• Title/Summary/Keyword: antireflection structure

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The Thermal and Optical Properties of Te-based Antireflection structure for Optical Recording (광기록을 위한 Te-based Antireflection구조의 열적, 광학적 특성)

  • Lee, S.J.;Lee, H.Y.;Chung, H.J.;Lee, Y.J.
    • Proceedings of the KIEE Conference
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    • 1993.07b
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    • pp.1256-1258
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    • 1993
  • Optical data storage offer high density storage and archival storage capability. In this study, we selected the ablation mechanism-one of an irreversible recording system-using the antireflection trilayer(ART) structure. Optical recording medium is a $(Te_{86}Se_{14})_{50}Bi_{50}$ thin films. Actually, ART structure is fabricated and compared to monolayer structure. ART structure leads to the reduction of recording power as well as an increase in the effciency compared to the monolayer structure.

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Antireflection Structures and Optical Recording Properties of Te-based Alloy Thin Films (Te계 합금 박막의 Antireflection 구조와 광기록 특성)

  • Lee, Hyun-Yong;Choi, Dae-Young;Lee, Young-Jong;Chung, Hong-Bae
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 1988.05a
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    • pp.74-77
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    • 1988
  • This paper reports the properties of antireflection structure and hole formation of Te-based systems. The optical-recording characteristics of metallic recording media are enhanced significantly by incorporating the metal(Al) layer into an antreflection trilayer structure. Due to the interface condition inherent in the design of the trilayer structure, reflectivity from holes is ranked low fraction (<10%). The hole formation is carried by $Ar^+$ Laser(488nm). For 20nsec pulse duration, hole opening power(threschold) of $(Te_{86}Se_{14})_{50}Bi_{50}$ trilayer is lower than that of monolayer that used in this experiment. Hole shapes of the whole sample were clean.

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The Study on the Reflection Coating Design Scheme in the Thin-Film Silicon Solar Cell (박막 실리콘 태양전지의 반사코팅 설계기술 연구)

  • Kim, Chang-Bong
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.12 no.11
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    • pp.5172-5177
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    • 2011
  • This paper presents a reflection coating design scheme in the thin-film silicon solar cell. The antireflection(high reflection) coating skill is needed in the front(back) panel of the thin-film solar cell to improve an efficiency of light absorbing. In the single structure a reflectivity is changed according to the thickness of coating for antireflection scheme and its minimum value can be obtained by controlling thickness of coating. In the symmetric multi layer structure low reflectivity can be obtained in the wide wavelength range. And we also find that high reflectivity can be obtained through multi layer structure, which has alternate layers of high and low material, for high reflection scheme in the back panel.

Antireflection Layer Coating for the Red Light Detecting Si Photodiode (적색검출 Si 포토다이오드의 광반사 방지막 처리)

  • Chang, Gee-Keun;Hwang, Yong-Woon;Cho, Jae-Uk;Yi, Sang-Yeoul
    • Korean Journal of Materials Research
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    • v.13 no.6
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    • pp.389-393
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    • 2003
  • The effect of antireflection layer on the reduction of optical loss has been investigated in Si photodiodes detecting red light with central wavelength of 670 nm. The theoretical analysis showed minimum reflection loss of 6% for the $SiO_2$thickness of about $1100∼1200\AA$ in the $SiO_2$-Si system with the single antireflection layer and no reflection loss for the X$N_3$N$_4$$SiO_2$thickness of $2000\AA$/$1200\AA$ in the $Si_3$$N_4$$SiO_2$-Si system with double antireflection layer. In our experiments, Si photodiodes with the web-patterned $p^{+}$-shallow diffusion region were fabricated by bipolar IC process technology and the devices were classified into three kinds according to the structure of $Si_3$$N_4$/$SiO_2$antireflection layer. The fabricated devices showed maximum spectral response in the optical spectrum of 650∼700 nm. The average photocurrents of the devices with the $Si_3$$N_4$$SiO_2$thickness of $1000\AA$/X$SiO\AA$, and $2000\AA$$1800\AA$ under the incident power, of -17 dBm were 3.2 uA, 3.5 uA and 3.1 uA, respectively.

Design of an Antireflection Coating for High-efficiency Superconducting Nanowire Single-photon Detectors

  • Choi, Jiman;Choi, Gahyun;Lee, Sun Kyung;Park, Kibog;Song, Woon;Lee, Dong-Hoon;Chong, Yonuk
    • Current Optics and Photonics
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    • v.5 no.4
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    • pp.375-383
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    • 2021
  • We present a simulation method to design antireflection coating (ARCs) for fiber-coupled superconducting nanowire single-photon detectors. Using a finite-element method, the absorptance of the nanowire is calculated for a defined unit-cell structure consisting of a fiber, ARC layer, nanowire absorber, distributed Bragg reflector (DBR) mirror, and air gap. We develop a method to evaluate the uncertainty in absorptance due to the uncontrollable parameter of air-gap distance. The validity of the simulation method is tested by comparison to an experimental realization for a case of single-layer ARC, which results in good agreement. We show finally a double-layer ARC design optimized for a system detection efficiency of higher than 95%, with a reduced uncertainty due to the air-gap distance.

Fabrication of Moth-Eye Pattern on a Lens Using Nano Imprint Lithography and PVA Template (나노임프린트 리소그래피와 유연 PVA 템플릿을 이용한 렌즈 표면 moth-eye 패턴 형성에 관한 연구)

  • Bae, B.J.;Hong, S.H.;Kwak, S.U.;Lee, H.
    • Journal of the Korean institute of surface engineering
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    • v.42 no.2
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    • pp.59-62
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    • 2009
  • Antireflection pattern, moth-eye structure, was fabricated on lens using Ultra Violet nanoimprint lithography and flexible template. Ni template with conical shaped structure was used as a master template to molding. The flexible poly vinyl alcohol template was fabricated by molding. This poly vinyl alcohol template was used as an imprint template of imprint at lens. Using Ultra Violet nanoimprint lithography and poly vinyl alcohol template, polymer based moth-eye structure was formed on lens and its transmittance was increased up to 94% from 92% at 550 nm wavelength.

The Reflection Color Light with the Structure of an Antireflection Lenses (렌즈 무반사막 구조에 의한 반사색광의 특성 연구)

  • Kim, Yong-Geun
    • Journal of Korean Ophthalmic Optics Society
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    • v.1 no.1
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    • pp.93-102
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    • 1996
  • The optical system of lens must be designed to tramsmit light over wide wavelength range and to have lower reflectivity in order to obtain higher spectral transmittance. However, the reflection color light appears due to the remain-reflection light in any optical system of lens. The wavelength of the reflection color light can be controlled by the structure of the number of layers, thickness of layer, reflective index, wavelength of incidence, and substrate etc. In the optical systems of the single layer and the double layers, the reflection color light appears in the condition of the anti-reflection of ${\lambda}s/{\lambda}$ = 1.0 by the color mixture of the remain-reflection lights in the ranges of the longer wavelength side and the shorter one of the ${\lambda}s/{\lambda}$ = 1.0, and of the double layers and triple layers, the reflection color light positioned at P1 < ${\lambda}s/{\lambda}$ < P2 appears in the condition of the antireflection of ${\lambda}s/{\lambda}$ = $PI{\ll}1$ and $P2{\gg}1$. In the optical system of the multi-layers, many antireflection points are existed at the various s/ values, and the reflection color light by the color mixture of the remain-reflection lights in the ranges except for the antireflection points.

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The Study on the Antireflection(AR) Coating Design Scheme According to the Index Profile in the Thin-Film Silicon Solar Cell (굴절률 분포에 따른 박막 실리콘 태양전지 반사방지막 설계기술 연구)

  • Kim, Chang-Bong
    • Journal of the Korea Academia-Industrial cooperation Society
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    • v.13 no.9
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    • pp.4139-4145
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    • 2012
  • This paper shows an antireflection coating design skill for utilization the thin-film silicon solar cell in the future. The reflectivity of each index profile previously suggested as linear, cubic and quintic function has been calculated and compared. Each index profile is applied to the antireflection coating consisting of 6 layers with 180nm thickness. Also we suggest the graded index profile and compare it's reflectivity to the linear, cubic and quintic's ones. As a results we find the reflectivity generally decreases as the order goes to higher. However the reflectivity in the graded index profile shows the higher(lower) value than ones in the linear, cubic and quintic especially in the shorter(longer) wavelength range from 500 nm to below 700 nm(above 700 nm to 800 nm). Therefore we find that the graded index profile structure could be applied for the better antireflection coating design scheme especially for optical device and optical filter in the range of from deep red to infrared.

Optimization and Efficiency Improvement of BCSC Solar Cells Using $MgF_{2}/CeO_{2}$Double Layer Antireflection Coatings ($MgF_{2}/CeO_{2}$ 이중반사방지막을 이용한 BCSC태양천지의 효율향상과 최적화)

  • 이욱재;임동건;이준신
    • Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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    • 2001.07a
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    • pp.251-254
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    • 2001
  • This paper describes an efficiency improvement of buried contact solar cell (BSCS) with a structure of MgF$_2$/CeO$_2$/Ag/Cu/Ni grid/n$^{+}$ emitter/p-type Si base/p$^{+}$/Al. Theoretical and experimental investigations were performed on a double layer antireflection (DLAR) coating of MgF$_2$/CeO$_2$. We investigated CeO$_2$ films as an AR layer because they have a proper refractive index of 2.46 and demonstrate the same lattice constant as Si substrate. An optimized DLAR coating shewed a reflectance as low as 2.04 % in the wavelengths ranged from 0.4 ${\mu}{\textrm}{m}$ to 1.1 ${\mu}{\textrm}{m}$. BCSC cell efficiency was improved from 16.2 % without any AR coating to 19.9 % by employing DLAR coatings. Further details on MgF$_2$/CeO$_2$ DLAR coatings on the BCSC cells are presented in this paper.per.

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