Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference (한국전기전자재료학회:학술대회논문집)
- 1988.05a
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- Pages.74-77
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- 1988
Antireflection Structures and Optical Recording Properties of Te-based Alloy Thin Films
Te계 합금 박막의 Antireflection 구조와 광기록 특성
- Lee, Hyun-Yong (Dept. of Electron. Mater. Eng., Kwang Woon Univ.) ;
- Choi, Dae-Young (Dept. of Electron. Mater. Eng., Kwang Woon Univ.) ;
- Lee, Young-Jong (Dept. of Electron. Mater. Eng., Kwang Woon Univ.) ;
- Chung, Hong-Bae (Dept. of Electron. Mater. Eng., Kwang Woon Univ.)
- Published : 1988.05.27
Abstract
This paper reports the properties of antireflection structure and hole formation of Te-based systems. The optical-recording characteristics of metallic recording media are enhanced significantly by incorporating the metal(Al) layer into an antreflection trilayer structure. Due to the interface condition inherent in the design of the trilayer structure, reflectivity from holes is ranked low fraction (<10%). The hole formation is carried by
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