1 |
M. Arsenault, J. Bentz, J.-L. Bouchard, D. Cotnoir, S. Verreault and X. Maldague, 'Glass fragments detector for a jar filling process', Canadian Conference on Electrical and Computer Engineering, vol. 2, pp. 759-762, 1992
DOI
|
2 |
J. Caron and L. Duvieubourg, 'Defect detection by recursive filters in packaging industry', Proceedings of 1997 International Conference on Information, Communications and signal Processing, vol.2, pp. 1189-1193, 1997
DOI
|
3 |
P. Geveaux, J. Miteran, S. Kohler, F. Trucheter and E. Renier, 'A lighting characterization by a reliable method. application to defect detection by artificial vision in industrial field', Industrial Electronics Society Proceedings of the 24th Annual Conference of the IEEE, vol. 3, pp.1242-1245, 1998
DOI
|
4 |
H. Chen and L. B. Wolff, 'Polarization phase-based method for material classification and object recognition in computer vision', IEEE Computer Society Conference on Computer Vision and Pattern Recognition, pp. 128-135, 1996
DOI
|
5 |
S. K. Nayar, K. Ikeuchi and T. Kanade, 'Surface reflection: Physical and geometrical perspectives', IEEE Transactions on Pattern Analysis and Machine Intelligence, vol. 13, no. 7, pp. 611-634, 1991
DOI
ScienceOn
|
6 |
E. R. Davies, 'Principles and design graphs for obtaining uniform illumination in automated visual inspection', Sixth International Conference on Image Processing and Its Applications, vol. 1, pp. 161-165, 1997
|
7 |
http://www.illuminationtech.com
|
8 |
M. Katafuchi, M. Sano, S. Ohara and M. Okudira, 'A method for inspecting industrial parts surfaces based on an optics model', Machine Vision and Applications, vol. 12, issue 4, pp. 170-176, 2000
DOI
|
9 |
K. Torrance and E. Sparrow, 'Theory for off-specular reflection from rough surfaces', Journal of the Optical Society of America, vol. 57, pp. 1105-114, 1967
DOI
|