• Journal of Korean Ophthalmic Optics Society
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• v.13 no.3
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• pp.51-55
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• 2008

Purpose: To develop the program used in calculating and estimating anamorphic prisms used to construct an anamorphoser. Methods: If there is a program which can show the apex angle and the volume of prism which are decided by the refraction index of anamorphic prisms and the expanding ratio of incident beam, the production of anamorphic prisms can be done accurately. Moreover, it could become a convenient tool to the design and production of whole optical systems using anamorphic prisms. Developing this program, first, we had to induce formulas of prism that decide the apex angle and the arrangement angle of anamorphic prisms with the given refraction index of anamorphic prism and the given expanding ratio of incident beam. Then we programmed them by delphi 6.0 language so that they could be visualized on screen and easily confirmed. Results: We could develop the program used in calculating and estimating anamorphic prisms used to construct an anamorphoser. Conclusions: Judging from the results of applying this developed program to actual business, we could conclude that this program is useful in calculation and production of anamorphic prisms which are used as components of an anamorphoser because this program can offer a lot of accuracy and quickness to producers.

• Korean Journal of Optics and Photonics
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• v.18 no.6
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• pp.395-400
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• 2007

We propose a design and analysis of an optical system using a prism with a high enough refractive index for wet fingerprint identification. Important parameters including the tilting angle($\beta$) of the $1^{st}$ image plane, an anamorphic distortion, and a tilt of image plane are considered in terms of the apex angle of the prism($\alpha$) and refractive index of the prism material. Our suggestion on refractive index and apex angle of the prism corroborates well with experimental results.

• Journal of the Optical Society of Korea
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• v.13 no.1
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• pp.152-157
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• 2009

The structure of the prism sheet and the reflective polarizer sheet in the direct - illumination liquid crystal display (LCD) backlight is optimized and fabricated. The apex angle of the prism sheet was changed from 90 degree to 96.5 and 101.5 degree and the angular spread of the diffuser films attached on the reflective polarizer sheet was changed from 7 to 1.5 degrees. The measured view angle, the normal luminance, and the contrast ratio from the optimized backlight unit showed improved optical performances.

• Korean Journal of Optics and Photonics
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• v.10 no.3
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• pp.208-213
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• 1999

We proposed a new technique to precisely calibrate the angle of incidence in spectroscopic ellipsometer. The proposed technique can be useful to the thickness measurement of semiconductor thin films and optical thin films. The usefulness has been confirmed experimentally. We cut a block of optical glass into two pieces and made a prism as well as a slab using each piece. The apex angle and the angle of the minimum deviation of prism were measured. From these angles, the refractive index of glass material was calculated. From the analysis of the spectro-ellipsometric data collected near Brewster's angle, we could not only determine the error in the angle of incidence in the spectroscopic ellipsometer, but also calibrated the angle of incidence to the accuracy of 0.01 degree.

• Korean Journal of Optics and Photonics
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• v.28 no.5
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• pp.221-228
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• 2017

We measured the refractive index of a mixed polymer (NOA61, NOA84) in the liquid and solid states. First we made a hollow prism and filled it with UV (ultraviolet) epoxy. Measurement of the apex angle and the minimum-deviation angle gave the refractive index of the liquid polymer. To measure the refractive index of the solid polymer, an additional structure was included in the hollow prism, and the UV epoxy filling in the hollow prism was hardened. In both cases of liquid and solid polymers, the refractive index of the mixed polymer turned out to be proportional to the mix ratio. These results provide a method to vary the focal length of a double stacked cylindrical microlens array using UV epoxy.

• Korean Journal of Optics and Photonics
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• v.16 no.2
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• pp.113-120
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• 2005

Luminous efficiency and uniformity in a LCD-BLU are mainly determined by fine scattering patterns formed on the light guide panel. We propose a novel fabrication method of 3-dimensional scattered patterns based on anisotropic etching of silicon wafers. Micro-pyramid patterns with 70.5 degree apex-angle and micro-prism patterns with 109.4 degree apex-angle can be self-constructed by the wet, anisotropic etching of (100) and (110) silicon wafers, respectively, and those patterns are easily duplicated by the PDMS replica process. Experimental results on spatial and angular distributions of irradiation from the light guide panel with the micro-pyramid patterns were very consistent with the calculation results. Surface roughness of the silicon-based micro-patterns is free from any artificial defects since the micro-patterns are inherently formed with silicon crystal surfaces. Therefore, we expect that the silicon based micro-patterning process makes it possible to fabricate perfect 3-dimensional micro-structures with crystal surface and apex angles, which may guarantee mass-reproduction of the light guide panels in LCD-BLU.

• Journal of Sensor Science and Technology
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• v.26 no.1
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• pp.28-34
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• 2017

An NIR grism Si optical area sensor spectrometer with in-band reference wavelength is designed and fabricated. It is composed of a transmission type diffraction grating (spatial density 300 line/mm), a rectangular N-BK7 prism (apex angle 30 degree), NIR filter(cutoff wavelength 720 nm), an imaging convex lens(focal length 50 mm F1.8) and an IR modified DSLR camera (Canon EOS40D) of Si optical area sensor ($3,888{\times}2,592$ pixels, pixel size $5.710{\mu}m$). "In-band reference wavelength function" is implemented using non-dispersive 0th diffraction order optical beam. The NIR grism spectrometer is tested in a laboratory using a halogen lamp and a Neon lamp. And the spectrometer is used in an astronomy field for obtaining the planet Jupiter NIR spectrum. In-band reference wavelength i.e. un-deviation wavelength is 846 nm, an wavelength resolution is 0.3027 nm/pixel, an wavelength resolving power is 2,794 and an wavelength range is 650~1,000 nm.