• The Transactions of The Korean Institute of Electrical Engineers
• /
• v.56 no.12
• /
• pp.2217-2220
• /
• 2007

In this paper, we propose a new wafer level package (WLP) for the RF MEMS applications. The Film Bulk Acoustic Resonator (FBAR) are fabricated and hermetically packaged in a new wafer level packaging process. With the use of Au-Sn eutectic bonding method, we bonded glass cap and FBAR device wafer which has groove-shaped via formed in the backside. The device wafer includes a electrical bonding pad and groove-shaped via for connecting to the external bonding pad on the device wafer backside and a peripheral pad placed around the perimeter of the device for bonding the glass wafer and device wafer. The glass cap prevents the device from being exposed and ensures excellent mechanical and environmental protection. The frequency characteristics show that the change of bandwidth and frequency shift before and after bonding is less than 0.5 MHz. Two packaged devices, Tx and Rx filters, are attached to a printed circuit board, wire bonded, and encapsulated in plastic to form the duplexer. We have designed and built a low-cost, high performance, duplexer based on the FBARs and presented the results of performance and reliability test.

• Journal of Welding and Joining
• /
• v.31 no.6
• /
• pp.77-83
• /
• 2013

3D packaging technology using TSV (Through Silicon Via)has been studied in the recent years to achieve higher performance, lower power consumption and smaller package size because electrical line is shorter electrical resistivity than any other packaging technology. To stack TSV chips vertically, reliable and robust bonding technology is required because mechanical stress and thermal stress cause fracture during the bonding process. Cu pillar/solder ${\mu}$-bump bonding process is usually to interconnect TSV chips vertically although it has weak shape to mechanical stress and thermal stress. In this study, we suggest Insert-Bump (ISB) bonding process newly to stack TSV chips. Through experiments, we tried to find optimal bonding conditions such as bonding temperature and bonding pressure. After ISB bonding, we observed microstructure of bump joint by SEM and then evaluated properties of bump joint by die shear test.

• Transactions of the Korean Society of Mechanical Engineers B
• /
• v.33 no.1
• /
• pp.53-59
• /
• 2009

The objectives of this paper are to study the characteristics of heat transfer and pressure drop of the micro channel heat exchangers using diffusion bonding technology. Four types of heat exchangers are designed and manufactured, which are straight type, long dot type, splited wavy type and straight double side type. Heat transfer and pressure drop performance of each heat exchangers are measured in various operating conditions, and compared each other. The results show that the $(j/f)^{1/3}$ performance of splited wavy type and long dot type increases about 10.3% and 6.1% at the Reynolds number 470 compared to that of straight type, respectively. On the other hand, $(j/f)^{1/3}$ performance of straight double side type decreases 19.7%.

• Proceedings of the KSME Conference
• /
• 2008.11b
• /
• pp.2304-2309
• /
• 2008

The objectives of this paper are to study the characteristics of heat transfer and pressure drop of the micro channel heat exchangers using diffusion bonding technology. Four types of heat exchangers are designed and manufactured, which are straight type, long dot type, splited wavy type and straight double side type. Heat transfer and pressure drop performance of each heat exchangers are measured in various operating conditions, and compared each other. The results show that the $(j/f)^{1/3}$ performance of splited wavy type and long dot type increases about 10.3% and 6.1% at the Reynolds number 470 compared to that of straight type, respectively. On the other hand, $(j/f)^{1/3}$ performance of straight double side type decreases 19.7%.

• Journal of the Korean Society for Precision Engineering
• /
• v.27 no.7
• /
• pp.28-35
• /
• 2010

In the display industry, COG bonding method is being applied to production of LCD panels that are used for mobile phones and monitors, and is one of the mounting methods optimized to compete with the trend of ultra small, ultra thin and low cost of display. In COG bonding process, electrical characteristics such as contact resistance, insulation property, etc and mechanical characteristics such as bonding strength, etc depend on properties of conductive particles and epoxy resin along with ACF materials used for COG by manufacturers. As the properties of such materials have close relation to optimization of bonding conditions such as temperature, pressure, time, etc in COG bonding process, it is requested to carry out an in-depth study on characteristics of COG bonding, based on which development of bonding process equipment shall be processed. In this study were analyzed the characteristics of COG bonding process, performed the analysis and reliability evaluation on electrical and mechanical characteristics of COG bonding using ACF to find optimum bonding conditions for ACF, and performed the experiment on bonding characteristics regarding fine pitch to understand the affection on finer pitch in COG bonding. It was found that it is difficult to find optimum conditions because it is more difficult to perform alignment as the pitch becomes finer, but only if alignment has been made, it becomes similar to optimum conditions in general COG bonding regardless of pitch intervals.

• The Journal of the Korean dental association
• /
• v.53 no.3
• /
• pp.187-194
• /
• 2015

This paper reflects on the state of the art of two kinds of tooth hard tissue (enamel and dentin) bonding with resin cement. After presenting composition of resin cement, concepts of enamel bonding and resin bonding are addressed. Special attention is devoted to the concept and advantage of self-etching technique. Finally, recommended clinical performance regarding bonding to tooth with resin cement is summarized.

• Journal of the Korean Institute of Telematics and Electronics A
• /
• v.33A no.2
• /
• pp.148-162
• /
• 1996

Bonding wires for high frequency device packaging have dominant parasitic inductances which limit the performance of semiconductor lasers. In this paper, the inductance sof bonding wires are claculated by the method of moments with incorporation of ohmic loss, and the wideband modulation characteristics are analyzed for ddifferent wire lengths and structures. We observed the modulation bandwidth for 1mm-length bonding wire lengths and structures. We observed the modulation bandwidth for 1mm-length bonding wire is 7 GHz wider than that for 2mm-length bonding wire. We also observed th estatic inductance calculation results in dispersive deviation of the parasitic inductance and the modulation characteristics from the wideband moment methods calculations. The angled bonding wire has much less parasitic inductance and improves the modulation bandwidth more than 6 GHz. This calculation resutls an be widely used for designing and packaging of high-speed semiconductor device.

• Korean Journal of Materials Research
• /
• v.8 no.5
• /
• pp.429-435
• /
• 1998

무정형 PEEK 필름의 self-bonding 공정 시에 일어나는 결정화 현상이 접합 면에서 개발되어지는 self-bonding 강도에 미치는 영향을 주사전자현미경(SEM)을 이용하여 고찰하였다. 무정형 PEEK 필름의 결정화 현상은 접합 시의 공정변수에 따라 변화하며, self-bonding 공정 동안 접합 면을 가로질러 PEEK의 결정들이 성장함에 따라 접합이 일어남을 알 수 있었다. 접합온도가 높을수록 접합 면을 가로지르는 결정들의 성장 정도가 낮은 온도에서 접합시켰을 때의 경우보다 훨씬 커서 결과적으로 높은 self-bonding 강도를 보였다. 각각의 시편들을 전단 파괴시킨 후 행한 파단면 관찰에서는 self-bonding 강도가 점차 높아짐에 따라 더욱 조밀한 물결무늬 파면과 dimple 형태와 유사한 파면 형상들이 관찰되는 것으로 보아 접합공정 시 접합 면을 가로지르는 PEEK 결정들의 성장 정도가 self-bonding 강도에 커다란 영향을 미친다고 판단되었다.

• Journal of the Korea Academia-Industrial cooperation Society
• /
• v.15 no.4
• /
• pp.1879-1884
• /
• 2014

Recently, the micro bonding technology comes into the spotlight as the miniaturization of the electronic product. The micro bonding technique can classify by way of laser welding and ultrasonic bonding and etc. However, the research on the micro bonding is much lacks. In this paper, carried out the cooling analysis of the 60 [kHz] ultrasonic bonding equipment to know heat effect of the piezoelectric element when the ultrasonic bonding equipment was operated. The ultrasonic horn having the natural frequency with 60 [kHz] for the dissimilar material bonding of the glass and solder tried to be designed. The parameters and response was set through the basic experiment. The dissimilar material bonding strength analysis using the 60 [kHz] ultrasonic bonding equipment was done. We carried out the bonding for improving bonding strength to using the silver paste. air thightness of bonding surface was confirmed by analysis of bonding interfaces.

• Transactions of Materials Processing
• /
• v.28 no.1
• /
• pp.15-20
• /
• 2019

The superplastic forming/diffusion bonding process has been developed to fabricate a core frame structure with joint nodes out of tubes, for the development of a titanium high performance bicycle. The hydroforming process has been applied for bulging of a tube in the superplastic condition before, and during the diffusion bonding process. In this experiment, a commercial Ti-3Al-2.5V tube was selected as raw material for the study. The forming experiment has been performed using a servo-hydraulic press with a capacity of 200 ton. Next, nitrogen gas was used to acquire necessary pressure for the bulging and bonding of the tubes to fabricate the joint nodes. The pertinent processing temperature was $870^{\circ}C$ for the superplastic hydroforming/diffusion bonding (SHF/DB) process, using the Ti-3Al-2.5V tube. The bonding quality and the progress of bulging and diffusion bonding have been observed by the investigation of the joining interfaces at the cross section of the joint structure. The control of the nitrogen pressure throughout the SHF/DB process, was an important factor to avoid any significant defects in the joint structure. The whole progress stage of the diffusion bonding could be observed at a joint interface. A core structure with 5 joint nodes to manufacture a titanium bicycle could be obtained in a SHF/DB process.