• Title/Summary/Keyword: electrostatic discharge tester

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Human body model electrostatic discharge tester using metal oxide semiconductor-controlled thyristors

  • Dong Yun Jung;Kun Sik Park;Sang In Kim;Sungkyu Kwon;Doo Hyung Cho;Hyun Gyu Jang;Jongil Won;Jong-Won Lim
    • ETRI Journal
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    • v.45 no.3
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    • pp.543-550
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    • 2023
  • Electrostatic discharge (ESD) testing for human body model tests is an essential part of the reliability evaluation of electronic/electrical devices and components. However, global environmental concerns have called for the need to replace the mercury-wetted relay switches, which have been used in ESD testers. Therefore, herein, we propose an ESD tester using metal oxide semiconductor-controlled thyristor (MCT) devices with a significantly higher rising rate of anode current (di/dt) characteristics. These MCTs, which have a breakdown voltage beyond 3000 V, were developed through an in-house foundry. As a replacement for the existing mercury relays, the proposed ESD tester with the developed MCT satisfies all the requirements stipulated in the JS-001 standard for conditions at or below 2000 V. Moreover, unlike traditional relays, the proposed ESD tester does not generate resonance; therefore, no additional circuitry is required for resonant removal. To the best of our knowledge, the proposed ESD tester is the first study to meet the JS-001 specification by applying a new switch instead of an existing mercury-wetted relay.

HBM ESD Tester for On-wafer Test using Flyback Method (Flyback 방식을 이용한 on-wafer용 HBM ESD 테스터 구현)

  • 박창근;염기수
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.6 no.7
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    • pp.1079-1083
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    • 2002
  • We made ESD tester to measure ESD threshold voltage of semiconductor devices. The HBM ESD test is the most popular method to measure the ESD threshold voltage of MMSIC. We use flyback method which is one of the DC-DC converter to get high ESD voltage. With flvback method, we can isolate the 1ow voltage part from the high voltage part of HBM ESD tester. We use an air gap of the relay which is used for switch to satisfy the rise time of ESD standard(MIL-STD). As a result, with the flyback method and the air gap of relay, we can make ESD tester whose parasitic components are minimized.

HBM ESD Tester for On-wafer Test using Flyback Method (Flyback방식을 이용한 on-wafer용 HBM ESD 테스터 구현)

  • 박창근;염기수
    • Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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    • 2002.11a
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    • pp.469-472
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    • 2002
  • We made ESD tester to measure ESD threshold voltage of semiconductor devices. The HBM ESD test is the most popular method to measure the ESD threshold voltage of MMIC. We use flyback method which is one of the DC-DC converter to get high ESD voltage. With flyback method, we can isolate the low voltage part from the high voltage part of HBM ESD tester. We use an air gap of the relay which is used for switch to satisfy the rise time of ESD standard(MIL-STll-883D). As a result, with the flyback method and the air gap of relay, we can make ESD tester whose parasitic components are minimized.

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