition double detection and comparison method. And the designed circuit has the error-correcting capability of random 2 bit error. As the results of logic simulation, it is shown that the proposed Viterbi decoder exactly corrects 1 bit and 2 bit error signal.

  • PDF

Concatenated Coding System for an Effective Error Correction (효율적인 에러 정정을 위한 콘케티네이티드 코팅 시스템)

  • Kang, Beob Joo;Kang, Chang Eon
    • Journal of the Korean Institute of Telematics and Electronics
    • /
    • v.23 no.3
    • /
    • pp.309-316
    • /
    • 1986
  • A concatenated coding system using a binary code as the inner code and a nonbinary code as the outer code has been constructed for the purpose of error correction. The complexity of a conventional coding system grows exponentially as the code length of a block code becomes longer. To reduce the complexity for ling code, an effective communication system has been proposed by cascading two codes-binary and norbinary codes. Using a parallel-to-serial circuit and a serial-to-parallel circuit, the concatenated coding system has been designed and constructed by empolying a (7,3) burst error correcting code as the inner code and a (7,3) Reed-Solomon code as the outer code. This system has been simulated and tested using a micro-computer. For the (49,9) concatenated coding system, the error probability of the channel has been evaluated and compared to different coding systems.

  • PDF

On the Design of a DCT Transmission Method using Channel Optimized Quantizer Combined with Error Correcting Codes (오류 정정 부호가 결합된 채널 최적 양자화기를 이용한 DCT 영상 전송 방식의 설계)

  • 김종락;박준성;김태정
    • The Journal of Korean Institute of Communications and Information Sciences
    • /
    • v.18 no.11
    • /
    • pp.1626-1634
    • /
    • 1993
  • In this paper we propose a coding scheme which combines source codes and error correcting codes in order to be robus to channel noise. One of the coding schemes that take into account both the source and the channel is the channel optimized quantizer (COQ) which simultaneously minimizes quantization noise and the noise due to channel errors. This paper deals with the problem of combining channel optimized quantizers with ECC to build an improved system. To be specific, we computed the performance of an n bit COQ and that of an n-1 bit COQ followed by an (n-1)/n punctured convolutional code. From this result whether or not the ECC are selected is determined by the number of allocated bits and the channel bit error rate. These results are applied to the image trans-mission method using DCT, and the system performances are evaluated.

  • PDF

ADAPTIVE CHANGE OF CODE RATE IN DS-SSMA COMMUNICATION SYSTEMS

  • Youngkwon-Ryu;Jinsoo-Bae;Iickho-Song
    • Proceedings of the Korean Society of Broadcast Engineers Conference
    • /
    • 1995.06a
    • /
    • pp.59-61
    • /
    • 1995
  • An adaptive code rate change scheme in DS-SSMA systems is proposed. In the proposed scheme, the error correcting code rate is changed according to the channel state, the effective number of users. The channel state is estimated based on retransmission requests. The criterion for the change of the code rate is to maximize the throughput under given error bound.

A Study on Decoding Method of the R-S Code for Double-Encoding System in the Frequency Domain (주파수 영역에서 2중부호화 R-S부호의 부호방식에 관한 연구)

  • 전경일;김남욱;김용득
    • The Journal of Korean Institute of Communications and Information Sciences
    • /
    • v.14 no.3
    • /
    • pp.216-226
    • /
    • 1989
  • In this paper, we explain about an outline of the decoding method for double encoding system using the error correcting capacitance and a simple decoding method. We have been taken formation two-dimension code word of doubly-encoded code using $C_1$(32, 28, 5) and $C_2$(32, 26, 7) Reed-Solomon codes, and had computer simulation of the erroe correcting processes in frequency domain. On these processes, the newly developed digital signal processing technology such as error correction using Berlekamp-Massey algorithm in frequency domain have been proven.

  • PDF

An Improved Decoding Scheme of Hamming Codes using Soft Values (소프트 값을 이용한 해밍 부호의 개선된 복호 방식)

  • Cheong, Ho-Young
    • The Journal of Korea Institute of Information, Electronics, and Communication Technology
    • /
    • v.12 no.1
    • /
    • pp.37-42
    • /
    • 2019
  • In this paper, we propose a syndrome decoding scheme that can correct two errors for single error correcting Hamming codes within a code length. The decoding scheme proposed in this paper has the advantage of significantly improving the error rate performance compared to the decoder complexity by correcting multiple errors without substantially increasing the decoding complexity. It is suitable for applications in which the energy use of encoder/decoder is extremely limited and the low error rate performance is required, such as IoT communications and molecular communications. In order to verify the improvement of the error rate performance of the Hamming code with the proposed decoding scheme, we performed simulation on Hamming codes with short code length in the AWGN and BPSK modulation environments. As a result, compared with the conventional decoding method, the proposed decoding scheme showed performance improvement of about 1.1 ~ 1.2[dB] regardless of the code length of the Hamming code.

Deep Learning Based Error Control in Electric Vehicle Charging Systems Using Power Line Communication (전력선 통신을 이용한 전기자동차 충전 시스템에서 딥 러닝 기반 오류제어)

  • Sun, Young Ghyu;Hwang, Yu Min;Sim, Issac;Kim, Jin Young
    • The Journal of The Korea Institute of Intelligent Transport Systems
    • /
    • v.17 no.4
    • /
    • pp.150-158
    • /
    • 2018
  • In this paper, we introduce an electric vehicle charging system using power line communication and propose a method to correct the error by applying a deep learning algorithm when an error occurs in the control signal of an electric vehicle charging system using power line communication. The error detection and correction of the control signal can be solved through the conventional error correcting code schemes, but the error is detected and corrected more efficiently by using the deep learning based error correcting code scheme. Therefore, we introduce deep learning based error correction code scheme and apply this scheme to electric vehicle charging system using power line communication. we proceed simulation and confirm performance with bit error rate. we judge whether the deep learning based error correction code scheme is more effective than the conventional schemes.

MTA(Memory TestAble) Code for Testing in Semiconductor Memories (반도체 메모리의 테스트를 위한 MTA(Memory TestAble code)코드)

  • 이중호;조상복
    • Journal of the Korean Institute of Telematics and Electronics A
    • /
    • v.31A no.8
    • /
    • pp.111-121
    • /
    • 1994
  • This paper proposes a memory testable code called MTA(Memory TestAble) code which is based on error correcting code technique for testing functional faults in semiconductor memories. The characteristics of this code are analyzed and compared with those of conventional codes. The developed decoding technique for this code can reduce the decoder circuits up to 70% and obtain two-times faster decoding speed than other codes such as hamming code or Hsiao code. The MTA code is eccectively applicable to parallel testing of semiconductor memories because it has the same information length and parity length. It can detect from single error functional faults to triple error in semiconductor memories.

  • PDF