• Title/Summary/Keyword: deposition rate

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Detailed Comparison of Discharge Characteristics of both FTS and CPMS Systems (FTS와 CPMS 시스템의 방전특성비교)

  • Kwak, D.J.;Sung, Y.M.;Park, C.H.;Ha, P.K.
    • Proceedings of the KIEE Conference
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    • 1994.07b
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    • pp.1619-1621
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    • 1994
  • Both Facing Target Sputtering(FTS) and Cylindrical Post-Magnetron Sputtering(CPMS) systems have been degigned in order to form high density plasma and to obtain high deposition rate. However, these two systems have some different applications, and discharge characteristics of these two systems are not well known. In this paper, the discharge characteristics and plasma parameters of both FTS and CPMS systems are studied experimentally. It is found that these two system show some different discharge characteristics under magnetic fields. The plasma density and electron temperature of these two systems are in the range of $10^{10}{\sim}10^{11}[cm^{-3}]$ and $3.5{\sim}5.5[eV]$, respectively.

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Electrical and Optical Properied of Tin Oxide Films Prepared by Ozone Assisted-MOCVD (Ozone Assisted-MOCVD로 제작된 산화주석막의 전기적 광학적 특성)

  • 배정운;이상운;송국현;박정일;박광자;염근영
    • Journal of Surface Science and Engineering
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    • v.31 no.2
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    • pp.109-116
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    • 1998
  • Highly transparent conductive pure and fluorine-doped tin oxide(FT0, $SnO_2$ : F) films have been prepared by low pressure metal organic chemical vapor deposition (LP-MOCVD) from various mixtures of tetramethyitin(TMT) with oxygen or oxygen containing ozone. The properties of TO films have been changed with the variation of gases, flow rate, and substrate temperature. The nsing of oxygen containing ozone instead of pure oxygen, reduced substrate temperature by 100-$150^{\circ}C$ while maintaining same thickness. The films prepared by using ozone showed the resistivity in the range from $10^~2$ to $10^{~3}\Omega$cm, and the mobiiity from 10 to $14\textrm{cm}^2$/Vs. Fluorine-doped tin oxide films had properties such as the resistivity about $10^{-4}\Omega$cm, and the mobility from 14 to $19\textrm{cm}^2$/Vs.

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Electroless Nickel-Boron Plating on p-type Si Wafer by DMAB (DMAB에 의한 P형 실리콘 기판 무전해 니켈-붕소 도금)

  • 김영기;박종환;이원해
    • Journal of Surface Science and Engineering
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    • v.24 no.4
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    • pp.206-214
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    • 1991
  • In the basic study of selective electroless Ni plating of Si wafers, plating rate and physical properties are investigated to obtain optimum conditions of contact hole filling. Si wafers are excellently activated in the concentration of 0.5M IF, 1mM PdCl2, 2mM EDTA at $70^{\circ}C$, 90sec. The optimum condition of Ni-B deposition on p-type Si wafers is 0.1M NiSO4, 0.11M Citrate, $70^{\circ}C$, pH6.8, 8mM DMAB. The main factor in the sheet resistences variation of films is amorphous and on heat treating matrix was transformed into a stable phase (Ni+Ni3B) at $300-400^{\circ}C$. But pH or DMAB concentration in the plating solution doesn't play role of heat-affected phase change.

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Structural and Optical Properties of TiO$_2$ Films Deposited by MOCVD (MOCVD 법에 의해 증착된 TiO$_2$ 박막의 결정구조 및 광학적 특성)

  • 장동훈;강성준;윤영섭
    • Journal of the Korean Institute of Telematics and Electronics D
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    • v.34D no.6
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    • pp.50-57
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    • 1997
  • TiO$_{2}$ tin films have been grown by MOCVD and their cahracteristics of crystallization and microstructures ahve been invetigated. Envelope mehtods are applied to the analysis of the transmission spectra to obtain the optical constants such as refractive indices and extinction coefficients for the TiO$_{2}$ thin films. The envelope methods are proved to be accurate by simulatin gthe transmission spectra. TiO$_{2}$ thin films start to crystallize at 350.deg.C and then crystallize fully into anatase phase at 400.deg.C or higher temperatures. Activation energies are obtained by plotting the deposition rate with varying the substrate temperature. It is 17.8 kcal/mol for the reaction limited regions. The refractive index and the extinction coefficient of the TiO$_{2}$ thin film at .gamma.=632.8 nm increases from 2.19 to 2.32 and decreases from 0.021 to 0.007, respectively, as the substrate temperature increases from 400 to 600.deg. C.

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A study for the residual strain of aluminum thin film for MEMS structures (MEMS용 구조물을 위한 알루미늄 박막의 잔류응력에 대한 연구)

  • Kim, Youn-Jin;Shin, Jong-Woo;Kim, Yong-Kweon
    • Proceedings of the KIEE Conference
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    • 1998.07g
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    • pp.2521-2523
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    • 1998
  • Freestanding flexible microstructures fabricated from deposited thin films become mechanically unstable when internal stresses exceed critical values. The residual stress and stress gradient of aluminum thin film were examined to make sure of fabricating the reproduceable aluminium structure. For good shape of micro mirror array and microstructures, the experiment was done varying thickness and deposition rate. As the aluminium film thickness increased from 0.8${\mu}m$ to 1.6${\mu}m$, the stress gradient decreased from 11.62MPa/${\mu}m$ to 2.62MPa/${\mu}m$. The residual stress values are from 42.4MPa to 62.24MPa of tensile stresses.

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Dielectric Properties of the Hole Injection Layer(AF) for OLEDs (OLED용 정공주입층(AF)의 유전특성)

  • Lee, Young-Hwan;Lee, Kang-Won;Shin, Jong-Yeol;Kim, Tae-Wan;Lee, Chung-Ho;Hong, Jin-Woong
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2008.06a
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    • pp.409-410
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    • 2008
  • We studied dielectric properties of Organic Light-emitting Diodes(OLEDs) depending on applied voltage of AF(Amorphous Polytetrafluoroethylene), material of hole injection layer in structure of ITO/hole injection layer (AF)/Al. AF is deposited 5 [nm] as deposition rate of 0.1~0.2 [$\AA$/s] in high vacuum of $5\times10^{-6}$ [Torr]. In result of these studies, we can know dielectric properties of OLEDs. The impedance decreases as the applied voltage increases and the Cole-Cole plots of devices are decreases as the applied voltage increases.

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Carbon Nanotube Synthesis with High Purity by Introducing of NH3 Etching Gas (암모니아 식각 가스 도입에 의한 고순도 탄소나노튜브의 합성)

  • Lee, Sunwoo;Lee, Boong-Joo
    • The Transactions of The Korean Institute of Electrical Engineers
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    • v.62 no.6
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    • pp.782-785
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    • 2013
  • Multi-walled carbon nanotubes were synthesized on Ni catalyst using thermal chemical vapor deposition. By introducing ammonia gas during the CNT synthesis process, clean and vertically aligned CNTs without impurities could be prepared. As the ammonia gas increased a partial pressure of hydrogen in the mixed gas during the CNT synthesis process, we could control the CNT synthesis rate appropriately. As the ammonia gas has an etching ability, amorphous carbon species covering the catalyst particles were effectively removed. Therefore catalyst particles could maintain their catalytic state actively during the synthesis process. Finally, we could obtain clean and vertically aligned CNTs by introducing $NH_3$ gas during the CNT synthesis process.

The Study of Nanocrystalline Silicon Bottom-gate Thin Film Transistor Fabricated at Low Temperature for Flexible Display

  • Lee, Youn-Jin;Lee, Kyoung-Min;Hwang, Jae-Dam;No, Kil-Sun;Yoon, Kap-Soo;Yang, Sung-Hoon;Hong, Wan-Shick
    • 한국정보디스플레이학회:학술대회논문집
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    • 2009.10a
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    • pp.557-559
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    • 2009
  • We attempted modulation of hydrogen dilution ratio to achieve both the minimal incubation layer and high deposition rate. The incubation layer thickness was estimated by transmission electron microscopy (TEM) and crystallization fraction was measured by Raman spectroscopy.

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High control Alkali & Alkaline-earth Metal Sources for OLED devices

  • Bonucci, Antonio;Bertolo, Johnny Mio;Riva, Mauro;Carretti, Corrado;Tominetti, Stefano;Kim, Sung-Hyun;Lee, Jun-Yeob
    • 한국정보디스플레이학회:학술대회논문집
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    • 2007.08a
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    • pp.332-335
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    • 2007
  • Electron injection improvement in OLED organic layers can be obtained by their doping or using alkaline-earth or alkali metals as electron injection layers (EIL). Common handling problems can be solved by an innovative metal dispensing technology to ensure controlled and reliable metal layers for OLED. Thickness and deposition rate of EIL during the process have been explored to optimize device performances.

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A Study on the Glow Discharge Characteristics of Facing Target Plasma Process (대향 음극형 플라즈마 프로세스의 글로우 방전특성에 관한 연구)

  • Park, Chung-Hoo;Cho, Jung-Soo;Kim, Kwang-Hwa;Sung, Youl-Mool
    • The Transactions of the Korean Institute of Electrical Engineers
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    • v.43 no.3
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    • pp.478-484
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    • 1994
  • Facing target dc sputtering system developed by Hoshi et al. has simple configuration and high deposition rate under moderate substrate temperature in the range of pressure 5x10S0-4T - 1x10S0-2T torr. In this system, magnetic field should be applied perpendicular to the target surface in order to confine high energy secondary electrons between two targets. Because of this magnetic field, the glow discharge characteristics are very different from dc planar diode system showing some unstable discharge region. In this paper, the glow discharge characteristics of this system have been studied under the condition of Ti targets with Ar-NS12T(10%) as working gas. It is found that this system has stable discharge region under the discharge current density of 15-30(mA/cmS02T). The plasma density and electron temperature are in the range of 10S010Y - 10S011T(CMS0-3T) and 2.5-5(eV), respectively.