• Journal of the Institute of Electronics Engineers of Korea SD
• /
• v.43 no.5 s.347
• /
• pp.34-47
• /
• 2006

In this paper, a new testing technique for core components of wireless transceiver was proposed. That was, band fault models (including the information of specifications in the analogue and RF IC) and methods which can test specifications in the time domain easily by observing a variation of band fault models in the circuit output were proposed and developed. This technique had an advantage over testing technique in frequency domain because it didn't need expensive test equipments and could reduce the time required. Test technique proposed in this paper was adapted to the test of 5.25 GHz low noise amplifier and proved that this testing technique was efficient in RF IC including low noise amplifier.