MTA(Memory TestAble) Code for Testing in Semiconductor Memories

반도체 메모리의 테스트를 위한 MTA(Memory TestAble code)코드

This paper proposes a memory testable code called MTA(Memory TestAble) code which is based on error correcting code technique for testing functional faults in semiconductor memories. The characteristics of this code are analyzed and compared with those of conventional codes. The developed decoding technique for this code can reduce the decoder circuits up to 70% and obtain two-times faster decoding speed than other codes such as hamming code or Hsiao code. The MTA code is eccectively applicable to parallel testing of semiconductor memories because it has the same information length and parity length. It can detect from single error functional faults to triple error in semiconductor memories.