• Title/Summary/Keyword: coincidence and fixed points

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COUPLED COMMON FIXED POINT THEOREMS FOR A CONTRACTIVE CONDITION OF RATIONAL TYPE IN ORDERED METRIC SPACES

  • Chandok, Sumit
    • Journal of applied mathematics & informatics
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    • v.31 no.5_6
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    • pp.643-649
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    • 2013
  • The purpose of this paper is to establish some coupled coincidence point theorems for a pair of mappings having a strict mixed g-monotone property satisfying a contractive condition of rational type in the framework of partially ordered metric spaces. Also, we present a result on the existence and uniqueness of coupled common fixed points. The results presented in the paper generalize and extend several well-known results in the literature.

UNIFYING A MULTITUDE OF COMMON FIXED POINT THEOREMS EMPLOYING AN IMPLICIT RELATION

  • Ali, Javid;Imdad, Mohammad
    • Communications of the Korean Mathematical Society
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    • v.24 no.1
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    • pp.41-55
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    • 2009
  • A general common fixed point theorem for two pairs of weakly compatible mappings using an implicit function is proved without any continuity requirement which generalizes the result due to Popa [20, Theorem 3]. In process, several previously known results due to Fisher, Kannan, Jeong and Rhoades, Imdad and Ali, Imdad and Khan, Khan, Shahzad and others are derived as special cases. Some related results and illustrative examples are also discussed. As an application of our main result, we prove an existence theorem for the solution of simultaneous Hammerstein type integral equations.

COMMON FIXED POINT THEOREMS FOR TWO MAPPINGS WITH ψ-ϕ-CONTRACTIVE OR EXPANSIVE TYPE CONDITIONS ON COMPLEX-VALUED METRIC SPACES

  • JIN, HAI-LAN;PIAO, YONG-JIE
    • Journal of the Chungcheong Mathematical Society
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    • v.28 no.3
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    • pp.451-463
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    • 2015
  • A continuous and non-decreasing function ${\psi}$ and another continuous function ${\phi}$ with ${\phi}(z)=0{\Leftrightarrow}z=0$ defined on $\mathbb{C}^+=\{x+yi:x,y{\geq}0\}$ are introduced, the ${\psi}-{\phi}$-contractive or expansive type conditions are considered, and the existence theorems of common fixed points for two mappings defined on a complex valued metric space are obtained. Also, Banach contraction principle and a fixed point theorem for a I-expansive type mapping are given on complex valued metric spaces.

A Model for Detection and Refinement of Fixed Bending Regions for Improving the Degree of Thickness Uniformity in Rolled Film Manufacturing (롤 형상 필름 생산에서 두께평활도 개선을 위한 고정굴곡부 발현 모형 및 개선 모델)

  • Bae, Jae-Ho
    • Journal of Korean Society of Industrial and Systems Engineering
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    • v.38 no.3
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    • pp.21-28
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    • 2015
  • As film products are increasingly used in a wide range of areas, from producing traditional flexible packaging to high-tech electronic products, a higher level of quality is demanded. Most film products are made in the form of rolled finished goods, therefore, various quality issues related to their shape characteristics must be addressed. The thickness of the film products is one of the most common and important critical-to-quality attributes (CTQs). Particularly, the degree of thickness uniformity is more important than other thickness parameters, because it will be potential causes of many secondary thickness-related quality problems, such as wrinkles or faulty windings. To control the degree of thickness uniformity, the fixed bending region is oneof the most important CTQs to manage. Fixed bending regions are special points in the transverse direction of a rolled product with consistent minute variations of the thickness gap. This paper describes the measurement and analysis of thickness uniformity data, which were performed in a real manufacturing field of biaxial oriented polypropylene (BOPP) film. In previous researches, quality function deployment (QFD) or fault tree analysis were used to find the most critical process attributes out to controlthe CTQ of thickness uniformity. Whereas, this paper uses traditional control charts to find the most critical process attributes out in this problem. In addition, the selection of one of the major critical process attributes (CTPs) that is expected to affect the CTQ of thickness uniformity is also described. The selected critical-to-process attributes are the controlled temperatures along the transverse direction. A dramatic improvement in thickness uniformity was observed when the selected CTPs were controlled.