• 한국전자현미경학회:학술대회논문집
• /
• 2002.05a
• /
• pp.76-77
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• 2002

• 한국전자현미경학회:학술대회논문집
• /
• 2000.05a
• /
• pp.85-86
• /
• 2000

• 한국전자현미경학회:학술대회논문집
• /
• 2001.05a
• /
• pp.61-62
• /
• 2001

• 한국전자현미경학회:학술대회논문집
• /
• 2001.11a
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• pp.87-88
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• 2001

• Journal of the Mineralogical Society of Korea
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• v.17 no.2
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• pp.177-187
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• 2004

Measurements of the lattice parameters of albite and oligoclase from electron diffraction patterns with the Au internal standard resulted in errors of less than 1 %. An electron diffraction map for natural oligoclase samples was constructed and 11 stations of zone-axes diffraction patterns were obtained. This process is indispensible for reliable TEM studies of triclinic feldspars. Utilizing the [001] cleavage plane of feldspar and the double-tilting TEM holder the following information is obtainable: Si-Al ordering and chemistry of alkali feldspars could be estimated from the $\alpha$＊ - ＊ plot, where ＊ is measured from the [001] orientation, while $\alpha$＊ is measured from the [100] orientation. Si-Al ordering of Na-rich plagioclase could be estimated from ＊ [001] patterns. Structure and chemistry or Na-poor plagioclase could be estimated from existence of e-reflections, their intensity variations as well as their positional changes.