Test pattern Generation for the Functional Test of Logic Networks

논리회로 기능검사를 위한 입력신호 산출

In this paper, a method of test pattern generation for the functional failure in both combinational and sequentlal logic networks by using exterded Boole an difference is proposed. The proposed technique provides a systematic approach for the test pattern generation procedure by computing Boolean difference of the Boolean function that represents the Logic network for which the test patterns are to be generated. The computer experimental results show that the proposed method is suitable for both combinational and asynchronous sequential logic networks. Suitable models of clocked flip flops may make it possible for one to extend this method to synchronous sequential logic networks.

이 논문에서는 Boolean difference를 이용하여 combinational 및 sequential 논리회로에서 발생하는 기능적인 고장에 대한 test pattern을 얻는 방법을 연구하였다. 이 방법은 test pattern을 얻고자 하는 회로의 Boolean 함수의 Boolean difference를 계산하므로써 체계적으로 test pattern을 얻는 절차를 보여주고 있다. 컴퓨터에 의한 실험결과에 의하며 이 방법은 combinational 회로 및 asynchronous sequential 회로에 적합하며, clock이 있는 flip flop을 적당히 모형화함으로서 이 방법을 synchronous sequential회로에도 적용할 수 있음이 입증되었다. In this paper, a method of test pattern generation for the functional failure in both combinational and sequentlal logic networks by using exterded Boole an difference is proposed. The proposed technique provides a systematic approach for the test pattern generation procedure by computing Boolean difference of the Boolean function that represents the Logic network for which the test patterns are to be generated. The computer experimental results show that the proposed method is suitable for both combinational and asynchronous sequential logic networks. Suitable models of clocked flip flops may make it possible for one to extend this method to synchronous sequential logic networks.