• Transactions on Electrical and Electronic Materials
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• 제8권4호
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• pp.170-173
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• 2007

Organic field-effect transistors (OFETs) are of interest for use in widely area electronic applications. We fabricated the organic field-effect transistor based a copper phthalocyanine (CuPc) as an active layer on the silicon substrate. The CuPc FET device was made a topcontact type and the substrate temperature was room temperature and $150^{\circ}C$. The CuPc thickness was 40 nm, and the channel length was $50{\mu}m$, channel width was 3 mm. We observed the typical current-voltage (I-V) characteristics and capacitance-voltage (C-V) in CuPc FET and we calculated the effective mobility with each device. Also, we observed the AFM images with different substrate temperature.

• 대한전기학회:학술대회논문집
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• 대한전기학회 1987년도 정기총회 및 창립40주년기념 학술대회 학회본부
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• pp.283-285
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• 1987

Transient conduction current (I - t characteristics) were measured in thin PPMMA (plasma-polymerized methyl methacrylate) films over the temperature range $60^{\circ}C-140^{\circ}C$ and the applied voltage range 3V - 30V. The current, which increased with temperature rise at constant applied voltage, showed less absorption current (current decay with time) at higher temperature region compared with those at lower temperature region. And the current, which increased with applied voltage rise at the constant temperature, showed less absorption current at higher voltage compared with those at lower voltage. The electric field current density characteristic curves were abtained from the conduction current values were after applying voltage for 30 minutes. And transient conduction currents were analyzed with high field conduction theories.

• 전기학회논문지
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• 제61권5호
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• pp.711-716
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• 2012

To assess the insulation deterioration of stator windings, diagnostic and AC breakdown tests were performed on the eleven high voltage (HV) motors rated at 6kV. After completing the diagnostic tests, the AC overvoltage test was performed by gradually increasing the voltage applied to the stator windings until electrical insulation failure occurred, to obtain the breakdown voltage. Stator winding of motors 1, 3, and 8 failed at above rated voltage at 14 kV, 13.8kV, and 16.4kV, respectively. The breakdown voltage of three motors was higher than expected for good quality windings in 6kV motors. Based on deterioration evaluation criteria, the stator winding insulation of eleven HV motors are confirmed to be in good condition. The turning point of the current, $P_{i2}$, in the AC current vs. voltage characteristics occurred between 5kV and 6kV, and the breakdown voltage was low between 13.8kV and 16.4kV. There was a strong correlation between the breakdown voltage and various electrical characteristics in diagnostic tests including Pi2.

• 멤브레인
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• 제17권1호
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• pp.37-43
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• 2007

크로노포텐시오미터(CP)와 전류-전압곡선(I-V)을 사용하여 음/양 이온 교환 층의 영향을 하전 모자이크 막에서 조사하였다. 역시 전해질과 음/양이온의 계면에서 이온수송을 실험하였다. 결과 음/양이온 교환 막은 전류범위에서 점점 전압강하가 나타났고, 특히 저 농도의 KCl 전위는 일정하였다. 한편 복합 하전 모자이크 막은 여러 전해질 수용액의 종류와 농도에 관계없이 전위의 변화는 없었다. CP와 I-V의 측정은 이온교환 막 계면에서 일어나는 이온수송에 대한 기초해석으로 대단히 유효하였다.

• ETRI Journal
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• 제37권1호
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• pp.97-106
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• 2015

In this paper, MOS-triggered silicon-controlled rectifier (SCR)-based electrostatic discharge (ESD) protection circuits for mobile application in 3.3 V I/O and SCR-based ESD protection circuits with floating N+/P+ diffusion regions for inverter and light-emitting diode driver applications in 20 V power clamps were designed. The breakdown voltage is induced by a grounded-gate NMOS (ggNMOS) in the MOS-triggered SCR-based ESD protection circuit for 3.3 V I/O. This lowers the breakdown voltage of the SCR by providing a trigger current to the P-well of the SCR. However, the operation resistance is increased compared to SCR, because additional diffusion regions increase the overall resistance of the protection circuit. To overcome this problem, the number of ggNMOS fingers was increased. The ESD protection circuit for the power clamp application at 20 V had a breakdown voltage of 23 V; the product of a high holding voltage by the N+/P+ floating diffusion region. The trigger voltage was improved by the partial insertion of a P-body to narrow the gap between the trigger and holding voltages. The ESD protection circuits for low- and high-voltage applications were designed using $0.18{\mu}m$ Bipolar-CMOS-DMOS technology, with $100{\mu}m$ width. Electrical characteristics and robustness are analyzed by a transmission line pulse measurement and an ESD pulse generator (ESS-6008).

• 한국정보통신학회논문지
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• 제10권9호
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• pp.1648-1653
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• 2006

이 연구에서는 해석학적 전류-전압 모델을 이용하여 DGMOSFET(Double Gate MOSFET)의 전송특성을 분석하였다. MOSFET의 게이트길이가 100nm이하로 작아지면 산화막두께가 1.5m이하로 작아져야만하고 채널의 도핑이 매우 증가하기 때문에 소자의 문턱전압변화, 누설전류의 증가 등 다양한 문제가 발생하게 된다 이러한 문제를 조사하기 위하여 해석학적 전류-전압 모델을 이용하여 소자의 크기를 변화시키면서 전류-전압특성을 조사하였다 소자의 크기를 변화시키면서 해석학적 전류-전압 모델의 타당성을 조사하였으며 온도 변화에 대한 특성도 비교 분석하였다. 게이트 전압이 2V에서 77K의 전류-전압 특성이 실온에서 보다 우수하다는 것을 알 수 있었다.

• 반도체디스플레이기술학회지
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• 제21권3호
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• pp.130-134
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• 2022

An anti-reflective coating is used to improve the performance of the solar cell. The anti-reflective coating changes the value of the short-circuit current about the thickness. However, the current-voltage characteristics about the anti-reflective coating are difficult to calculate without simulation tool. In this paper, a modeling technique to determine the short-circuit current value and the current-voltage characteristics in accordance with the thickness is proposed. In addition, artificial neural network is used to predict the short-circuit current with the dependence of temperature and thickness. Simulation results incorporating the artificial neural network model are obtained using MATLAB/Simulink and show the current-voltage characteristic according to the thickness of the anti-reflective coating.

• 한국전기전자재료학회논문지
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• 제11권10호
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• pp.871-877
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• 1998

Electroluminescent(EL) devices based on organic materials have been of great interest due to their possible applications for large-area flat-panel displays, where they are attractive because of their capability of multicolor emission, and low operation voltage. In this study, glass substrate/ITO/Eu(TTA)$_3$(phen)/Al, glass substrate/ITO/Eu(TTA)$_3$(phen)/Al and glass substrate/ITO/Eu(TTA)$_3$(phen)/AlQ$_3$/Al structures were fabricated by vacuum evaporation method, where aromatic diamine(TPD) was used as a hole transporting material, Eu(TTA)$_3$(phen) as an emitting material, and Tris(8-hydroxyquinoline) aluminu-m(AlQ$_3$) as an electron transporting layer. Electrolumescent(EL) and I-V characteristics of Eu(TTA)$_3$-(-phen) were investigated. These structures show the red EL spectra, which are almost the same at the PL spectrum of Eu(TTA)$_3$(phen). I-V characteristics of this structure show that turn-on voltage was 9V and current density was 0.01A/㎤ at a operation voltage of 9V. Electrical transporting phenomena of these structures were explained using the trapped-charge-limited current model with I-V characteristics.

• 한국조명전기설비학회:학술대회논문집
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• 한국조명전기설비학회 2007년도 춘계학술대회 논문집
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• pp.291-294
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• 2007

This paper preserts the characteristics of leakage currents flowing through 18 kV zinc oxide (ZnO) surge arrester under the mixed DC and AC voltages. The I-V curves of ZnO surge arrester were measured as a function of the voltage ratio K The I-V curves under the mixed DC and AC voltages lay between the pure DC and AC characteristics, and the cross-over phenomenon in I-V curves was observed at the low current region As a result, the increase of DC component to mixed voltages causes the increase of resistive component of total leakage current th ZnO surge arrester.

• Bulletin of the Korean Chemical Society
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• 제29권5호
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• pp.1048-1050
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• 2008

Electric current flow was observed through imogolite film when imogolite ($(HO)_3Al_2O_3SiOH$) was exposed to water molecules and connected to external electrodes. Current flow was due to the bound water on the surface of imogolite. Current flow increased as the pH of the water decreased. The current-voltage (I-V) measurements from a field effective transistor (FET) using $H_2O$/imogolite film revealed that the current carrier in $H_2O$/ imogolite had p-type characteristics, i.e. the carrier was probably $H^+$. The possible mechanism for current transportation in imogolite/water was also suggested in this paper.