• Title/Summary/Keyword: defect inspection

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Ultrasonic Inspection Technology of Defect Detection of Propellant/Liner Debond & Propellant Microcrack (초음파를 이용한 추진제/라이너 미접착 및 추진제 미세 크랙의 결함 검출 기법)

  • Na, Sung-Youb
    • Journal of the Korean Society of Propulsion Engineers
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    • v.11 no.1
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    • pp.34-42
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    • 2007
  • Ultrasonic inspection method is more profitable than X-ray radiographic inspection in cost and effect of defect detection such as debond, damage, and it doesn't need special constructions. The method can also be a possible real time inspection with safety. This report explains 1)the experiment and analysis of ultrasonic property of solid propellant, 2)the inspection methods of propellant/liner debond by inside or outside inspection, and 3)the inspection methods of propellant microcrack by damage. From the results, it is possible to detect the defect of propellant/liner debond by inside or outside inspection. Futhermore, it can be possible to detect the propellant microcrack caused by damage using the ultrasonic attenuation.

An Enhanced Histogram Matching Method for Automatic Visual Defect Inspection robust to Illumination and Resolution (조명과 해상도에 강인한 자동 결함 검사를 위한 향상된 히스토그램 정합 방법)

  • Kang, Su-Min;Park, Se-Hyuk;Huh, Kyung-Moo
    • Journal of Institute of Control, Robotics and Systems
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    • v.20 no.10
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    • pp.1030-1035
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    • 2014
  • Machine vision inspection systems have replaced human inspectors in defect inspection fields for several decades. However, the inspection results of machine vision are often affected by small changes of illumination. When small changes of illumination appear in image histograms, the influence of illumination can be decreased by transformation of the histogram. In this paper, we propose an enhanced histogram matching algorithm which corrects distorted histograms by variations of illumination. We use the resolution resizing method for an optimal matching of input and reference histograms and reduction of quantization errors from the digitizing process. The proposed algorithm aims not only for improvement of the accuracy of defect detection, but also robustness against variations of illumination in machine vision inspection. The experimental results show that the proposed method maintains uniform inspection error rates under dramatic illumination changes whereas the conventional inspection method reveals inconsistent inspection results in the same illumination conditions.

Development of Probability Based Defect Verification Algorithm for Automatic Visual Inspection (자동외관검사를 위한 확률기반 불량 확인 알고리즘 개발)

  • Kim, Youngheub;Ryu, Sun-Joong
    • Journal of the Semiconductor & Display Technology
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    • v.16 no.2
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    • pp.1-8
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    • 2017
  • The visual inspection of electronic parts consists of two steps: automatic visual inspection and verification inspection. In the stage of a verification inspection, the human inspector sequentially inspects all the areas which detected in the automatic inspection. In this study, we propose an algorithm to determine the order of verification inspection by Bayes inference well known in the field of machine learning. This is a method of prioritizing a region estimated to have a high probability of defect using experience data of past inspection. This algorithm was applied to the visual inspection of ultraviolet filters to verify its effectiveness. As a result of the comparison experiment, it was confirmed that the verification inspection can be completed 30% of the conventional method by adapting proposed algorithm.

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A New Lighting System for the Inspection of Check Defect of CRT Panel (CRT 판넬의 첵 불량 검출을 위한 새로운 조명 시스템)

  • 차준혁;권인소;하종은
    • Journal of Institute of Control, Robotics and Systems
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    • v.10 no.6
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    • pp.487-493
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    • 2004
  • In this Paper, we propose a lighting system for the stable detection of check defects of the CRT panel through the analysis of the lighting interaction between the lighting unit and the CRT panel. The check defect is very difficult to detect reliably because of its high sensitivity according to the direction of incident light. At first, we model the physical shape of check defects using SEM image. And then we apply physics based illumination model to investigate the optical characteristics of the check defect. Finally, we propose a lighting system for the stable detection of check defect. Experimental results show the feasibility of the proposed lighting system for check inspection.

Aberration Extraction Algorithm for LCD Defect Detection (대면적 LCD 결함검출을 위한 수차량 추출 알고리즘)

  • Ko, Jung-Hwan;Lee, Jung-Suk;Won, Young-Jin
    • 전자공학회논문지 IE
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    • v.48 no.4
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    • pp.1-6
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    • 2011
  • In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.

LCD Defect Detection using Neural-network based on BEP (BEP기반의 신경회로망을 이용한 LCD 패널 결함 검출)

  • Ko, Jung-Hwan
    • 전자공학회논문지 IE
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    • v.48 no.2
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    • pp.26-31
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    • 2011
  • In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.

Analysis on Characteristics of Defects before Inspection for Apartment Use (공동주택 사용검사 전 하자 특성 분석)

  • Lee, Sang-Hyo;Han, Man-Cheon;Kim, Jae-Jun;Lee, Jeong-Seok
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.21 no.5
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    • pp.167-178
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    • 2020
  • The purpose of this paper is to establish a defect classification system for defects before inspection and to derive the pattern and characteristics of defects before inspection by examining about 3,110 defect items for 133 apartment buildings. The study analysis revealed a relatively high rate of defects before inspection that occurred in finishing work. Second, defects occurred such as cracking of external wall, which is a very important defect. However, defects before inspection were relatively rare on the external wall. Finally, defects before inspection occurred during waterproofing in the common area or garage. It is necessary to establish a reasonable basis or countermeasure to resolve differences between stakeholders as various issues may arise in the course of a dispute, as a result of identifying the details of defects within the top 20 of the defectives.

A Study on Inspection Technology of PDP ITO Defect (PDP ITO 결함 검출기술에 관한 연구)

  • 송준엽;박화영;정연욱;김현종
    • Proceedings of the Korean Society of Precision Engineering Conference
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    • 2003.06a
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    • pp.191-195
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    • 2003
  • The formation degree of sustain (ITO pattern) decides quality of PDP (plasma display panel). For this reason. it makes efforts in search defects more than 30 ${\mu}{\textrm}{m}$. Now, the existing inspection process is dependent upon naked eye or SEM equipment in off-line PDP manufacturing process. In this study developed prototype inspection system of PDP ITO glass. This system creates information that detects and sorts kind of defect automatically. Design ed inspection technology adopts line-scan method by slip-beam formation for the minimum of inspection time and image processing algorithm is embodied in detection ability of developed system. Designed algorithm had to make good use of kernel matrix which draws up an approach to geometry. A characteristic of area-shaped defects, as pin hole, substance, protrusion et al, are extracted from blob analysis method. Defects, as open, short, spots, et al, are distinguished by line type inspection algorithm. In experiment results, we could have ensured ability of inspection that can be detected with reliability of up to 95% in about 60 seconds

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Validity Elevation Scheme of Quality Inspection System for Defect Prevention & Management in Apartment Housing Construction (공동주택 하자예방 및 관리를 위한 품질점검제도의 실효성 제고방안 연구)

  • Park, Geun-Soo
    • Proceedings of the Korean Institute of Building Construction Conference
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    • 2020.06a
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    • pp.220-221
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    • 2020
  • Strarting with Buyeong Apartment in Dongtan-2 disrict in 2017, collective complaints of residents are frequently occurring due to low quality problem such as improper construction and defects of apartment houses. Because of this, the Ministry of Land and Transport is preparing a comprehensive improvement scheme to improve the quality of Apartment Housing(AH), taking into account the continuing complaints from the residents of AH and the problem raised by the National Assembly. The basic profile of the improvement scheme is induce the tenants and experts to discover and point out defects that are repaired until the date of use inspection or due date. For this purpose, we suggested this defects management system linkaged by the preliminary inspection and quality inspection system for prospective occupants. In this context, this paper aims to suggest an effective likage method between the preliminary inspection of prospective residents and the quality inspection system implemented by local governments as an ordinance.

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Implementation of Image Processing System for the Defect Inspection of Color Polyethylene (칼라팔레트의 불량 식별을 위한 영상처리 시스템 구현)

  • 김경민;박중조;송명현
    • Journal of the Korea Institute of Information and Communication Engineering
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    • v.5 no.6
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    • pp.1157-1162
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    • 2001
  • This paper deals with inspect algorithm using visual system. One of the major problems that arise during polymer production is the estimation of the noise of the color product.(bad pallets) An erroneous output can cause a lot of losses (production and financial losses). Therefore new methods for real-time inspection of the noise are demanded. For this reason, we have presented a development of vision system algorithm for the defect inspection of PE color pallets. First of all, in order to detect the edge of object, the differential filter is used. And we apply to the labelling algorithm for feature extraction. This algorithm is designed for the defect inspection of pallets. The labelling algorithm permits to separate all of the connected components appearing on the pallets. Labelling the connected regions of a image is a fundamental computation in image analysis and machine vision, with a large number of application. Also, we suggested vision processing program in window environment. Simulations and experimental results demonstrate the performance of the proposal algorithm.

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