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http://dx.doi.org/10.11627/jkise.2013.36.2.32

A Study on Validity of Anti-PID Technology of Solar Cell for the High Reliability of Photovoltaics System  

Baik, Sungsun (School of Industrial Engineering, Kumoh National Institute of Technology)
Baek, Seungyup (STX Solar Co. Ltd.)
Jung, Tae-Wook (Department of consulting, Graduate School Kumoh National Institute of Technology)
Cho, Jin-Hyng (School of Industrial Engineering, Kumoh National Institute of Technology)
Publication Information
Journal of Korean Society of Industrial and Systems Engineering / v.36, no.2, 2013 , pp. 32-38 More about this Journal
Abstract
In recent years, anti-PID (Potential Induced Degradation) technologies have been studied and developed at various stages throughout the solar value chain from solar cells to systems in an effort to enhance long-term reliability of the photovoltaics (PV) system. Such technologies and applications must bring in profits economically for both manufacturers of solar cell/module and investors of PV systems, simultaneously for the development of the PV industry. In this study two selected anti-PID technologies, ES (modification of emitter structure) and ARC (modification of anti-reflective coating) were compared based on the economic features of both a cell maker with 60MW production capacity and an investor of 1MW PV power plant. As a result of this study, it is shown that ARC anti-PID technology can ensure more profits over ES technology for both the cell manufacturer and the investor of PV power plant.
Keywords
Solar cell; PID; Reliability; Photovoltaics system;
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