• Proceedings of the Korean Society of Broadcast Engineers Conference
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• 2014.11a
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• pp.10-11
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• 2014

In a 2-dimensional (2D) Discrete Cosine Transform (DCT) hardware, a significant fraction of the total hardware area is contributed by the combinational logic used to perform 1-dimensional (2D) transform. The size of the non-combinational logic i.e. the transpose memory is dictated by the size of the largest transform supported. Hence, the optimization of hardware area is performed mainly for 1D-transform combinational logic. This paper demonstrates the use of Multiple Constant Multiplication (MCM) algorithm to reduce the combinational logic area. Partial optimizations are also described for the cases where the direct use of MCM algorithm doesn't meet the timing constraint. Experimental results show that 46% improvement in gate count is achieved for 32 point 1D DCT transform logic after using MCM optimization.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.35C no.4
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• pp.1-10
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• 1998

Partitioning problem of large combinational logic has been studied in real world. Most of logic include undectable faults from the structure of it's redundant, fan-out-reconvergent, and symetrical feature. BPT algorithm is proposed to enhance the fault voverage for combinational logic partitioning. This algorithm partitions the logic by cut the lines related to undetectable structure when seperating. Controllability and observability are considered in the process of partitioning. This algorithm is evaluated effective by testing ISCAS85 circuits.

• Journal of the Korean Institute of Telematics and Electronics
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• v.13 no.3
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• pp.1-6
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• 1976

In this paper, a method of test pattern generation for the functional failure in both combinational and sequentlal logic networks by using exterded Boole an difference is proposed. The proposed technique provides a systematic approach for the test pattern generation procedure by computing Boolean difference of the Boolean function that represents the Logic network for which the test patterns are to be generated. The computer experimental results show that the proposed method is suitable for both combinational and asynchronous sequential logic networks. Suitable models of clocked flip flops may make it possible for one to extend this method to synchronous sequential logic networks.

• The Journal of Korean Institute of Communications and Information Sciences
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• v.14 no.5
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• pp.503-510
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• 1989

This paper represents a method which construct Combinational Mutiple Valued Logic circuits. First, it constructs Combinational Multiple Valued Logic Cell as the input variable, Then, it can be applied to the general case by expanding ti, thus these series of process is simple and regular. The construction theory of Combinational Multiple Valued Logic circuits, representes here has regularity, simplicity and modularity, especially, in case imput variables are incresed this theory also has characteristics of expansion.

• Journal of the Korean Institute of Telematics and Electronics C
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• v.34C no.11
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• pp.12-19
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• 1997

In this paper, we present a logic synthesis algorithm for low powr design fo combinational circuits. The proposed algorithm reduces power dissipation by eliminating unnecessary signal transitions. The proposed algorithm restructures a given circuit by using a kernel as prediction logic in a precomputation-based scheme such that switching activity of circuit can be minimized. Experimental results show that the system is efficient for low power design of combinational circuits.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.30A no.9
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• pp.71-79
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• 1993

This paper proposes a new test pattern generation methodology for combinational logic circuits using neural networks based on a modular structure. The CUT (Circuit Under Test) is described in our gate level hardware description language. By conferring neural database, the CUT is compiled to an ATPG (Automatic Test Pattern Generation) neural network. Each logic gate in CUT is represented as a discrete Hopfield network. Such a neual network is called a gate module in this paper. All the gate modules for a CUT form an ATPG neural network by connecting each module through message passing paths by which the states of modules are transferred to their adjacent modules. A fault is injected by setting the activation values of some neurons at given values and by invalidating connections between some gate modules. A test pattern for an injected fault is obtained when all gate modules in the ATPG neural network are stabilized through evolution and mutual interactions. The proposed methodology is efficient for test generation, known to be NP-complete, through its massive paralelism. Some results on combinational logic circuits confirm the feasibility of the proposed methodology.

• Journal of the Korea Institute of Information and Communication Engineering
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• v.9 no.6
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• pp.1288-1293
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• 2005

This paper presents a design method for multiple-output combinational digital logic systems using time domain based on multiplexing(TDBM) and common multi-terminal extension decision diagrams(CMTEDD). The CMIEDDs represents extension valued multiple-output functions, while TDBM systems transmit several signals on a single lines. The proposed method can reduce the 1)hardware, 2)logic levels and 3)pins. In the logic system design, we use two types of decision diagrams(DDs), that is the common binary decision diagrams(CBDDs) and CMTEDDs. Also, we propose an algorithms to derive common multiple-terminal binary decision diagrams(CMTBDD) from CBDDs, and CMTEDDs from CMTBDDs. The CMTEDDs over CBDDs is more compactness in terms of number of non-terminal nodes, where the nodes for output selection variables are not included in the non-terminal nodes. In the logic design, each non-terminal nodes of an CBDDs and an CMTEDDs is realized by a multiplexer(MUX). In addition, we compare the proposed TDBM realization with the conventional one.

• The Transactions of the Korea Information Processing Society
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• v.3 no.3
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• pp.564-571
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• 1996

The logic synthesis systems for table look up(TLU) type field programmable e gate arrays(FPGAs) have so farstudied mostly the combinational logic problem m. This paper presents for mapping a sequential circuit onto a popular table look up architecture, theXilinx 3090 architecture. In thefirst for solving this problem, combinational and sequential elements which have 6 or7 input combinational and sequential elements which haveless thanor equal to 5 inputs. We heavily use the combinational synthesis techniques tosolve the sequential synthesis problem. Our syntheisis approach is very simple, but its results are reasonable. We compare seveal benchmark Examples with sis-pga(map_together and map_separate) synthesis system and the experimental results show that our synthesis system is 17% betterthan sis-pga sequential synthesis system for TLU PGAs.

• Journal of the Korean Institute of Telematics and Electronics
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• v.14 no.6
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• pp.10-15
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• 1977

This paper proposes a simple and systematic method for the generation of the fault detection test sets for the combinational logic networks. Based on tile path sensitizing concept, the test patterns for the primary input gates of the network are defined, and then it is shown that, arranging these predefined test patterns according to the path sensitizing characteristics of the given network sturctures, the minimal complete test sets for the fan-out free combinational networks can be found easily. It is also shown that, taking into account the fan-out paths sensitizing compatibility, the proposed method can be extended to the irredundant reconvergent fan-out networks.

• Journal of the Korean Institute of Telematics and Electronics A
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• v.31A no.4
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• pp.106-115
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• 1994

This paper presents the design of a technology mapping system for optimizing delays of combinational and synchronous sequential logic circuits. The proposed system performs delay optimization for combinational logic circuits by remapping, buffering, and gate merging methods through the correct delay calculation in which the loading values are considered. To get time optimized synchronous sequential circuits, heuristic algorithms are proposed. The proposed algorithms reallocate registers by considering the critical path characteristics. Experimental results show that the proposed system produces a more optimized technology mapping for MCNC benchmarks compared with mis-II.