• Journal of the Korean Ceramic Society
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• v.45 no.9
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• pp.524-530
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• 2008

Anti-Reflective (AR) thin film coatings of $SiO_2$ (n= 1.48) and $TiO_2$ (n=2.17) were deposited by ion-beam assisted deposition (IBAD) with End-Hall ion source and conventional electron beam (e-beam) evaporation to investigate the effect of deposition method on the refractive indicies (n) of the fIlms. Green-light generation using a GaAs laser diode was achieved via excitation of the second harmonic. The latter resulted from the transmission of the fundamental guided-mode wave of 1064 nm through periodically poled $LiNbO_3$. Large differences in the refractive indicies of each of the layers in the multilayer coating may improve AR performance. IBAD of $SiO_2$ reduced its refractive index from 1.45 to 1.34 at 1064 nm. Conversely, e-beam evaporation of $TiO_2$ increased its refractive index from 1.80 to 2.11. In addition, no fluctuations in absorption at the wavelength of 1064 nm were found. The results suggest that films prepared by different deposition methods can increase the effectiveness of multilayer AR coatings.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2000.04b
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• pp.39-42
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• 2000

As gate dimensions continue to shrink below $0.2{\mu}m$, improving CD (Critical Dimension) control has become a major challenge during CMOS process development. Anti-Reflective Coatings are widely used to overcome high substrate reflectivity at Deep UV wavelengths by canceling out these reflections. In this study, we have investigated Batchtype system for PECVO SiOxNy as Anti-Reflective Coatings. The Singletype system was baseline and Batchtype system was new process. The test structure of Singletype is SiON $250{\AA}$ + Cap Oxide $50{\AA}$ and Batchtype is SiON $250{\AA}$ + Cap Oxide $50{\AA}$ or N2O plasma treatment. Inorganic chemical vapor deposition SiOxNy layer has been qualified for bottom ARC on Poly+WSix layer, But, this test was practiced on the actual device structure of TiN/Al-Cu/TiN/Ti stacks. A former day, in Batchtype chamber thin oxide thickness control was difficult. In this test, Batchtype system is consist of six deposition station, and demanded 6th station plasma treatment kits for N2O treatment or Cap Oxide after SiON $250{\AA}$. Good reflectivity can be obtained by Cap Oxide rather than N2O plasma treatment and both system of PECVD SiOxNy ARC have good electrical properties.

• Journal of the Korean Ceramic Society
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• v.34 no.1
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• pp.79-87
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• 1997

Anti-reflective and anti-static double layered films were prepared on the VDT panel by sol-gel spin-coating method. Their electrical, opticla, and mechanical properties were investigated. The outer SiO2 film with low re-fractive index was coated over the inner ATO(Antimony-doped Tin Oxide)-SiO2 film which was prepared by mixing ATO sol with SiO2 at molar ratio of 68:32 to satisfy the interference condition of double layers. The heat treatment was conducted at 45$0^{\circ}C$ for 30 min where residual organics were completely removed. The sheet resistance of ATO single layer showed the minimum value of 6$\times$107$\Omega$/$\square$ at 3 mol% addition of Sb and that of SiO2/ATO-SiO2 increased slightly with increasing SiO2 mol% up to 30 mol%, and then increased steeply to the value of 3$\times$108$\Omega$/$\square$ at 32 mol%. The reflectance of double layered films was about 0.64% at the wavelength of 550nm and the transmittance increased about 3.20%. The hardness of double layered films was almost the same as that of uncoated VDT panel, 471.4kg.f/mm2.

• Journal of Korean Society of Industrial and Systems Engineering
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• v.36 no.2
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• pp.32-38
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• 2013

In recent years, anti-PID (Potential Induced Degradation) technologies have been studied and developed at various stages throughout the solar value chain from solar cells to systems in an effort to enhance long-term reliability of the photovoltaics (PV) system. Such technologies and applications must bring in profits economically for both manufacturers of solar cell/module and investors of PV systems, simultaneously for the development of the PV industry. In this study two selected anti-PID technologies, ES (modification of emitter structure) and ARC (modification of anti-reflective coating) were compared based on the economic features of both a cell maker with 60MW production capacity and an investor of 1MW PV power plant. As a result of this study, it is shown that ARC anti-PID technology can ensure more profits over ES technology for both the cell manufacturer and the investor of PV power plant.

• Journal of the Institute of Electronics and Information Engineers
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• v.52 no.5
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• pp.206-213
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• 2015

An omni-directional, graded-index and textured ZnO nanorods with $MgF_2$ anti-reflective(AR) coating films for the electro optical tracking system(EOTS) by e-beam evaporation method are presented. we achieved that the graded index structure can minimize image tracking interference of EOTS which is comparable to a general AR coating films. Optimized ZnO nanorods with $MgF_2$ AR coating films lead to decreasing Fresnel reflection by gradient refractive index. According to our experiment results, ZnO nanorods with $MgF_2$ AR coating films can be used for various electro optical system to improve the optical performance.

• Journal of Korean Ophthalmic Optics Society
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• v.5 no.1
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• pp.7-11
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• 2000

The anti-reflective anti-static (ARAS) optical film is designed using absorbent materials such as ITO, $TiN_xW_y$, Ag by Essential Macleod program. [air ${\mid}TiN_xW_y{\mid}SiO_2{\mid}$ glass] two layer shows wide-band AR coating in the wavelength range of 450~700 nm. The reflectivity, transmittance of this coating are below 0.5%, about 75%, respectively. [air $SiO_2{\mid}TiO_2{\mid}SiO_2{\mid}$, ITO glass] layer can adjust reflectance of below 0.5% with above 97% transmittance. In the [air ${\mid}SiO_2{\mid}TiO_2{\mid}SiO_2{\mid}$ Ag glass] layer, the transmission can be controlled at above 96% with reflectance of 1~2%.

• Proceedings of the Korean Vacuum Society Conference
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• 2012.08a
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• pp.334-334
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• 2012

태양전지 기술은 우주 항공에서부터 핸드폰과 같은 소규모 가전 시설에까지 폭 넓게 사용되고 있다. 현재 태양전지 기술은 기존의 화석 에너지에 비해 효율 측면에서의 열세함으로 인해 변환 효율을 높이는 연구가 진행되고 있다. 태양전지의 기본 구조에서 고반사막을 대신하여 선택적 투과막을 채용하면 적외선 영역은 광흡수층으로 재반사시키고 가시광선 영역은 선택적으로 투과시킬 수 있기 때문에 태양전지의 변환 효율을 높임과 동시에 채광에 유리한 투명 태양전지를 얻을 수 있다. 본 연구에서는 반응성 분위기에서 AlTi 단일 타겟을 스퍼터링하여 유리 기판 위에 AlTiO 선택적 투과막을 형성하고 광학적 특성을 평가하였다. 기존의 연구에서 스퍼터링으로 형성한 AlTiO 선택적 투과막은 가시광선 영역에서 약 30%의 비교적 높은 반사율을 나타내었다. 이번 연구에서는 광학 두께를 조절함으로써 가시광선 영역에서 반사율이 평균 20% 이상 감소하고 적외선 영역에서 약 30% 이상의 반사율을 나타내는 선택적 투과막을 형성한 결과를 보고한다.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2006.11a
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• pp.66-66
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• 2006

Development of ArF Photo-lithography process has proceeded with the increase of numerical aperature (NA) and the decrease of resist thickness. It makes many problems such as cost and process complexity. A novel spin-on hard mask system is proposed to overcome many problems Spin-on hard mask composed of two layers of siloxane and carbon. The optical thickness of two layers is designed from reflectivity measurement at specified n, k respectively. The property of photo-resist shows different results according to Si contents. Si-contents was measured XPS(X-ray Photoelectron spectroscopy).

• Proceedings of the Korean Vacuum Society Conference
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• 2012.02a
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• pp.301-301
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• 2012

지구 온난화와 화석 연료의 고갈이 심각해지면서 청정 에너지원으로서 신재생에너지에 대한 관심이 더욱 고조되고 있다. 신재생에너지 분야의 핵심기술의 하나인 태양전지의 여러 응용분야 중에서 건물 일체형 태양전지의 발전 가능성이 특히 높게 평가되고 있다. Si 계 박막 태양전지 내에 금속 산화물 계 선택적 투과막을 적용하면 선택적으로 적외선영역을 광흡수층으로 반사시키므로 건물 일체형 태양전지에 적용이 가능한 높은 변환효율의 투명 태양전지를 제조할 수 있다. 최근 연구 결과에 의하면 AlTiO 선택적 투과막의 투과율은 표면 평탄도에 의존하며, 타겟에 인가되는 전력을 감소시킴으로써 reactive co-sputtering 시 발생하는 아크 방전을 억제하면 AlTiO 박막의 평탄도가 개선된다는 사실이 알려져 있다. 본 연구에서는 AlTi single 타겟을 이용하여 AlTiO 박막을 형성함으로써 박막 표면을 더욱 개선시켜 가시광선 영역의 투과율을 향상시킨 결과를 보고한다.

• Solar Energy
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• v.6 no.2
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• pp.70-75
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• 1986

The fabrication procedure and characteristics of $Ta_2O_5/Al/SiO_2/p-Si$ MIS solar cells forming a fine grating pattern of aluminum evaporated on to p-type silicon crystal are discribed. The proper temperature for oxide growing of these cells was found to be about $450^{\circ}C$ for 20 minutes with oxygen flow. The conversion efficiency increased about 3% after $750{\AA}$ thickness of tantalium silica film spin on anti-reflective coating. The best results showed that $V_{oc}=0.545V,\;J_{sc}=34mA$ and F.F = 0.65, which represent that the conversion efficiency is 12%.