• Journal of environmental and Sanitary engineering
• /
• v.7 no.1
• /
• pp.87-94
• /
• 1992

In order to investigate the content of heavy metals in soil according to vertical profiles, 72 soil samples were collected from 4 sampling sites : Ulchiro-2 ga, Dugdo, Sungnaedong, and Amsa- dong. The content of mercury was measured by a mercury analyzer and those of lead, copper and zinc were measured by an atomic absorption spectrophotometer. From the results of this study, it was shown that the content of heavy metals decreased gradually from the surface soil to the 2 m- depth soil. But, there was no difference in the contents of the heavy metals in the 3m, the 4m and the 5m-depth soil.

• Journal of Integrative Natural Science
• /
• v.1 no.1
• /
• pp.54-57
• /
• 2008

This report examines the variation on structural properties of $SnO_2$ thin films. TEM studies shows some of the interfaces to be atomically faceted. Secondary X-ray photoelectron Spectroscopy Analysis(XPS) depth profiles show that films have a uniform composition along the depth.

• Design & Manufacturing
• /
• v.17 no.4
• /
• pp.24-32
• /
• 2023

In this study, we introduce research aimed at minimizing machining errors without compromising productivity by compensating for the machining errors caused by tool deformation. Our approach experimentally establishes the direct correlation between cutting depth and machining error, and creates predictive models using mathematical functions. This method allows for the prediction of compensated cutting depths to obtain the desired cutting profiles, thereby maximizing the compensation of machining errors in the cutting process.

• Journal of the Korean Vacuum Society
• /
• v.10 no.2
• /
• pp.225-233
• /
• 2001

Distortion of Secondary Ion Mass Spectrometry(SIMS) depth profile, which is usually observed when the analysis is made using oxygen flooding on the surface of Si with oxide on it, has been corrected. The origin of distortion has been attributed to depth calibration error due to sputter rate difference and concentration calibration error due to relative sensitivity factor(RSF) difference between $SiO_2$ and Si layers, In order to correct depth calibration error, artifact in analysis of sodium ion on oxide was used to define the interface in SIMS depth profile and oxide thickness was measured with SEM and XPS. The differences of sputter rate and RSF between two layers have been attributed to volume swelling of Si substrate occurred by oxygen flooding induced oxidation. The corrected SIMS depth profiles showed almost the same results with those obtained without oxygen flooding.

• Journal of the Korean Society of Manufacturing Technology Engineers
• /
• v.25 no.1
• /
• pp.83-88
• /
• 2016

Because of the increasing tool cost for cutting hard-to-cut materials, abrasive water jet (AWJ) milling recently has been regarded as a potential alternative machining method. However, it is difficult to control the depth and width of cut in AWJ milling because they vary depending on many AWJ cutting parameters. On 27 conditions within a limited range of pressure, feed rate, and abrasive flow rate, AWJ cutting was conducted on titanium, and depth profiles were measured with a laser sensor. From the depth profile data, depth and width of cut were acquired at each condition. The relationships between depth and parameters and between width and parameters were derived through regression analysis. The former can provide proper cutting conditions and the latter the proper pick feed necessary to generate a milled surface. It is verified that pressure mostly affects depth, whereas abrasive flow rate mostly affects width.

• Journal of Ocean Engineering and Technology
• /
• v.25 no.4
• /
• pp.23-27
• /
• 2011

This experimental study was performed to find rpms of the impeller and the surface flow accelerator to make a uniform velocity vertical distribution in the circular water channel. PIV technique was employed to measure the water velocity profiles into the water depth from the free surface. The number of instantaneous velocity profiles was decomposed into mean and turbulence velocity components, and the distribution of velocity fluctuation and turbulence intensity were computed for each experimental condition. From these results, the velocity uniformity was quantitatively determined to present the flow quality in the measuring section of the circular water channel. It has been shown that the proper operation of the surface flow accelerator would make the uniform velocity profiles and reduce the velocity fluctuation near the free surface.

• Economic and Environmental Geology
• /
• v.40 no.6
• /
• pp.751-759
• /
• 2007

To better understand the subsurface geological structure of the Kunsan Basin in the Yellow Sea, the mean depths of the density discontinuous layers (DDLs) of the Kunsan Basin were calculated by power spectrum analysis using satellite altimetry gravity data. The calculated mean depths of DDLs were -1.1km, -3.4km, -9.1km and -31.0km. The mean depth of -1.1km DDL was interpreted as regional unconformity shown in about 1 second in two way travel time (TWTT) in the seismic reflection profiles, and the mean depth of -3.4km DDL was also interpreted as top of the acoustic basement in the seismic reflection profiles. Comparing with well data, seismic reflection profiles and regional geology in the study area, the mean depth of -9.1km DDL was interpreted as top of the igneous origin basement. This means that the acoustic basement of the study area is composed mainly of sediments which are disregarded in previous study. The mean depth of -31.0km DDL was interpreted as the Moho discontinuity because this mean depth is similar to one of the normal continental crust thickness. The detection of top of the igneous origin basement suggests that oil gas potential analysis in Kunsan Basin needs to be extended to the deeper part of sediments (acoustic basement).

• Analytical Science and Technology
• /
• v.10 no.2
• /
• pp.105-113
• /
• 1997

We investigated the content of heavy metals contained in the soil at an Il-Kwang disused mine in Kyung Nam. Three sampling points were selected, each point was digged to 210 or 240cm, sampled each 30cm depth. After air drying, each sample was digested in aqua regia and then analyzed with an Inductively Coupled Plasma Atomic Emission Spectrometer. We determined the content of Zn, Pb, Cr, Cd, Cu, Mn, and Fe, maximum content of Pb, Cd, and Zn was observed to $(4.6{\pm}0.1){\times}10^3$, 9.4(${\pm}3.6$), and $(2.7{\pm}0.1){\times}10^2{\mu}g/g$ respectively. Mean pH values of soil sampled at No.1, 2, and 3 regions were 3.2, 2.6, and 2.8, respectively. These values are remarkably lower than pH of the conventional standard soil which usually shows pH level around 4.9. At each sampling point, maximum content of heavy metals was observed from 30cm to 60cm depth. The depth profiles of Zn, Cd, Pb, and Cr showed very similar tendencies to each other, but those of Fe, Cu. and Mn showed different tendencies to former ones.

• Smart Structures and Systems
• /
• v.16 no.4
• /
• pp.667-681
• /
• 2015

The scour induced by strong currents and wave action decreases the embedded length of monopiles and leads to a decrease of their structural stability. The objective of this study is the development and consideration of scour-monitoring techniques for offshore monopile foundations. Tests on physical models are carried out with a model monopile and geo-materials prepared in a cylindrical tank. A strain gauge, two coupled ultrasonic transducers, and ten electrodes are used for monitoring the scour. The natural frequency, ultrasonic reflection images, and electrical resistivity profiles are obtained at various scour depths. The experimental results show that the natural frequency of the model monopile decreases with an increase in the scour depth and that the ultrasonic reflection images clearly detect the scour shape and scour depth. In addition, the electrical resistivity decreases with an increase in scour depth. This study suggests that natural frequency measurement, ultrasonic reflection imaging, and electrical resistivity profiling may be used as effective tools to monitor the scour around an offshore monopile foundation.

• Journal of the Korean Vacuum Society
• /
• v.5 no.3
• /
• pp.218-222
• /
• 1996

STrained layers and strain depth profile of high dose As ion implanted (100) si wafer annealed at various temperatures have been investigated by means of X-ray double crystal diffractometry (X-ray DCD). The results obtained by x-ray rocking curve analysis showed a defect layer at the original amorphous /crystalline interface of 1400$\AA$ depth. In addition arsenic ion concentrtion profiles and defect distributions in depth were obtained by the SIMS and TRIM -code simulation . the positive strain depth profile determined from the rocking curve analysis were only presented under 0.14 $\mu$m from the surface for samples ananelaed at $600^{\circ}C$. The results was shown that the thickness of amprphous layer is 0.14 $\mu$m indirectry, and it was good agreement with the TRIM -Code simulation. Additionally, it could be thought that the positive strain have been affected residual intersitial atoms under the amorphous/crystalline interface formed by ion implantation.