• Title/Summary/Keyword: accelerated life tests

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Life Estimation of Elevator Wire Ropes Using Accelerated Degradation Test Data (가속열화시험 데이터를 활용한 엘리베이터 와이어로프 수명 예측)

  • Kim, Seung Ho;Kim, Sang Boo;Kim, Sung Ho;Ham, Sung Hoon
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.41 no.10
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    • pp.997-1004
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    • 2017
  • The life of elevator wire ropes is one of the most important characteristics of an elevator, which is closely related to the safety of users and its maintenance policy. It is not cost effective to measure the lifetime of elevator wire ropes during their use. In this study, the life estimation of elevator wire ropes (8x19W-IWRC) is considered using accelerated degradation test data. A bending fatigue tester is used to perform the accelerated degradation tests, incorporating the acceleration factor of tensile force. Assuming that the life of wire ropes is log-normally distributed, two life estimation methods are suggested and their results are compared. The first method estimates the life of wire ropes utilizing the accelerated life model with pseudo lives obtained from a linear regression model. The second method estimates the life using a logistic model based on failure probability.

Accelerated Life Test Design of an Electromagnetic Shielding Door Hinge (전자파 차폐도어용 힌지의 가속 수명 시험법 설계)

  • Kim, Do Sik;Cheong, Han Young
    • Transactions of the Korean Society of Mechanical Engineers A
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    • v.41 no.9
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    • pp.887-895
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    • 2017
  • This paper presents a study on the accelerated life tests of parts that operate during the opening and closing of door frames, particularly door hinges. Hinge theoretical verification and validation of the test equipment in the present study and the different structures and fault mode, depending on the purpose of usage analysis, failure mode for one of the hinges of the switchgear components used for electromagnetic shielding facilities and on-site operating conditions. The accelerated life test was designed for the characteristic lifetime prediction of the components, by estimating the shape parameter and the acceleration factor.

Development of Reliability Design Methodology Using Accelerated Life Testing and Taguchi Method (가속 수명시험과 다구치 방법을 활용한 신뢰성설계 방법의 개발)

  • Kim, Min;Yum, Bong-Jin
    • Journal of Korean Institute of Industrial Engineers
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    • v.28 no.4
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    • pp.407-414
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    • 2002
  • The inherent reliability of a product is primarily determined in the design stage, and therefore, design engineers should be able to design reliability into the product in an efficient manner. Especially, the product should be designed such that its reliability is robust to various noise factors encountered in production and field environments. The Taguchi method can be effectively used for this purpose. However, there exist only a few attempts to integrate the Taguchi method with reliability design, and in addition, the existing works do not sufficiently consider the robustness and/or the distinction between noise and acceleration factors. This paper develops a unified approach to robust reliability design assuming that accelerated life tests are conducted at each combination of design and noise conditions. First, an experimental structure for assigning not only acceleration but also noise factors is presented. Second, the reliability at the use condition is estimated using the assumed accelerated life test model. Third, reliabilities are transformed into 'efforts' using an effort function which reflects the degree of difficulty involved in improving the reliability. Finally, an optimal setting of design parameters is determined based on the mean and standard deviation of the effort values. The above approach is illustrated with an example of a paper feeder design.

Development of Accelerated Life Tests for Solid Aluminum Electrolyte Capacitor Made by Domestic Manufacturing Company and Comparison of Characteristics between Domestic Products and Foreign Advanced Products (국산 고체 알루미늄 전해 커패시터의 가속수명시험 개발 및 국외 선진업체 제품과의 특성 비교)

  • 박정원;이중휘
    • Journal of Applied Reliability
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    • v.2 no.1
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    • pp.1-14
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    • 2002
  • High temperature operating test, temperature humidity test and temperature cycling were performed at various test levels for solid aluminum electrolyte capacitors made by domestic manufacturing company and foreign advanced manufacturing company. It was found that main failure mode of solid aluminum electrolyte capacitors was the decrease of their capacitances. The decrease of their capacitances has the same pattern in these tests. Test result for comparison of characteristics between domestic products and foreign advanced products shows that domestic products have the shorter lifetime and their capacitances decrease more rapidly in high temperature operating test and temperature humidity test. Also in these tests, accelerated tests for high temperature operating test and temperature humidity test were developed.

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Evaluation Criteria of Reliability on Transmission Control Unit for Passenger Car

  • Choi, M.;Ryu, S.;Lim, J.H.;Jeong, H.S.
    • International Journal of Reliability and Applications
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    • v.11 no.1
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    • pp.55-67
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    • 2010
  • There has been a recent upsurge in demand for the improvement of car reliability in the Northern American which is the primary market of South Korea automobile industry. It has been required that the warranty for transmission control unit for passenger cars directly related to passenger safety or security should be extended for 10 years and 160,000 km. In this paper, the test method for reliability and evaluation criteria is presented to evaluate the reliability on the automatic transmission controller. Reliability certification test can be roughly divided into two types: a quality test and life assessment test and a quality test can be subdivided into a basic performance test and environmental resistance test. There are 3 types of tests on the performance test for automatic transmission controller and environmental resistance test is composed of 14 items. Life test is performed with only the product passed this quality test. In this study, operation limit test at the high-temperatures, accelerated life test under specific temperature and accelerated life test for 2 or 3 stress levels are shown as a way for life test.

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Optimal Design of Accelerated Life Tests under Model Uncertainty (불확정 모형하에서 가속수명시험의 최적 설계)

  • 서순근;하천수;김갑석
    • Journal of Korean Society for Quality Management
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    • v.29 no.3
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    • pp.49-65
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    • 2001
  • This paper presents new compromise ALT plan which is applied to situations that true relationship between stress and parameters is not known exactly. The assumed failure distribution of this study is one of location-scale family, i. e., exponential, Weibull, and lognormal distributions which have been ones of the popular choices of failure distributions. The method of applying the stress is constant, and the censoring mechanism is Type I censoring. Compared with existing compromise plans under true simple linear model in terms of statistical efficiency, the efficiency of new compromise plan is better than the corresponding other compromise ones in most cases. For case when true model is quadratic, this plan can be used without any severe loss in statistical efficiency. The proposed new compromise ALT plan is illustrated with a numerical example and sensitivity analyses are conducted to study effects of pre-estimates of design parameters.

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Accelerated life test plan under modified ramp-stress loading with two stress factors

  • Srivastava, P.W.;Gupta, T.
    • International Journal of Reliability and Applications
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    • v.18 no.2
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    • pp.21-44
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    • 2017
  • Accelerated life tests (ALTs) are frequently used in manufacturing industries to evaluate the reliability of products within a reasonable amount of time and cost. Test units are subjected to elevated stresses which yield quick failures. Most of the previous works on designing ALT plans are focused on tests that involve a single stress. Many times more than one stress factor influence the product's functioning. This paper deals with the design of optimum modified ramp-stress ALT plan for Burr type XII distribution with Type-I censoring under two stress factors, viz., voltage and switching rate each at two levels- low and high. It is assumed that usage time to failure is power law function of switching rate, and voltage increases linearly with time according to modified ramp-stress scheme. The cumulative exposure model is used to incorporate the effect of changing stresses. The optimum plan is devised using D-optimality criterion wherein the ${\log}_{10}$ of the determinant of Fisher information matrix is maximized. The method developed has been explained using a numerical example and sensitivity carried out.

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Compound Linear Test Plan for 3-level Constant Stress Tests

  • Kim, In-Ho
    • Journal of the Korean Data and Information Science Society
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    • v.17 no.3
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    • pp.945-952
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    • 2006
  • Several accelerated life test plans use tests at only two levels of stress and thus, have practical limitations. They highly depend upon the assumption of a linear relationship between stress and time-to-failure and use only two extreme stresses that can cause irrelevant failure modes. Thus 3-level stress plans are preferable. When the lifetime distribution of test unit is exponential with mean lifetime $\theta_i$ at stress $x_i$, i=0, 1, 2, 3, we derive the optimum quadratic plan under the assumption that a quadratic relationship exists between stress and log(mean lifetime), and propose the compound linear plans, as an alternative to the optimum quadratic plan. The proposed compound linear plan is better than two other compromise plans for constant stress testing and nearly as good as the optimum quadratic plan, and has the advantage of simplicity.

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Optimal Design of Constant Stress Accelerated Life Tests Using Degradation Phenomenon Based on a Brownian Motion (브라운 운동을 따르는 열화현상을 이용한 일정스트레스 가속수명시험의 최적설계)

  • 서순근;김갑석;하천수
    • Journal of Korean Society for Quality Management
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    • v.26 no.1
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    • pp.74-87
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    • 1998
  • This study considers optimal design of accelerated life tests under constant stress using that the first passage time to cross a critical boundary through amount of accumulated degradation has an inverse Gaussian distribution when the degradation process follows to a Brownian motion with positive drift of log linear function of stress. Optimum plans for Type I censoring are derived by minimizing the asymptotic variance of estimated quantiles at the use stress. Sensitivity analyses are also conducted to see how sensitive the optimality criterion is with respect to the uncertainties involved in the guessed values.

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Reliability Analysis of Degradation Data Based on Accelerated Model -With Photointerrupter Used in Home VCR(Video Cassette Recorder)- (가속 모델에 기초한 열화 데이터의 신뢰성 해석 -가정용 영상 재생기에 사용되는 광센서를 중심으로-)

  • Kwon, Soo-Ho;Huh, Yang-Hyun;Lim, Tae-Jin
    • IE interfaces
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    • v.12 no.3
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    • pp.448-457
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    • 1999
  • Accelerated degradation is concerned with models and data analyses for degradation of product performance over time at overstress and design conditions. Although there have been numerous studies with accelerated degradation theory in reliability, very few actually apply to parametric statistical analyses. This paper shows how to analyze degradation data, provides tests for how well the assumptions hold. Reel sensors, a sort of photointerrupters in home VCR, hive been tested, and least-square analyses are used to illustrate our approach. Tests for linearity of the performance-time relationship, dependence of the lognormal distribution, and the standard deviation on time are performed. The mean life of tested sensors is assessed at about 414,000 hours, and the Arrhenius activation energy of this reaction is concluded to be 0.39 eV as results.

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