• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 2009.11a
• /
• pp.52-52
• /
• 2009

In this work, we demonstrate the modelling and simulation of the AlGaAs/GaAs quantum-well based light emitting transistor(LET). Based on the experimental and theoretical model, we have compared between a heterojunction bipolar transistor(HBT) structure with quantum wells in the base region and a HBT without quantum wells in the base region. For the purpose of optimizing device design, several analytic and numerical studies have been presented.

• Journal of Electrical Engineering and Technology
• /
• v.12 no.2
• /
• pp.632-642
• /
• 2017

This paper presents an improved approach towards reducing the switching loss of insulated gate bipolar transistors (IGBTs) for a medium-capacity-class power conditioning system (PCS). In order to improve the switching performance, the switching operation is analyzed, and based on this analysis, an improved switching method that reduces the switching time and switching loss is proposed. Compared to a conventional gate drive scheme, the switching loss, switching time, and delay are improved in the proposed gate driving method. The performance of the proposed gate driving method is verified through several experiments.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
• /
• 1995.11a
• /
• pp.158-162
• /
• 1995

We report rf and power characteristics of AlGaAs/GaAs Heterojunction Bipolar Transistor (HBTs) for X-band power applications. HBTs have been fabricated with polyimide a an interlayer dielectric. By characterizing the DC and RF characteristics we obtained the maximum current gain of 45, BV$\_$CEO/ of 10 V, fT of 30 GHz and f$\_$max/ of 17 GHz for device with 6x14$\mu\textrm{m}$$^2$emitter size. To extract accurate equivalent parameters, the De-embedded method was applied for extraction of parasitic parameters and the calculation of circuit equations for intrinsic parameters. Based on the Load-pull method, power characteristics was simulated and measured to get the maximum output power of the device.

• Journal of the Korean Institute of Telematics and Electronics A
• /
• v.30A no.10
• /
• pp.41-50
• /
• 1993

This paper describes the fabrication process and electrical characteristics of PSA (Polysilicon Self-Align) bipolar transistors with a thin base width of 1100.angs.. To realize this shallow junction depth, one-step rapid thermal annealing(RTA) technology has been applied instead of conventional furnace annealing process. It has been shown that the series resistances and parasitic capacitances are significantly reduced in the device with emitter area of 1${\times}4{\mu}m^{2}$. The switching speed of 2.4ns/gate was obtained by measuring the minimum propagation delay time in the I$^{2}$L ring oscillator with 31 stages.

• Journal of the Korean Institute of Telematics and Electronics A
• /
• v.31A no.10
• /
• pp.173-184
• /
• 1994

BiCMOS circuits mixed with CMOS and bipolar technologies show peculiar fault characteristics that are different from those of other technoloties. It has been reported that because most of short faults in BiCMOS circuits cause logically intermediate level at outputs, current monitoring method is required to detect these faluts. However current monitoring requires additional hardware capabilities in the testing equipment and evaluation of test responses can be more difficult. In this paper, we analyze the characteristics of faults in BiCMOS circuit together with their test methods and propose a new design technique for testability to detect the faults by logic monitoring. An effective method to detect the transition delay faults induced by performance degradation by the open or short fault of bipolar transistors in BiCMOS circuits is presented. The proposed design-for-testability methods for BiCMOS circuits are confirmed by the SPICE simulation.

• 제어로봇시스템학회:학술대회논문집
• /
• 2000.10a
• /
• pp.509-509
• /
• 2000

The circuit is designed for improving the relationship between input voltage and output current of the MOS transistor, which is square function. This circuit can be used instead of n-channel MOSFET at once. The circuit consists of MOSFET, which acts as a voltage receiver. The source of MOSFET is connected to current control part which consist of bipolar transistors. The exponential characteristic of bipolar transistor is used to solve the square function of MOSFET that base on concept of log and anti-log circuit. The experimental results of simulation are agreed with the implemented circuit.

• Proceedings of the KSR Conference
• /
• 2009.05a
• /
• pp.1943-1950
• /
• 2009

The development of high voltage Insulated Gate Bipolar Transistor (IGBT) have given new device advantage in the areas where they compete with conventional GTO (Gate Turnoff Thyristor) technology. The IGBT combines the advantages of a power MOSFET (Metal-Oxide Semiconductor Field-Effect Transistor) and a bipolar power transistor. The change of electrical characteristics for IGBT is mainly coming from the change of characteristics of MOSFET at the input gate and the PNP transistors at the output. The gate oxide structure gives the main influence on the changes in the electrical characteristics affected by environments such as radiation and temperature, etc.. The change of threshold voltage, which is one of the important design parameters, is brought by charge trapping at the gate oxide. In this paper, the electrical characteristics are simulated by SPICE simulation, and the parameters are found to design optimized circuits.

• Proceedings of the KAIS Fall Conference
• /
• 2004.06a
• /
• pp.172-175
• /
• 2004

This paper analyzes the effects of Ge profiles shape of SiGe heterojunction bipolar transistors (HBT's) for high frequency application. Device simulations using ATLAS/BLAZE for the SiGe HBT with trapezoidal or triangular Ge profile are carried out to optimize the device performance. An HBT with $15\%$ triangular Ge profile shows higher cut-off frequency and DC current gain than that with $19\%$ trapezoidal Ge profile. The cut-off frequency and DC gain are increased from 42GHz to 84GHz and from 200 to 600, respectively. The SiGe HBT has been fabricated using a production CVD reactor.

• Nuclear Engineering and Technology
• /
• v.54 no.2
• /
• pp.501-506
• /
• 2022

Long turn-off time limits high frequency operation of Bipolar Junction Transistors (BJTs). Turn-off time decreases with increases in the recombination rate of minority carriers at switching transients. Fast neutron irradiation on a Si BJT incurs lattice damages owing to the displacement of silicon atoms. The lattice damages increase the recombination rate of injected holes with electrons, and decrease the hole lifetime in the base region of pnp Si BJT. Fast neutrons generated from a beryllium target with 30 MeV protons by an MC-50 cyclotron were irradiated onto pnp Si BJTs in experiment. The experimental results show that the turn-off time, including the storage time and fall time, decreases with increases in fast neutron fluence. Additionally, it is confirmed that the base current increases, and the collector current and base-to-collector current amplification ratio decrease due to fast neutron irradiation.

• Journal of the Korean Institute of Telematics and Electronics
• /
• v.23 no.6
• /
• pp.741-746
• /
• 1986

A novel n-p-n bipolar transistor of which emitter is self-aligned with base contact by polyilicon is developed for using in high speed and high packing density LSI circuits. The emitter of this transistor is separated less than 0.4 \ulcorner with base contact by self-aligh technology, and the emitter feature size is less than 3x5 \ulcorner\ulcorner Because the active region of this transistor is not damaged through all the process, it has excellent electric properties. Using the n-p-n transistors by 3.0\ulcorner design rules, a NTL ring oscillator has 380 ps, a CML ring oscillator has 390ps, and a I\ulcorner ring oscillator has 5.6ns of per-gate minimum propagation delay time.