• 한국진공학회:학술대회논문집
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• 한국진공학회 2016년도 제50회 동계 정기학술대회 초록집
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• pp.195.1-195.1
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• 2016

Currently, as Plasma application is expanded to the industrial and medical industrial, low temperature plasma applications became important. Especially in medical and biology, many researchers have studied about generated radical species in atmospheric pressure low temperature plasma directly adapted to human body. Therefore, so measurement their plasma parameter is very important work and is widely studied all around world. One of the plasma parameters is electron density and it is closely relative to radical production through the plasma source. some kinds of method to measuring the electron density are Thomson scattering spectroscopy and Millimeter-wave transmission measurement. But most methods have very expensive cost and complex configuration to composed of experiment system. We selected Michelson interferometer system which is very cheap and simple to setting up, so we tried to measuring electron density by laser interferometer with laser beam chopping module for measurement of temporal phase difference in plasma jet. To measuring electron density at atmospheric pressure Ar plasma jet, we obtained the temporal phase shift signal of interferometer. Phase difference of interferometer can occur because of change by refractive index of electron density in plasma jet. The electron density was able to estimate with this phase difference values by using physical formula about refractive index change of external electromagnetic wave in plasma. Our guiding laser used Helium-Neon laser of the centered wavelength of 632 nm. We installed chopper module which can make a 4kHz pulse laser signal at the laser front side. In this experiment, we obtained more exact synchronized phase difference between with and without plasma jet than reported data at last year. Especially, we found the phase difference between time range of discharge current. Electron density is changed from Townsend discharge's electron bombardment, so we observed the phase difference phenomenon and calculated the temporal electron density by using phase shift. In our result, we suggest that the electron density have approximately range between 1014~ 1015 cm-3 in atmospheric pressure Ar plasma jet.

• 한국광학회지
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• 제14권1호
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• pp.1-7
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• 2003

유기발광물질 Alq$_3$ 복소굴절률을 양자역학적 흡수이론인 바탕인 포로히-블루머(Forouhi-Bloomer) 분산식[Phys. Rev. B 34. 7018(1986)]을 이용하여 1.5~6 ev의 영역에서 계산하였다. 분광광도계를 이용하여 측정한 Alq$_3$ 박막의 흡수 스펙트럼에서 흡수 피크의 위치와 폭으로부터 포로히-블루머 분산식의 변수 $A_{i}$ , B$_{i}$, $C_{i}$ 의 초기 근사값을 결정하였다. 기판으로 사용한 비정질실리카(fused silica)의 굴절률은 분광광도계로부터 측정된 투과율과 반사율 스펙트럼으로부터 셀마이어(Sellmeier)분산식을 적용하여 계산하였다. 기판의 굴절률과 분광광토계에서 측정한 Alq$_3$박막의 투과율과 반사율 스펙트럼에 포로히-블루머 분산식을 이용한 비선형 최소자승법 곡선맞춤을 하여 Alq$_3$의 복소굴절률을 계산할 수 있었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2010년도 하계학술대회 논문집
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• pp.198-198
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• 2010

The low-k SiOCH thin films were prepared by CCP-PECVD method using BTMSM(Bis-trimethylsilylmethane) precursors deposited on p-Si wafer. The structural complexity originate the complex refractive constants of the films, and resulted the elliptical polarization of the incident linearly polarized light source of Xe-ramp in the range from 190nm to 2100nm. Phase difference and amplitude ratio between s wave and p wave propagating through SiOCH thin film was studied. After annealing, the amplitude of p wave was reduced more than s wave, and phase difference between p and s wave was also reduced.

• 한국광학회:학술대회논문집
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• 한국광학회 2000년도 제11회 정기총회 및 00년 동계학술발표회 논문집
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• pp.156-157
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• 2000

The amplification method using evanescent wave coupling has a long history and has been widely used as a new lasing method, especially, in the waveguide optics$^{(1)}$ . In particular, it has been observed experimentally that when the light wave propagating in a dielectric medium is totally reflected at the planar interface between the dielectric and a pumped active medium, the reflectance may be greater than unity, i.e., amplification is possible$^{(2)}$ . There were several attempts by other authors to explain this enhanced internal reflection (EIR) classically$^{(3)}$ . They commonly introduced a complex refractive index for the active medium with its imaginary part being negative, and this scheme was also used to describe an amplification process in a waveguide having active-cladding region$^{(4)}$ . However these theories are phenomenological, using macroscopic constants, and therefore a microscopic theory is needed to understand EIR in a fundamental level. (omitted)

• 분석과학
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• 제8권4호
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• pp.457-460
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• 1995

A new hollow fiber filled with the lower refractive index liquid as core constructs a liquid core optical fiber(LCOF). The LCOF have been used as colorimetric cell to determine elements Cr and Cu in the presence of 70%- 50% ethanol or 50% dioxane aqueous solution, based on colored complex of Chromium(VI) with Diphenycarbazid(DPC) and copper with Chromaurd S(CAS) respectively. The sensitivity (1/ng/ml) of calibration curve of Cr and Cu are 0.052, 0.017 over the range 0 - 25, 0 - 24(ng/ml) respectively. The Cr in the animal gum and Nation Standard of China are determined with recoveries of 94 - 102%.

• International Journal of Air-Conditioning and Refrigeration
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• 제8권2호
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• pp.11-22
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• 2000

Holographic interferometric tomography can provide reconstruction of instantaneous three-dimensional gross flow fields. The technique however confronts ill-posed reconstruction problems in practical applications. Experimental data are usually limited in projection and angular scanning when a field is captured instantaneously or under the obstruction of test models and test section enclosures. An algorithm, based on a series expansion method, has been developed to improve the reconstruction under the ill-posed conditions. A three-dimensional natural convection flow around two interacting isothermal cubes is experimentally investigated. The flow can provide a challenging reconstruction problem and lend itself to accurate numerical solution for comparison. The refractive index fields at two horizontal sections of the thermal plume with and without an opaque object are reconstructed at a limited view angle of 80$\circ$. The experimental reconstructions are then compared with those from numerical calculation and thermocouple thermometry. It confirms that the technique is applicable to reconstruction of reasonably complex, three-dimensional flow fields.

• 대한전기학회논문지:전기물성ㆍ응용부문C
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• 제55권5호
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• pp.272-277
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• 2006

The present study is devoted to investigate numerically the optical characteristics of multi-layer thin film structures such as $Si/SiO_2\;and\;Ge/Si/SiO_2$ by using the characteristics transmission matrix method. The reflectivity and the absorptivity rate for thin film structures are estimated for different incident angles of rays and various film thicknesses. In addition, the influence of wavelength on optical characteristics related to complex refractive index is examined. It is found that such wave-like characteristics are observed in predicting reflectivities and depends mainly on film thickness. Moreover, the present study predicts the film thickness for ignoring wave interference effects, and it also discusses the fundamental physics behind optical and energy absorption characteristics appearing in multi-layer thin film structures.

• Bulletin of the Korean Chemical Society
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• 제16권3호
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• pp.214-216
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• 1995

Passive films formed on chromium surface in citrate buffer solution were investigated by means of three-parameter ellipsometry. The citrate buffer was found to be a suitable medium in which oxide film on chromium could be removed by cathodic treatment, providing a reference surface for the optical study. The passive film effectively protecting the chromium surface from corrosion was found to have thicknesses in the range 0.65 to 1.25 nm depending on the potential in the range of -0.20 to 0.60 V (0.1M KCl calomel electrode). The complex refractive index of the passive film did not show significant potential-dependent changes, indicating that the composition of the film material does not depend on potential.

• 한국전기전자재료학회논문지
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• 제23권3호
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• pp.228-233
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• 2010

We studied the optical characteristics correlated with low dielectric constants of low-k SiOCH thin films through ellipsometry. The low-k SiOCH thin films were prepared by CCP-PECVD method using BTMSM(Bis-trimethylsilylmethane) precursors deposited on p-Si wafer. The Si-O-CHx, Si-O-Si, Si-CHx, CHx and Si-H bonding groups were specified by FTIR spectroscopic spectra, and the groups coupled with the nano-porous structural organic/inorganic hybrid-type of SiOCH thin films which has extremely low dielectric constant close to 2.0. The structural groups includes highly dense pore as well as ions in SiOCH thin films affecting to complex refraction characteristics of single layer on the p-Si wafer. The structural complexity originate the complex refractive constants of the films, and resulted the elliptical polarization of the incident linearly polarized light source of Xe-light source in the range from 190 nm to 2100 nm. Phase difference and amplitude ratio between s wave and p wave propagating through SiOCH thin film was studied. After annealing, the amplitude of p wave was reduced more than s wave, and phase difference between p and s wave was also reduced.

• 한국분말재료학회지
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• 제26권6호
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• pp.487-492
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• 2019

Titanium dioxide (TiO₂) is a typical inorganic material that has an excellent photocatalytic property and a high refractive index. It is used in water/air purifiers, solar cells, white pigments, refractory materials, semiconductors, etc.; its demand is continuously increasing. In this study, anatase and rutile phase titanium dioxide is prepared using hydroxyl and carboxyl; the titanium complex and its mechanism are investigated. As a result of analyzing the phase transition characteristics by a heat treatment temperature using a titanium complex having a hydroxyl group and a carboxyl group, it is confirmed that the material properties were different from each other and that the anatase and rutile phase contents can be controlled. The titanium complexes prepared in this study show different characteristics from the titania-formation temperatures of the known anatase and rutile phases. It is inferred that this is due to the change of electrostatic adsorption behavior due to the complexing function of the oxygen sharing point, which crystals of the TiO₆ structure share.