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Aberration Extraction Algorithm for LCD Defect Detection  

Ko, Jung-Hwan (Department of Mechatronics, Inha Technical College)
Lee, Jung-Suk (Department of Mechatronics, Inha Technical College)
Won, Young-Jin (Dept. of Electronic Engineering, Bucheon University)
Publication Information
전자공학회논문지 IE / v.48, no.4, 2011 , pp. 1-6 More about this Journal
Abstract
In this paper we show the LCD simulator for defect inspection using image processing algorithm and neural network. The defect inspection algorithm of the LCD consists of preprocessing, feature extraction and defect classification. Preprocess removes noise from LCD image, using morphology operator and neural network is used for the defect classification. Sample images with scratch, pinhole, and spot from real LCD color filter image are used. From some experiments results, the proposed algorithms show that defect detected and classified in the ratio of 92.3% and 94.5 respectively. Accordingly, in this paper, a possibility of practical implementation of the LCD defect inspection system is finally suggested.
Keywords
LCD; aberration; defect; distortion; thinning;
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Times Cited By KSCI : 4  (Citation Analysis)
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1 Davide Dazzia, Francesco Taddeib, Alessandra Gavarinib, Enzo Uggerib, Roberto Negroa, Antonio Pezzarossaa, "The control of blood glucose in the critical diabetic patient: a neuro-fuzzy method", Journal of Diabetes and Its Complications, vol.15, pp. 813-819, 2001.
2 이용우, 권명회, 김용후, 권명희, "극자외선 영역에서곡면 DOEs에 관한 연구", 한국광학회지, vol, 16, no.4, pp.304-312, 2005.
3 Zhong, Qiyuan, Huang, Xianxiang, Tan, Lilong,Zhang, Zhili, "A method of speedy north-seeking of gyro-theodolite by detecting gyro-moment based on magnetic suspension bearing", 2010 ICICIP , pp.666-670, 2010.
4 ]www.sourcesecurity.com
5 Haruo Yoda, Yozo Ohuchi, Yuzo Taniguchi andMasakzu Ejiri, "An automatic wafer inspection system using pipelined image processing techni ques", IEEE T-PAMI , vol. 10pp. 4-15, 1988.   DOI   ScienceOn
6 오종환, 박길흠, "인간 시각시스템의 주파수 감도를이용한 TFT-LCD 결함 강조", 전자공학회 논문지,제44권, 20-27쪽, 2007년.
7 고민석, 최두현, 박길흠, 김우섭, 송영철, "LCD 표면검사를 위한 라인스캔 영상의 재구성", 전자공학회논문지, 제41권, pp.497-502, 2004.
8 고정환, "BEP기반의 신경회로망을 이용한 LCD 패널결함 검출", 전자공학회 논문지, 제48권, 26-31쪽,2011년.
9 J. R. Parker, "Gray level thresholding in badly illuminated images", IEEE T-PAMI , vol. 13, pp 813-819, 1991.   DOI   ScienceOn
10 F. Torres, J.M. Sebastian, R. Aracil, L.M. Jime nez and O. Reinoso, "Automated real-time visual inspection for high-resolution super imposed printings", Image and vision computing vol. 16, pp. 947-958, 1998.   DOI   ScienceOn
11 J. R. Parker, Practical Computer Vision, Addison-Wesley, 1992.