• 한국추진공학회:학술대회논문집
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• 한국추진공학회 1994년도 제3회 학술강연회논문집
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• pp.21-26
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• 1994

Conventional electroexplosive devices (EED) commonly use a very small metal bridgewire to ignite explosive materials i.e. pyrotechnics, primary and secondary explosives. The use of semiconductor devices to replace “hot-wire” resistance heating elements in automotive safety systems pyrotechnic devices has been under development for several years. In a typical 1 amp/1 watt electroexplosive devices, ignition takes place a few milliseconds after a current pulse of at least 25 mJ is applied to the bridgewire. In contrast, as for a SCB devices, ignition takes place in a few tens of microseconds and only require approximately one-tenth the input energy of a conventional electroexplosive devices. Typically, when SCB device is driven by a short (20 $\mu\textrm{s}$), low energy pulse (less than 5 mJ), the SCB produces a hot plasma that ignites explosive materials. The advantages and disadvantages of this technology are strongly dependent upon the particular technology selected. To date, three distinct technologies have evolved, each of which utilizes a hot, silicon plasma as the pyrotechnic initiation element. These technologies are 1.) Heavily doped silicon as the resistive heating initiation mechanism, 2.) Tungsten enhanced silicon which utilizes a chemically vapor deposited layer of tungsten as the initiation element, and 3.) a junction diode, fabricated with standard CMOS processes, which creates the initial thermal environment by avalanche breakdown of the diode. This paper describes the three technologies, discusses the advantages and disadvantages of each as they apply to electroexplosive devises, and recommends a methodology for selection of the best device for a particular system environment. The important parameters in this analysis are: All-Fire energy, All-Fire voltage, response time, ease of integration with other semiconductor devices, cost (overall system cost), and reliability. The potential for significant cost savings by integrating several safety functions into the initiator makes this technology worthy of attention by the safety system designer.

• 전기화학회지
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• 제3권3호
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• pp.141-145
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• 2000

전도성이 뛰어난 피롤고분자 피막을 전기화학적으로 중합하고 이를 Gr/ppy(Polypyrrole),X.O.(xylenol orange)형의 수식된 전극을 제작하여 U(VI)의 포집에 이용하였다. 사전피막제인 NBR(nitrile butadiene rubber)을 사용하였을 때 중합속도는 $3.22\times10^{-3}s^{-1}$로 이를 사용하지 않았을 때 보다 1.6배 느린 반응이었다. 포집된 U(VI)의 양은 ppy $1.70Ccm^{-2}$ 당에 $1.55\times10^{-4}g$ 이었으며, 인공해수 중에서 matrix효과는 $6.8\%$로 나타났다. ppy전극이 Gr/ppy, $X.O^{4-}UO^+$형으로 수식됨에 따라서 피막자체의 임피던스가 증가하여 ppy만일 때의 확산에 지배적인 전도과정에서 피막자체의 전자전도와 이온도핑과정이 함께 영향을 받는 결과를 보였다. ppy전극을 X.O.로 수식하여 U(VI)를 포집함에 따라 전기이중층의 용량은 각각 56과 130여 배로 증가하였다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 하계학술대회 논문집 Vol.9
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• pp.202-202
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• 2008

실리콘 기판 위에 성장된 세륨 산화막(CeO2)은 고품질의 SOI(Silicon on Insulator)나 혹은 안정한 캐패시터 소자와 같은 반도체 소자에 대한 응용 가능성이 높아 여러 연구가 진행되어 왔다. 세륨 산화막은 형석 구조, 다시 말해서 대칭적인 큐빅 구조이며 화학적으로 안정한 물질이다. 또한, 세륨 산화막의 격자상수 (a = $5.411\AA$)는 실리콘의 격자상수 (a = $5.430\AA$) 와 비슷하며 큰 밴드갭(6eV) 및 높은 유전상수 ($\varepsilon$ = 26), 높은 열적 안전성을 지니고 있어 실리콘 기판에 사용된 기존 절연막인 사파이어나 질코늄 산화막보다 우수한 특성을 지니고 있다. 본 논문에서는 스퍼터링을 이용하여 세륨 산화막을 실리콘 기판 위에 형성하면서 기판가열 온도 조건을 각각 상온, $100^{\circ}C$, $200^{\circ}C$로 설정하였으며, 세륨 산화막의 증착 두께 조건을 각각 80nm, 120nm로 설정한 다음 퍼니스를 이용하여 $1100^{\circ}C$에서 1시간 동안 열처리를 거친 세륨 산화막의 결정화 형태 및 박막의 막질 상태를 각각 X선 회절 장치 (XRD) 및 주사전자현미경 (SEM)으로 관찰하였다.

• 한국전기전자재료학회논문지
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• 제26권8호
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• pp.602-607
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• 2013

Concern for the TOS (Transparent Oxide Semiconductor) is increasing with the recent increase in interest for flexible device. Especially MgZnO has attracted a lot of attention. $Mg_xZn_{1-x}O$, which ZnO-based wideband-gap alloys is tuneable the band-gap ranges from 3.36 eV to 7.8 eV. In particular, the flexible substrate, the crystal structure of the amorphous as well as the surface morphology is not good. So research of MgZnO thin films growth on flexible substrate is essential. Therefore, in this study, we studied on the effects of the oxygen partial pressure on the structural and crystalline of $Mg_{0.1}Zn_{0.9}O$ thin films. MgZnO thin films were deposited on PES substrate by using pulsed laser deposition. We used XRD and AFM in order to observe the structural characteristics of MgZnO thin films. UV-visible spectrophotometer was used to get the band gap and transmittance. Crystallization was done at a low oxygen partial pressure. The crystallinity of MgZnO thin films with increasing temperature was improved, Grain size and RMS of the films were increased. MgZnO thin films showed high transmittance over 80% in the visible region.

• 대한전기학회:학술대회논문집
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• 대한전기학회 2006년도 추계학술대회 논문집 전기물성,응용부문
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• pp.109-110
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• 2006

In bio applications, high temperature coefficient of resistance (TCR) at $30^{\circ}C{\sim}40^{\circ}C$ is especially important for a temperature sensor. In this work, single phase-vanadium dioxide ($VO_2$) thin films for temperature sensor were fabricated by reactive DC magnetron sputtering and post-annealing method. VOx thin films deposited by reactive sputtering in a controlled $Ar/O_2$ atmosphere can be transformed into single phase-$VO_2$ films by post-annealing in $N_2$ atmosphere. The grown $VO_2$ thin films have a moderate resistance at room temperature and very high TCR at room temperature and transition temperature, respectively 2.88%/K and 15.8%/K. A detailed structural characterization is performed by SEM, XRD and RBS. SEM morphology image indicates that grains of fabricated $VO_2$films are homogeneous and ball-like in shape. A fact that the films contain only single phase-$VO_2$ is obtained by XRD and RBS analysis. After deposition, the sensors were fabricated by micromachining technology. Silicon nitride membrane and black nickel were used for a thermal isolation structure and absorption layer. In the vicinity of room temperature, the TCR of sensors was enough high to apply for bio sensors.

• Korean Chemical Engineering Research
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• 제46권4호
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• pp.697-700
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• 2008

본 연구에서는 개미산 연료전지의 연료극에서 Pt 촉매의 안정성과 활성을 높이기 위해 Bi를 UPD법을 이용하여 Pt 촉매 위에 증착시켰다. 증착된 Bi의 활용도를 높이기 위해 다층 전극구조를 적용하였으며, 전자탐침미세분석(EPMA) 결과에서 Bi가 장기성능 실험동안 촉매층에 안정적으로 존재하는 것을 확인할 수 있었다. 연료전지 성능실험에서는 Pt black 촉매 위에 Bi를 UPD한 다층 구조의 전극이 PtRu black 촉매보다 전류밀도 $150mA/cm^2$에서 약 200 mV정도 높은 성능을 나타냈다. Pt black을 40% Pt/C로 대체했을 경우 역시 높은 성능과 장기 안정성을 보였다.

• Journal of the Optical Society of Korea
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• 제20권6호
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• pp.807-812
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• 2016

Transparent film heaters (TFHs) based on Joule heating are currently an active research area. However, TFHs based on an indium tin oxide (ITO) monolayer have a number of problems. For example, heating is concentrated in only part of the device. Also, heating efficiency is low because it has high sheet resistance ($R_s$). To address these problems, this study introduced hybrid layers of ITO/Ag/ITO deposited by magnetron sputtering, and the electrical, optical, and thermal properties were estimated for various thicknesses of the metal interlayer. The $R_s$ of ITO(40)/Ag/ITO(40 nm) hybrid TFHs were 5.33, 3.29 and $2.15{\Omega}/{\Box}$ for Ag thicknesses of 10, 15, and 20 nm, respectively, while the $R_s$ of an ITO monolayer (95 nm) was $59.58{\Omega}/{\Box}$. The maximum temperatures of these hybrid TFHs were 92, 131, and $145^{\circ}C$, respectively, under a voltage of 3 V. And that of the ITO monolayer was only $32^{\circ}C$. For the same total thickness of 95 nm, the heat generation rate (HGR) of the hybrid produced a temperature approximately $100^{\circ}C$ higher than the ITO monolayer. It was confirmed that the film with the lowest $R_s$ of the samples had the highest HGR for the same applied voltage. Overall, hybrid layers of ITO/Ag/ITO showed excellent performance for HGR, uniformity of heat distribution, and thermal response time.

• 한국자기학회지
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• 제8권5호
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• pp.282-287
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• 1998

유리 기판위에 dc magnetron sputtering 방법으로 제작한Fe(50 $\AA$)/[Co(17 $\AA$)/Cu(24 $\AA$)]20 다층박막에 관하여 자기저항비의 기저층, 자성층, 비자성층의 증착률 및 열처리 의존성을 살펴보았다. 낮은 base 압력 중에서의 막의 증착은 Co/Cu 계면의 산화를 억제하여 자기저항비를 장가시켰다. 극대 자기저항비를 얻기위해 요구되는 증착률은 Fe는 1$\AA$)/s 이상, Cu는 2.8 $\AA$)/s 이었으며 Co는 증착률이 2 $\AA$/s 보다 높은 경우에 평탄한 자구형성을 이루어 자기적 향비가 높아지는 경향을 보였다. 40$0^{\circ}C$까지의 시료에 대한 역처리는 다층박막의 주기성을 유지한채 더 큰 결정립을 형성시켜 반강자성적으로 결합한 막의 부분이 증가함으로써 자기저항비를 증가시켰다.

• Bulletin of the Korean Chemical Society
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• 제33권7호
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• pp.2207-2212
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• 2012

Dimethylaluminum isopropoxide (DMAI, $(CH_3)_2AlO^iPr$) as a single precursor, which contains one aluminum and one oxygen atom, has been adopted to deposit non-stoichiometric aluminum oxide ($AlO_x$) films by low pressure metal organic chemical vapor deposition without an additional oxygen source. The atomic concentration of Al and O in the deposited $AlO_x$ film was measured to be Al:O = ~1:1.1 and any serious interfacial oxide layer between the film and Si substrate was not observed. Gaseous by-products monitored by quadruple mass spectrometry show that ${\beta}$-hydrogen elimination mechanism is mainly contributed to the $AlO_x$ CVD process of DMAI precursor. The current-voltage characteristics of the $AlO_x$ film in Au/$AlO_x$/Ir metalinsulator-metal (MIM) capacitor structure show high ON/OFF ratio larger than ${\sim}10^6$ with SET and RESET voltages of 2.7 and 0.8 V, respectively. Impedance spectra indicate that the switching and memory phenomena are based on the bulk-based origins, presumably the formation and rupture of filaments.

• 한국재료학회지
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• 제18권3호
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• pp.148-152
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• 2008

A new cost-effective atomic layer deposition (ALD) technique, known as Proximity-Scan ALD (PS-ALD) was developed and its benefits were demonstrated by depositing $Al_2O_3$ and $HfO_2$ thin films using TMA and TEMAHf, respectively, as precursors. The system is consisted of two separate injectors for precursors and reactants that are placed near a heated substrate at a proximity of less than 1 cm. The bell-shaped injector chamber separated but close to the substrate forms a local chamber, maintaining higher pressure compared to the rest of chamber. Therefore, a system configuration with a rotating substrate gives the typical sequential deposition process of ALD under a continuous source flow without the need for gas switching. As the pressure required for the deposition is achieved in a small local volume, the need for an expensive metal organic (MO) source is reduced by a factor of approximately 100 concerning the volume ratio of local to total chambers. Under an optimized deposition condition, the deposition rates of $Al_2O_3$ and $HfO_2$ were $1.3\;{\AA}/cycle$ and $0.75\;{\AA}/cycle$, respectively, with dielectric constants of 9.4 and 23. A relatively short cycle time ($5{\sim}10\;sec$) due to the lack of the time-consuming "purging and pumping" process and the capability of multi-wafer processing of the proposed technology offer a very high through-put in addition to a lower cost.