• Title/Summary/Keyword: electron microscopy

Search Result 7,811, Processing Time 0.033 seconds

Three-dimensional Structure of Protein Using Electron Microscopy (전자현미경을 이용한 단백질 3차원 구조)

  • Cheong, Gang-Won
    • Applied Microscopy
    • /
    • v.30 no.3
    • /
    • pp.241-248
    • /
    • 2000
  • Electron microscopy has used for analysing the structure of protein over 30 years. Bacteriohodopsin and porins are used as examples to illustrate the progress that has recently been made in attaining resolutions which hitherto were regarded as exclusive to the realm of x-ray crystallography. To determine a protein structure used by electron microscopy, one must pass through a number of basic steps including preparation of specimen , data acquisition and data processing.

  • PDF

Current Status of Automatic Serial Sections for 3D Electron Microscopy

  • Choi, Hyosun;Jung, Min Kyo;Mun, Ji Young
    • Applied Microscopy
    • /
    • v.47 no.1
    • /
    • pp.3-7
    • /
    • 2017
  • The automatic equipment for three-dimensional electron microscopy (3DEM) can acquire serial sections of a large sample in a relatively short time, and is especially suitable for the connectomics, which is a field related to understanding the brain structure as a whole. As many results obtained through 3DEM using automatic serial sections have been published in the field of brain research, many researchers continue to apply this technique to various samples. We reviewed the equipment for automatic serial sectioning, the block preparation method, the limitations of 3DEM, and future directions.

Development of High-Temperature Solders: Contribution of Transmission Electron Microscopy

  • Bae, Jee-Hwan;Shin, Keesam;Lee, Joon-Hwan;Kim, Mi-Yang;Yang, Cheol-Woong
    • Applied Microscopy
    • /
    • v.45 no.2
    • /
    • pp.89-94
    • /
    • 2015
  • This article briefly reviews the results of recently reported research on high-temperature Pb-free solder alloys and the research trend for characterization of the interfacial reaction layer. To improve the product reliability of high-temperature Pb-free solder alloys, thorough research is necessary not only to enhance the alloy properties but also to characterize and understand the interfacial reaction occurring during and after the bonding process. Transmission electron microscopy analysis is expected to play an important role in the development of high-temperature solders by providing accurate and reliable data with a high spatial resolution and facilitating understanding of the interfacial reaction at the solder joint.

Ultrastructural Abnormalities in APP/PSEN1 Transgenic Mouse Brain as the Alzheimer's Disease Model

  • Kim, Mi Jeong;Huh, Yang Hoon;Choi, Ki Ju;Jun, Sangmi;Je, A Reum;Chae, Heesu;Lee, Chulhyun;Kweon, Hee-Seok
    • Applied Microscopy
    • /
    • v.42 no.4
    • /
    • pp.179-185
    • /
    • 2012
  • Alzheimer's disease (AD) is a progressive neurodegenerative disorder. Neuropathological hallmarks of AD are amyloid plaques, dystrophic neurite, and alteration of subcellular organelles. However, the morpho-functional study of this degenerative process and ultimate neuronal death remains poorly elucidated. In this study, immunohistochemical and ultrastructural analyses were performed to clarify the abnormal morphological alterations caused by the progression of AD in APP/PSEN1 transgenic mice, express human amyloid precursor protein, as a model for AD. In transgenic AD mice brain, the accumulation of Amyloid ${\beta}$ plaques and well-developed dystrophic neurites containing anti-LC3 antibody-positive autophagosomes were detected in the hippocampus and cortex regions. We also found severe disruption of mitochondrial cristae using high-voltage electron microscopy and three-dimensional electron tomography (3D tomography). These results provide morpho-functional evidence on the alteration of subcellular organelles in AD and may help in the investigation of the pathogenesis of AD.

Characteristics of Auditory Stereocilia in the Apical Turn of the Echolocating Bats by Scanning Electron Microscopy

  • Kim, Jinyong;Jung, Yongwook
    • Applied Microscopy
    • /
    • v.44 no.1
    • /
    • pp.8-14
    • /
    • 2014
  • The auditory system of the Korean greater horseshoe bat (Rhinolophus ferrumequinum korai, RFK) is adapted to its own echolocation signal, which consist of constant frequency (CF) element and frequency modulated (FM) element. In contrast, the Japanese long-fingered bat (Miniopterus schreibersii fuliginosus, MSF) emits FM signals. In the present study, the characteristics of stereocilia in RFK (a CF/FM bat) and MSF (a FM bat) were studied in the apical turn of the cochlea where the lower frequencies are transduced. Stereocilia lengths and numbers were quantitatively measured in RFK by scanning electron microscopy and compared with those of MSF. Each inner hair cells (IHCs) of RFK possessed three rows of stereocilia, whereas MSF possessed five rows of stereocilia. Gradients in stereocilia lengths and numbers of stereocilia of the IHCs of RFK were found to be less pronounced and fewer, respectively, than those of MSF. Each outer hair cells (OHCs) possessed three rows of stereocilia in both species. OHCs stereocilia in RFK that distinguished it from MSF were a shorter length and a greater number of stereocilia. These features suggest that the apical cochleas of RFK are adapted for the processing of higher frequency echolocation calls rather than that of MSF.

Realization for Each Element for capturing image in Scanning Electron Microscopy (주사 전자 현미경에서 영상 획득에 필요한 구성 요소 구현)

  • Lim, Sun-Jong;Lee, Chan-Hong
    • Laser Solutions
    • /
    • v.12 no.2
    • /
    • pp.26-30
    • /
    • 2009
  • Scanning Electron Microscopy (SEM) includes high voltage generator, electron gun, column, secondary electron detector, scan coil system and image grabber. Column includes electron lenses (condenser lens and objective lens). Condenser lens generates fringe field, makes focal length and control spot size. Focal length represents property of lens. Objective lens control focus. Most of the electrons emitted from the filament, are captured by the anode. The portion of the electron current that leaves the gun through the hole in the anode is called the beam current. Electron beam probe is called the focused beam on the specimen. Because of the lens and aperture, the probe current becomes smaller than the beam current. It generate various signals(backscattered electron, secondary electron) in an interaction with the specimen atoms. In this paper, we describe the result of research to develop the core elements for low-resolution SEM.

  • PDF

Artifacts Frequently Encountered in Electron Micrographs (생물시료의 전자현미경 시료 제작 및 관찰 과정에서 발생되는 인공물)

  • Park, Chang-Hyun;Cho, Kang-Yong;Uhm, Chang-Sub
    • Applied Microscopy
    • /
    • v.35 no.1
    • /
    • pp.1-13
    • /
    • 2005
  • Fine photographs are essential in the electron microscopy. Artifacts can be introduced during all steps of electron microscopy; specimen processing, observation and printing. Every caution is necessary to avoid the artifact formation. In this review, the authors discussed the causes of various artifacts and suggested the solution to help the correct tissue handling and electron microscopic observations.

Light and Scanning Electron Microscope Observatt-ons on Sexual Dimorphism in Pupa of Mullberry silkworm, bombyx Mori Linn (Lopidoptera : Bombycidae)

  • Kumar, Vineet;Tewari, S.K.;Awasthi, A.K.;Datta, R.K.
    • Journal of Sericultural and Entomological Science
    • /
    • v.41 no.2
    • /
    • pp.87-93
    • /
    • 1999
  • Under Light and Scanning electron microscope, the pupal morphology of mulberry silkworm Bombyx mori Linn. revealed the prothorax and metathorax, well developed mesothorax, less defined last pair of sporacle, well exposed prothoracic femora and wing pads approaching the anterior margin of Ab III. The important sex separating characters viz, wegiht, antennal elevations, intersegmental lines and genings have discussed. Further, two separate openings bursa copulatrix and ovipositional opening were observed, performing different functions in abult moth.

  • PDF

The development of scanning electron microscopy (전자현미경 개발)

  • Oh H. J.;Chang D. Y.;Yang H. N.;Kim D. H.;Park M, J.;Shim C. H.;Kim C. S.
    • Proceedings of the Korean Society of Machine Tool Engineers Conference
    • /
    • 2005.05a
    • /
    • pp.15-18
    • /
    • 2005
  • We have designed and fabricated a thermal scanning electron microscopy. It includes an electron source, two condenser lenses, one objective lens, a scanning coil and a stigmator coil for focusing in column and also have a secondary electron detector for constructing the image in chamber with a high vacuum condition and control part for operating the SEM. Especially, in order for us to find out the optical characteristics, our attention and studies have been concentrated on the effects of two condenser lenses and one objective lens for high resolution with SEM. Finally, we developed a high resolution thermal scanning electron microscopy.

  • PDF

Dynamical Instability of Interfaces

  • Saka, H.;Tsukimoto, S.;Sasaki, K.
    • Applied Microscopy
    • /
    • v.36 no.spc1
    • /
    • pp.9-17
    • /
    • 2006
  • An interface and a grain boundary in the solid state can be quite unstable and vibrate violently under special circumstances. Two examples of such a vibration, as observed by in-situ transmission electron microscopy, were presented.