• Proceedings of the Korean Society of Machine Tool Engineers Conference
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• 2004.04a
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• pp.513-517
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• 2004

The nature of the signals collected by an SEM(Scanning Electron Microscope) in order to form images are all dependent on the detector used to collect them, and the quality of an acquired image is strongly influenced by detector performance. Therefore, the development of detector with high performance is very important in pulling up the resolution of SEM. In this article, electron beam-specimen interactions, the detection principle of secondary electrons and backscattered electrons, and the structure of a conventional detector are described. The structure of an experimental apparatus for the future study on our hopeful novel electron detector is presented as well.

• Journal of the Korean Society for Precision Engineering
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• v.29 no.5
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• pp.554-562
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• 2012

Processing of Scanning electron microscope imaging has been analyzed in both secondary electron (SE) imaging and backscattered electron (BSE) image. Because of unique characteristics of both secondary electron and backscattered electron image, mechanism of imaging process and image quality are quite different each other. For the sake of characterize imaging process, Monte Carlo simulation code have been developed. It simulates electron penetration and depth profile in certain material. In addition, secondary electron and backscattered electron generation process as well as their spatial distribution and energy characteristics can be simulated. Geometries that has fundamental feature have been imaged using the developed Monte Carlo code. Two, SE and BSE images generation process will be discussed. BSE imaging process can be readily used to discriminate in both material and geometry by simply changing position and direction of BSE detector. The developed MC code could be useful to design BSE detector and their position. Furthermore, surface reconstruction technique is possibly developed at the further research efforts. Basics of Monte Carlo simulation method will be discussed as well as characteristics of SE and BSE images.

• Journal of the Korean Magnetics Society
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• v.5 no.5
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• pp.710-715
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• 1995

Magnetic domains were observed using an image lock-in technique for backscattered electron contrast (Type II) with a 200 kV scanning electron microscope. Backscattered electrons indicate a difference in magnetic domain structures at the upper and lower parts of the upper pole in thin-film heads, changing the acceleration voltage. With this method, it is also possible to observe the domain structure of the thin-film head pole through a 10 to $20\;\mu\textrm{m}$ protective layer, and the upper shield of the MR head through the coil in the resist, alumina overcoat, and upper pole.

• Nuclear Engineering and Technology
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• v.50 no.2
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• pp.259-267
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• 2018

Focused ion beam-scanning electron microscope and electron backscattered diffraction examinations were conducted in the center of a $73\;GWd/t_U\;UO_2$ fuel. They showed the formation of subdomains within the initial grains. The local crystal orientations in these domains were close to that of the original grain. Most of the fission gas bubbles were located on the boundaries. Their shapes were far from spherical and far from lenticular. No interlinked bubble network was found. These observations shed light on previous unexplained observations. They plead for a revision of the classical description of fission gas release mechanisms for the center of high burn-up $UO_2$. Yet, complementary detailed observations are needed to better understand the mechanisms involved.

• Applied Microscopy
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• v.45 no.4
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• pp.214-217
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• 2015

This study introduces metal coating as an effective sample preparation method to remove charge-up caused by the shadow effect during field emission scanning electron microscope (FE-SEM) analysis of dynamic structured samples. During a FE-SEM analysis, charge-up occurs when the primary electrons (input electrons) that scan the specimens are not equal to the output electrons (secondary electrons, backscattered electrons, auger electrons, etc.) generated from the specimens. To remove charge-up, a metal layer of Pt, Au or Pd is applied on the surface of the sample. However, in some cases, charge-up still occurs due to the shadow effect. This study developed a coating method that effectively removes charge-up. By creating a converted sample stage capable of simultaneous tilt and rotation, the shadow effect was successfully removed, and image data without charge-up were obtained.

• Restorative Dentistry and Endodontics
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• v.20 no.1
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• pp.214-234
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• 1995

The purpose of this work was to study the compatibility of several commercially available dentin adhesives with composite resins. In this study, V-shaped cavity preparations were created on both buccal and lingual surfaces of 60 extracted human premolars($3mm{\times}3mm{\times}2mm$ deep). Preparations were located such that the occlusal margins were on the enamel and the gingival margins were on the cementum(1mm below the CEJ). These specimens were randomly divided into three equal groups. Three dentin adhesives(Scotchbond Multi-Purpose, All Bond 2, Prisma Universal Bond 3)were applied to the cavity in accordance with each manufacturer's instructions. The teeth in each group were restored with four composite resins(Silux plus, Z100, Bisfil, Prisma TPH) in three increments, with each increment light-cured for 40 seconds. All specimens were exposed to 500 cycles of thermal stress. Specimens then placed in a silver nitrate solution(50% by weight) and stored in darkness for 24 hours. They were then immersed for 6 hours in photographic developing solution under flourescent light. Specimens were sectioned buccolingually through the center of the restoration and observed under a binocular stereoscope. To compare the marginal leakage, ANOVA and Dunkan's multiple range tests were used in analysis. Selected samples were further studied using scanning electron microscopy(XL20, Philips, The Netherlands). The results were as follows. 1. In all groups, the enamel margin showed significantly less leakage than the cementum margin. 2. No statistically significant differences were found in microleakage when composite resins were used with their proprietary dentin adhesives. 3. In comparison between dentin adhesives, Prisma Universal Bond 3 showed significantly less leakage at the enamel margin and Scotch bond multi-purpose showed significantly less leakage at the cementum margin than the other groups. 4. In comparison between composite resins, Silux Plus showed significantly more leakage than other groups at the enamel margin and no statistically significant differences were found in microleakage at the cementum margin. 5. According to the backscattered scanning electron microscope, microleakage occurred via gaps at the dentin adhesives/dentin interface.

• Journal of Korea Technical Association of The Pulp and Paper Industry
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• v.44 no.4
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• pp.16-24
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• 2012

To characterize the coating structure, diverse methods such as mercury intrusion, nitrogen adsorption and oil absorption methods have been developed and widely employed. These indirect techniques, however, have some limitation to explain the actual coating structure. Recently microscopic observation methods have been tried for analyzing structural characteristics of coating layers. Preparation of the undamaged cross section of a coating layer is essential for obtaining high quality image for analysis. In this study, distortion-free cross-section of the coating layer was prepared using a grinding and polishing technique. The coated paper was embedded in epoxy resin and cured. After curing the resin block it was ground with abrasive papers and then polished with diamond particle suspension and nylon cloth. Polished coating layer was sufficient enough to obtain undamaged cross sectional images with scanning electron microscope under backscattered electron image mode. In addition, the SEM images allowed distinction of the coating layer components. Also S/B latex film formed between pigment particles was visualized by osmium tetroxide staining. Pore size distribution and pore orientation were evaluated by image analysis from SEM cross-sectional images.

• Applied Microscopy
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• v.41 no.3
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• pp.147-154
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• 2011

Backscattered electrons (BSE) are generated at the impact of the primary electron beam on the specimen. BSE imaging provides the compositional contrast to resolve chemical features of sectioned block-face. A focused ion beam (FIB) column can be combined with a field emission scanning electron microscope (FESEM) to ensure a dual (or cross)-beam system (FIB-FESEM). Due to the milling of the specimen material by 10 to 100 nm with the gallium ion beam, FIB-FESEM allows the serial block-face (SBF) imaging of plastic-embedded specimens with high z-axis resolution. After contrast inversion, BSE images are similar to transmitted electron images by transmission electron microscopy. As another means of SBF imaging, a specialized ultramirotome has been incorporated into the specimen chamber of FESEM ($3View^{(R)}$). Internal structures of plastic-embedded specimens can be serially revealed and analyzed by $3View^{(R)}$ with a large field of view to facilitate three-dimensional reconstruction. These two SBF approaches by FESEM can be employed to unravel spatial association of (sub)cellular entities for a comprehensive understanding of complex biological systems.

• Applied Microscopy
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• v.43 no.4
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• pp.164-172
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• 2013

In this work, microstructural and hardness evolution of the X20 steel upon short-term creep test ($550^{\circ}C$ to $650^{\circ}C$, $180^{\circ}C$ to 60 MPa) was studied by using scanning electron microscope, electron backscattered diffraction, and transmission electron microscope, microhardness tester. After creep rupture, gauge and grip part of the specimens were microstructurally analyzed. Creep at the $650^{\circ}C$/60 MPa resulted in a rupture at 1,460 hours with growth of lath width from 1.31 to $2.87{\mu}m$ and a grain growth with a more equiaxed feature. There is a close relationship between Microhardness and lath width. The formation and coarsening of Laves phase, which was observed up to $600^{\circ}C$ of creep temperature, was accelerated by the applied stress. Slight coarsening of the $M_{23}C_6$ was observed in the $550^{\circ}C$ and $600^{\circ}C$ crept or aged specimens. The coarsening of $M_{23}C_6$ depended on the temperature, where specimens crept at $650^{\circ}C$ showed higher growth rate. The microstructural evolution of X20 after short-term creep test was extensively discussed in relation to the long-term creep/aging test reported in literatures.

• Journal of the Korean Recycled Construction Resources Institute
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• v.5 no.4
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• pp.435-441
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• 2017

Studies on self-healing have currently been diversified and the methods to evaluate the studies have become more diversified as well. Among them, the back-scattered electron (BSE) image acquired through the scanning electron microscope (SEM) is attempted as the means to evaluate the self-healing effect on cracks. In order evaluate by the BSE image, sophisticated pre-processing of specimen is critical and this injected inside the particle, pore and artificial crack of the hardener to stabilize the structure of the newly generated self-healing product and it enables to endure the stress on polishing without deformation. The impregnated specimen smoothen the surface to obtain the BSE image of high resolution that polishing is made for diamond suspension for wet polishing after dry polishing. As a result of evaluating the self-healing product on the impregnated and polished self-healing specimen, the generated product is formed from the surface of the artificial crack and the self-healing substances are confirmed as $Ca(OH)_2$ and C-S-H.