• Title/Summary/Keyword: electrical resistance

Search Result 4,945, Processing Time 0.036 seconds

Series Resistance Change by Partial Shading in a-Si Thin Film Photovoltaic(PV) Module (부분 음영에 따른 a-Si Thin Film Photovoltaic(PV) Module의 직렬저항변화)

  • Shin, Jun-Oh;Jung, Tae-Hee;Kim, Tae-Bum;Woo, Sung-Chul;Yun, Na-Ri;Kang, Ki-Hwan;Han, Deuk-Young;Ahn, Hyung-Keun
    • Journal of the Korean Institute of Electrical and Electronic Material Engineers
    • /
    • v.23 no.11
    • /
    • pp.901-905
    • /
    • 2010
  • PV module has many power loss factors, and series resistance is the most important elements of them. It is therefore easy to expect the partial shading decrease the lifetime of the semiconductor depletion layer in thin film PV module. Different shading losses could be related with the hot spot which is critical in expecting the reliability issue. In this paper we have modelled the series resistance of the PV module with both different direction of the cell line and shading area of the panel. From the results, thin film a-Si PV module has shown different properties by shading direction.

Study on Memristive Characteristics in Electronic Devices Based on Vanadium Dioxide Thin Films Using 966nm Laser Pulses (966nm 레이저 펄스를 이용한 바나듐 이산화물 박막 기반 전자 소자에서의 멤리스터 특성에 관한 연구)

  • Kim, Jihoon;Lee, Yong Wook
    • Journal of the Korean Institute of Illuminating and Electrical Installation Engineers
    • /
    • v.29 no.11
    • /
    • pp.59-65
    • /
    • 2015
  • By harnessing the thermal hysteresis behavior of vanadium dioxide($VO_2$), we demonstrated multi-resistance states in a two-terminal electronic device based on a $VO_2$ thin film by using a 966nm infrared laser diode as an excitation light source for resistance modulation. Before stimulating the device using 966nm laser pulses, the thermal hysteresis behavior of the device resistance was measured by using a temperature chamber. After that, the $VO_2$ device was thermally biased at ${\sim}71.6^{\circ}C$ so that its temperature fell into the thermal hysteresis region of the device resistance. Six multi-states of the device resistance could be obtained in the fabricated $VO_2$ device by five successive laser pulses with equal 10ms duration and increasing power. Each resistance states were maintained while the temperature bias was applied. And, the resistance fluctuation level was within 2.2% of the stabilized resistance and decreased down to less than 0.9% of the stabilized resistance 5s after the illumination.

The Electrical properties of Al/TiN/Ti Contact at Submicron contact(2) (Al/TiN/Ti 전극의 Submicron contact에서의 전기적특성(2))

  • Lee, C.J.;Eum, M.J.;Ra, Y.C.;Kim, S.J.;Sung, M.Y.;Sung, Y.K.
    • Proceedings of the KIEE Conference
    • /
    • 1995.07c
    • /
    • pp.1069-1071
    • /
    • 1995
  • The electrical properties of Al/TiN/Ti contact are investigated at submicron contacts. The contact resistance and contact leakage current are dependent on metallization, surface dopant concentration, semiconductor surface treatment and contact plug ion implantation. In this paper, the contact resistance and contact leakage current are studied according to surface dopant concentration, semiconductor surface treatment and contact plug ion implantation at 0.8 micron contact. The contact resistance and contact leakage current increases with increasing substrate ion concentration. HF cleaning represents high contact resistance but low contact leakage current while CDE cleaning represents low contact resistance but high contact leakage current. Contact plug ion implantation decreases contact resistance but increases contact leakage current. Specially, RTA represents good electrical properties.

  • PDF

Effects of Contact Conditions on the Connector Electrical Resistance of Direct Current Circuits

  • Kim, Young-Tae;Sung, In-Ha;Kim, Jin-San;Kim, Dae-Eun
    • International Journal of Precision Engineering and Manufacturing
    • /
    • v.5 no.3
    • /
    • pp.5-10
    • /
    • 2004
  • Electric contacts serve the purpose of transmitting electric signals across two conducting components. In this paper, the effects of contact conditions such as surface roughness, oxidation, and contamination were investigated with respect to electrical resistance variation of a connector in a direct current circuit. Such change in the electrical resistance is particularly important for low power circuits. The experimental results showed that compared with the effects of contact surface scratch or oxidation, the effect of contamination on the resistance variation was the most significant. In order to minimize failure due to electrical resistance change at the contact region, proper sealing to prevent contamination from entering the interface is needed.

Reduction of metal-graphene contact resistance by direct growth of graphene over metal

  • Hong, Seul Ki;Song, Seung Min;Sul, Onejae;Cho, Byung Jin
    • Carbon letters
    • /
    • v.14 no.3
    • /
    • pp.171-174
    • /
    • 2013
  • The high quality contact between graphene and the metal electrode is a crucial factor in achieving the high performance of graphene transistors. However, there is not sufficient research about contact resistance reduction methods to improve the junction of metal-graphene. In this paper, we propose a new method to decrease the contact resistance between graphene and metal using directly grown graphene over a metal surface. The study found that the grown graphene over copper, as an intermediate layer between the copper and the transferred graphene, reduces contact resistance, and that the adhesion strength between graphene and metal becomes stronger. The results confirmed the contact resistance of the metal-graphene of the proposed structure is nearly half that of the conventional contact structure.

Enhancement of Electrical Conductivity for Ag Grid using Electrical Sintering Method (정전류 전기 소결법을 이용한 Ag 전극 배선의 전도성 향상)

  • Hwang, Jun Y.;Moon, Y.J.;Lee, S.H.;Kang, K.;Kang, H.;Cho, Y.J.;Moon, S.J.
    • 한국신재생에너지학회:학술대회논문집
    • /
    • 2011.05a
    • /
    • pp.114.1-114.1
    • /
    • 2011
  • Electrical sintering of the front electrode for crystalline silicon solar cells was performed applying a constant DC current to the printed lines. Conducting lines were printed on glass substrate by a drop-on-demand (DOD) inkjet printer and silver nanoparticle ink. Specific resistance and microstructure of sintered silver lines and were measured with varying DC current. To find the relation between temperature increase with changing applied current and specific resistance, temperature elevation was also calculated. Sintering process finished within a few milliseconds. Increasing applied DC current, specific resistance decreased and grain size increased after sintering. Achieved minimum specific resistance is approximately 1.7 times higher than specific resistance of the bulk silver.

  • PDF

Evaluation of Fracture Detection Function for the FRP by Electrical Resistance Measurement (전기저항 측정에 의한 FRP의 파괴 예측 기능의 평가)

  • Sin, Sun-Gi;Kim, Yeong-Hui;Lee, Jun-Hui
    • Korean Journal of Materials Research
    • /
    • v.12 no.2
    • /
    • pp.135-139
    • /
    • 2002
  • Carbon powders (CP) and carbon fiber (CF) were introduced info glass fiber reinforced plastics (FRP) composites to obtain fracture detection function. The composites were evaluated through the relation between a load-displacement curve and an electrical resistance change curve in three point bending test. CP containing FRP (CP-FRP) has a sensitivity of electrical resistance change at much lower load level than CF containing FRP (CF-FRP). In loading-unloading tests, CP-FRP showed a large amount of residual electrical resistance which enables the estimation of loading hysteresis.

Study on I-V simulation for PV module with matlab (Matlab을 이용한 PV모듈의 I-V시뮬레이션 관한 연구)

  • Hong, Jong-Kyoung;Jung, Tae-Hee;Kang, Gi-Hwan;Ahn, Hyung-Keun;Han, Deuk-Young
    • Journal of the Korean Solar Energy Society
    • /
    • v.29 no.4
    • /
    • pp.1-6
    • /
    • 2009
  • This paper estimates numerically cells the electrical characteristics of the PV module with environmental changes such as shunt resistance, series resistance, temperature, irradiance. Series resistance $R_s$ including diode characteristic resistance $r_d$ is derived from the p-n junction diode model. I-V characteristics of this model with series resistance $R_s$ are simulated on Matlab. Finally, theoretical I-V characteristics are compared with those of solar simulator. Those results agreed well within the manufacturer's maximum error range 3%

Distribution of Electrical Resistance in Medial Side of Forearm (인체(人體) 전완부(前腕部) 내측(內側)의 전기저항(電氣抵抗) 분포(分布)에 관(關)한 관찰(觀察) 보고(報告))

  • Kim Gi-Wang;Park Kyung-Mo
    • Korean Journal of Acupuncture
    • /
    • v.17 no.1
    • /
    • pp.173-177
    • /
    • 2000
  • We have observed the electrical resistance of every point in a $16{\times}64$ matrix that is projected to the medial side of human forearm. The electrical resistance against the 1.25V directing current was rated in discrete scale and illustrated in contour maps. The characteristics of distribution of electrical resistance and it's relations to so called Meridians were also discussed.

  • PDF

Fabrication Technology of DLC for New Light Source (광원 적용을 위한 DLC합성)

  • Lee, Sang-Heon;Park, Dae-Hee
    • Proceedings of the KIEE Conference
    • /
    • 2006.07c
    • /
    • pp.1663-1664
    • /
    • 2006
  • Carbon films was grown on Si substrates using the method of electrolysis for methanol liquid. Deposition parameters for the growth of the carbon films were current density for the electrolysis, methanol liquid temperature and electrode spacing between anode and cathode. We examined electrical resistance and the surface morphology of carbon films formed under various conditions specified by deposition parameters. It was clarified that the high electrical resistance carbon films with smooth surface morphology are grown when a distance between the electrodes was relatively wider. We found that the electrical resistance in the films was independent of both current density and methanol liquid temperature for electrolysis. The temperature dependence of the electrical resistance in the low resistance carbon films was different from one obtained in graphite.

  • PDF