• Title/Summary/Keyword: bonding performance

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Computer-Aided Alloy Design of Insert Metal for Transient Liquid Phase Bonding of High Aluminum Ni-base Superalloys

  • Nishimotd, Kazutoshi;Saida, Kazuyoshi
    • Proceedings of the KWS Conference
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    • 2002.10a
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    • pp.803-808
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    • 2002
  • A computer-aided alloy-designing technique to develop the insert metal for transient liquid phase (TLP) bonding was applied to high aluminum Ni-base superalloys. The main procedure of a mathematical programming method was to obtain the optimal chemical composition through rationally compromising the plural objective performances of insert metal by a grid-search which involved data estimation from the limited experimental data using interpolation method. The objective function Z which was introduced as an index of bonding performance of insert metal involved the melting point, hardness (strength), formability of brittle phases and void ratio (bonding defects) in bond layer as the evaluating factors. The contour maps of objective function Z were also obtained applying the interpolation method. The compositions of Ni-3.0%Cr-4.0%B-0.5%Ce (for ${\gamma}$/${\gamma}$/${\beta}$ type alloy) and Ni3.5%Cr-3.5%B-3%Ti (for ${\gamma}$/${\gamma}$ type alloy) which optimized the objective function were determined as insert metal. SEM observations revealed that the microstructure in bond layers using the newly developed insert metals indicated quite sound morphologies without forming microconstituents and voids. The creep rupture properties of both joints were much improved compared to a commercial insert metal of MBF-80 (Ni-15.5%Cr-3.7%B), and were fairly comparable to those of base metals.

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Fabrication and Challenges of Cu-to-Cu Wafer Bonding

  • Kang, Sung-Geun;Lee, Ji-Eun;Kim, Eun-Sol;Lim, Na-Eun;Kim, Soo-Hyung;Kim, Sung-Dong;Kim, Sarah Eun-Kyung
    • Journal of the Microelectronics and Packaging Society
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    • v.19 no.2
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    • pp.29-33
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    • 2012
  • The demand for 3D wafer level integration has been increasing significantly. Although many technical challenges of wafer stacking are still remaining, wafer stacking is a key technology for 3D integration due to a high volume manufacturing, smaller package size, low cost, and no need for known good die. Among several new process techniques Cu-to-Cu wafer bonding is the key process to be optimized for the high density and high performance IC manufacturing. In this study two main challenges for Cu-to-Cu wafer bonding were evaluated: misalignment and bond quality of bonded wafers. It is demonstrated that the misalignment in a bonded wafer was mainly due to a physical movement of spacer removal step and the bond quality was significantly dependent on Cu bump dishing and oxide erosion by Cu CMP.

Anodic bonding characteristics of MCA to Si-wafer using pyrex #7740 glass intermediatelayer for MEMS applications (파일렉스 #7740 글라스 매개층을 이용한 MEMS용 MCA와 Si기판의 양극접합 특성)

  • Ahn, Jung-Hac;Chung, Gwiy-Sang
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2006.06a
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    • pp.374-375
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    • 2006
  • This paper describes anodic bonding characteristics of MCA to Si-wafer using evaporated Pyrex #7740 glass thin-films for MEMS applications. Pyrex #7740 glass thin-films with the same properties were deposited on MCA under optimum RF sputter conditions (Ar 100 %, input power $1\;W/cm^2$). After annealing at $450^{\circ}C$ for 1 hr, the anodic bonding of MCA to Si-wafer was successfully performed at 600 V, $400^{\circ}C$ in $110^{-6}$ Torr vacuum condition. Then, the MCA/Si bonded interface and fabricated Si diaphragm deflection characteristics were analyzed through the actuation and simulation test. It is possible to control with accurate deflection of Si diaphragm according to its geometries and its maximum non-linearity being 0.05-0.08 %FS. Moreover, any damages or separation of MCNSi bonded interfaces did not occur during actuation test. Therefore, it is expected that anodic bonding technology of MCNSi-wafers could be usefully applied for the fabrication process of high-performance piezoelectric MEMS devices.

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Evaluation of Bonding Performance in UHPC-based Concrete Repair Materials Considering Surface of Structure Subject to Repair (보수대상 구조 표면 상태를 고려한 UHPC 기반 콘크리트 보수재료의 부착 성능 평가)

  • Yong-Sik Yoon;Kyong-Chul Kim;Kwang-Mo Lim;Gi-Hong An;Gum-Sung Ryu;Kyung-Taek Koh
    • Journal of the Korean Recycled Construction Resources Institute
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    • v.11 no.4
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    • pp.433-439
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    • 2023
  • In this study, the bonding performance of repair materials was evaluated on concrete repair surface to develop concrete repair materials based on UHPC (Ultra High Performance Concrete) which has high mechanical and durability performance. The ten test variables were applied considering the roughness and wet condition of the concrete surface subject to repair, the addition of polymer, and the use PP and PVA fibers in repair materials. The addition of the polymer caused a significant decrease in strength, which was thought to be due to the effect of the additional super plasticizer used to adjust workability. Also, flow was reduced by up to 13.8 % with the use of plastic-based fibers. As a result of evaluating the bond strength of the repair material considering the condition of the surface subject to repair, it was thought that in the case of using UHPC-based repair material, high bonding performance could be secured without any additional surface treatment as long as the surface of the base material was sound. In addition, UHPC-based repair materials showed high bonding performance even when the attachment surface was wet. In the future, research will be conducted on shot-crete application and gradient pouring for the development of UHPC-based repair materials, and continuous improvement in the repair material mixing property will be carried out to ensure economic efficiency and performance as a concrete structural repair material.

Utilizing Channel Bonding-based M-n and Interval Cache on a Distributed VOD Server (효율적인 분산 VOD 서버를 위한 Channel Bonding 기반 M-VIA 및 인터벌 캐쉬의 활용)

  • Chung, Sang-Hwa;Oh, Soo-Cheol;Yoon, Won-Ju;kim, Hyun-Pil;Choi, Young-In
    • The KIPS Transactions:PartA
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    • v.12A no.7 s.97
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    • pp.627-636
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    • 2005
  • This paper presents a PC cluster-based distributed video on demand (VOD) server that minimizes the load of the interconnection network by adopting channel bonding-based MVIA and the interval cache algorithm Video data is distributed to the disks of each server node of the distributed VOD server and each server node receives the data through the interconnection network and sends it to clients. The load of the interconnection network increases because of the large volume of video data transferred. We adopt two techniques to reduce the load of the interconnection network. First, an Msupporting channel bonding technique is adopted for the interconnection network. n which is a user-level communication protocol that reduces the overhead of the TCP/IP protocol in cluster systems, minimizes the time spent in communicating. We increase the bandwidth of the interconnection network using the channel bonding technique with MThe channel bonding technique expands the bandwidth by sending data concurrently through multiple network cards. Second, the interval cache reduces traffic on the interconnection network by caching the video data transferred from the remote disks in main memory Experiments using the distributed VOD server of this paper showed a maximum performance improvement of $30\%$ compared with a distributed VOD server without channel bonding-based MVIA and the interval cache, when used with a four-node PC cluster.

The Polymer Bonding for Low-temperature Cu Hybrid Bonding (저온 Cu 하이브리드 본딩을 위한 폴리머 본딩)

  • Ji Hun Kim;Jong Kyung Park
    • Journal of the Microelectronics and Packaging Society
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    • v.31 no.3
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    • pp.1-9
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    • 2024
  • This paper addresses the significance of Cu/Polymer Hybrid Bonding technology in the advancement of semiconductor packaging. As the demands of the AI era increase, the semiconductor industry is exploring heterogeneous integration packaging technologies to achieve high I/O counts, low power consumption, efficient heat dissipation, multifunctionality, and miniaturization. The conventional Cu/SiO2 Hybrid Bonding structure faces limitations such as achieving compatibility with CMP processes to attain surface roughness below 1nm and the occurrence of bonding defects due to particles. However, Cu/Polymer Hybrid Bonding technology, utilizing polymers, is gaining attention as a promising alternative to overcome these challenges. This study focuses on the deposition, patterning, and material properties of polymers essential for Cu/Polymer Hybrid Bonding, highlighting the advantages and potential applications of this technology compared to existing methods. Specifically, the use of polymers with low glass transition temperatures (Tg) is discussed for their benefits in low-temperature bonding processes and improved mechanical properties due to their high coefficients of thermal expansion. Furthermore, the study explores surface property modifications of polymers and the enhancement of bonding mechanisms through plasma treatment. This research emphasizes that Cu/Polymer Hybrid Bonding technology can serve as a critical breakthrough in developing high-performance, low-power semiconductor devices within the industry.

High performance epoxy nanocomposites with amine-functionalized graphenes

  • Park, Sol-Mon;Kim, Dae-Su
    • Proceedings of the KAIS Fall Conference
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    • 2010.11a
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    • pp.470-473
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    • 2010
  • Graphene, consisting of a single layer of carbon in a two-dimensional lattice, has been emerging as a fascinating material with many unique physical, chemical and mechanical properties. In this study, graphenes were prepared by a chemical method. To develop high performance polymer nanocomposites reinforced by graphenes, adequate dispersion of the fillers and strong interfacial bonding between the fillers and the polymer matrix are essential. The purpose of this study was to examine the influence of introducing amine groups on the surfaces of graphenes. FT-IR spectroscopy, SEM were used to confirm the functionalization. Epoxy nanocomposites comprising the graphenes were prepared and their characteristics were investigated by DSC, DMA and TMA. Fracture surfaces of the nanocomposites were investigated by SEM. The functionalized graphenes induced strong interfacial bonding than the pristine graphenes and resulted in considerable improvements in the performance of the nanocomposites.

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Impact Fracture Properties of Amorphous Metallic Fiber Reinforced Cementitious Composite by Fiber Length (섬유길이에 따른 비정질 강섬유 보강 시멘트 복합체의 충격파괴특성)

  • Lee, Sang-Kyu;Kim, Gyu-Yong;Hwang, Eui-Chul;Son, Min-Jae;Pyeon, Su-Jeong;Nam, Jeong-Soo
    • Proceedings of the Korean Institute of Building Construction Conference
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    • 2019.05a
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    • pp.65-66
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    • 2019
  • In this study, flexural strength and impact resistance were evaluated to investigate the fiber length effect of amorphous metallic fiber. As a result, in the case of 30AFRCC, cutoff behavior due to excellent bonding performance by large specific surface area has greatly influence on the flexural and impact resistance performance. In the case of 15AFRCC, the bonding efficiency is relatively low, because the specific surface area is smaller than that of 30AFRCC and the number of fiber is large, so the effect of improving the flexural and impact resistance performance is smaller than that of 30AFRCC.

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Performance of Epoxy Resins for Repairing of Cracks in Concrete with Application Conditions (콘크리트 균열 보수용 에폭시의 시공조건에 따른 성능)

  • Lee, Chan-Young;Shim, Jae-Won;Kim, Hong-Bae
    • Proceedings of the Korea Concrete Institute Conference
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    • 2004.11a
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    • pp.813-816
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    • 2004
  • This study was performed to investigate bonding performance of epoxy resins for repairing of cracks in concrete, as a part of project to establish quality control standard for epoxy resins. In the slant shear strength test for hard and soft type epoxy, hard type was higher about 3 times than soft one. From the results, it is thought that hard type is suitable for load carrying. Injection of epoxy resin in the notch made flexural strength increase about $47\%$ over the specimen that epoxy resin is not injected. There were no differences in bonding performances with viscosity. Application of epoxy resin on the wet concrete surface made slant shear strength decrease about $46\%$, but similar performance to the case of application on the dry surface appeared by using epoxy resin for wet condition.

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Lateral Structure Transistor by Silicon Direct Bonding Technology (실리콘 직접접합 기술을 이용한 횡방향 구조 트랜지스터)

  • 이정환;서희돈
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2000.07a
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    • pp.759-762
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    • 2000
  • Present transistors which have vertical structure show increased parasitic capacitance characteristics in accordance with the increase of non-active base area and collector area, consequently have disadvantage for high speed switching performance. In this paper, a horizontal structure transistor which has minimized parasitic capacitance in virtue of SDB(Silicon Direct Bonding) wafer and oxide sidewall isolation utilizing silicon trench technology is presented. Its structural characteristics were designed by ATHENA(SUPREM4), the process simulator from SILVACO International, and its performance was proven by ATLAS, the device simulator from SILVACO International. The performance of the proposed horizontal structure transistor was certified through the VCE-lC characteristics curve, $h_{FE}$ -IC characteristics, and GP-plot.

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