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An Investigation on Structural Analysis of Feldspars by Electron Diffraction Patterns  

김윤중 (한국기초과학지원연구원)
이영부 (한국기초과학지원연구)
박병규 (전남대학교 지구환경과학)
이정후 (전북대학교 지구환경과학과)
Publication Information
Journal of the Mineralogical Society of Korea / v.17, no.2, 2004 , pp. 177-187 More about this Journal
Abstract
Measurements of the lattice parameters of albite and oligoclase from electron diffraction patterns with the Au internal standard resulted in errors of less than 1 %. An electron diffraction map for natural oligoclase samples was constructed and 11 stations of zone-axes diffraction patterns were obtained. This process is indispensible for reliable TEM studies of triclinic feldspars. Utilizing the [001] cleavage plane of feldspar and the double-tilting TEM holder the following information is obtainable: Si-Al ordering and chemistry of alkali feldspars could be estimated from the $\alpha$＊ - ＊ plot, where ＊ is measured from the [001] orientation, while $\alpha$＊ is measured from the [100] orientation. Si-Al ordering of Na-rich plagioclase could be estimated from ＊ [001] patterns. Structure and chemistry or Na-poor plagioclase could be estimated from existence of e-reflections, their intensity variations as well as their positional changes.
Keywords
electron diffraction pattern; double-tilting TEM holder; {001} cleavage plane; structure/chemistry of feldspar;
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