Simulation of Threshold Voltages for Charge Trap Type SONOS Memory Devices as a Function of the Memory States (기억상태에 따른 전하트랩형 SONOS 메모리 소자의 문턱전압 시뮬레이션)
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- Proceedings of the Korean Institute of Information and Commucation Sciences Conference
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- v.9 no.1
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- pp.981-984
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- 2005