• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2004년도 하계학술대회 논문집 Vol.5 No.2
• /
• pp.1288-1291
• /
• 2004

In this study, physical characteristics of alumina slurry on variation of pH value and the effect of non-ionic surfactants on alumina slurry for copper chemical mechanical planarization (CMP) slurry have been investigated. After pH value of the slurry with alumina abrasive was changed by adding various amount of $HNO^3$ or KOH, the differences of settling rate, particle size, and zeta-potential were estimated. Better settling rates were shown in slurries with alumina abrasive at near pH 1. Higher zeta-potential was shown at around pH 2 in alumina slurry and the point of zero charge (PZC) was measured at about pH $9\sim10$. Non-ionic surfactant was added in the slurry with 5wt% alumina abrasive to get its effect on slurry practically. Abrasive size was smaller increased when amount of surfactant increased in slurry with P-4 as abrasive; on the other side, it was smaller when amount of surfactant decreased with AES-12. Variation of zeta-potential has no tendency with adding surfactant; however, values of zeta-potential were between $35\sim50mV$. The proper amount of surfactant was $0.1\sim1.0wt%$ in slurry with P-4 and $0.5\sim1.0wt%$ in slurry with AES-12 respectively. Excellent dispersion stabilization was obtained by addition of non-ionic surfactant

• 한국기계가공학회지
• /
• 제8권4호
• /
• pp.14-19
• /
• 2009

Micro fluid channels are machined on quartz glass using powder blasting, and the machining characteristics of the channels are experimentally evaluated. The powder blasting process parameters such as injection pressure, abrasive particle size and density, stand-off distance, number of nozzle scanning, and shape/size of the required patterns affect machining results. In this study, the influence of the number of nozzle scanning, abrasive particle size, and blasting pressure on the formation of micro channels is investigated. Machined shapes and surface roughness are measured, and the results are discussed. Through the experiments and analysis, LOC are ettectinely machined on quartz glass using powder blasting.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2009년도 하계학술대회 논문집
• /
• pp.487-487
• /
• 2009

One of the critical consumables in chemical mechanical polishing (CMP) is a specialized solution or slurry, which typically contains both abrasives and chemicals acting together to planarize films. In single abrasive slurry (SAS), the solid phase consists of only one type of abrasive particle. On the other hand, mixed abrasive slurry (MAS) consists of a mixture of at least two types of abrasive particles. In this paper, we have studied the CMP characteristics of mixed abrasive slurry (MAS) retreated by adding of $CeO_2$ abrasives within 1:10 diluted silica slurry (DSS). The slurry designed for optimal performance should produce reasonable removal rates, acceptable polishing selectivity with respect to the underlying layer, low surface defects after polishing, and good slurry stability. The modified abrasives in MAS are evaluated with respect to their particle size distribution, surface morphology, and CMP performances such as removal rate and non-uniformity. As an experimental result, we obtained the comparable slurry characteristics compared with original silica slurry in the viewpoint of high removal rate and low non-uniformity.

• 대한기계학회논문집A
• /
• 제38권9호
• /
• pp.1013-1018
• /
• 2014

자기연마가공은 연마입자와 자성입자를 혼합한 공구의 유연성을 이용하여, 공작물 표면을 폴리싱하는 특수가공법이다. 기존 연구의 대부분은 가공 정밀도를 향상시키기 위해서 연마입자의 크기를 달리 하는 것에 관한 내용들이다. 그러나 자기연마 가공에서는 연마입자의 크기뿐만 아니라, 자성입자의 크기도 가공에 많은 영향을 미칠 것으로 판단되며 이에 대한 연구가 반드시 필요하다. 따라서 본 연구에서는 크기가 다른 자성입자들을 사용하여 자기연마가공의 효과를 평가하였다. 자성입자는 철분말을 사용하였으며, 직경이 평균 8, 78, $250{\mu}m$의 크기이다. 공작물의 표면거칠기 향상 정도를 비교하여 자성입자의 크기가 자기연마가공의 정밀도에 미치는 효과를 평가하였다. 자성입자의 크기는 표면거칠기의 향상에 많은 영향을 미치며, 직경이 $78{\mu}m$일 때 가장 좋은 표면거칠기의 향상을 나타내었다.

• 한국생산제조학회지
• /
• 제7권6호
• /
• pp.97-101
• /
• 1998

In this study, The ultra-precision finishing system is applicable to all kind of the cylnderical workpiece products fast and easy. This system was applied to chrome coated steel to investigate the characteristic of grinding; (1) 3$mu extrm{m}$ of abrasive film is not use for grinding performance. (2) Grinding condition of coated chrome steel would set up differently, in 30~12${\mu}{\textrm}{m}$, in 9~5${\mu}{\textrm}{m}$. (3) The surface roughness of chrome coated steel was about Ra 0.0009${\mu}{\textrm}{m}$ in abrasive grain size 5${\mu}{\textrm}{m}$.

• 한국정밀공학회:학술대회논문집
• /
• 한국정밀공학회 2002년도 춘계학술대회 논문집
• /
• pp.520-523
• /
• 2002

The o]d technique of sandblasting which has been used for paint or scale removing, deburring, and glass decorating has recently been developed into a powder blasting technique for brittle materials, capable of producing micro structures larger than $100\mu\textrm{m}$. In this study, we investigated the effect of the size of abrasive and the stand-off distance on the machinability of SUS 304. The varying parameters were the impact angle $90^{\circ}$, scanning times of nozzle 10 and the different nozzle height between 70mm and 140mm. The diameter of dot pattern were 0.2mm. The powder were alumina sharp particles, WA #600, #800 and #2000. The blasting pressure of powder at 0.3 Mpa.

• 한국정밀공학회지
• /
• 제28권5호
• /
• pp.578-584
• /
• 2011

In mechanical cutting process, burr was generated at workpiece by cutting tool generally. It is working disturbance during manufacturing process. Besides burr was taken shape relatively large size more micro scale machining than macro scale machining. Many researches have been studied to remove micro burr(de-burring), because it was negative effect for accuracy of machining shape. However, micro de-burring was constrained by burr height, micro feature and so on. In this paper, experimental research was carried out to compare de-burring characteristics of $Al_2O_3$ abrasive and polymer.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2005년도 하계학술대회 논문집 Vol.6
• /
• pp.40-41
• /
• 2005

In this study, we proposed CMP micro-scratches generated by contaminative particle which existed on the wafer surface prior to CMP process. The CMP micro-scratches are one of the slurry abrasive related damage. To reduce the micro-scratches, research efforts have been devoted to the optimization of slurry abrasive size distribution. In addition of slurry abrasive, it was found that contaminative particles also were major CMP micro-scratch source.

• 전기전자학회논문지
• /
• 제23권4호
• /
• pp.1175-1181
• /
• 2019

논문에서는 1:10으로 희석된 실리카 슬러리에 산화망간(MnO₂) 연마제를 첨가하여 재처리된 혼합연마제 슬러리(Mixed Abrasive Slurry; MAS)의 화학기계적연마(CMP) 특성을 연구하였다. 최적의 연마 성능을 갖는 슬러리를 설계하기 위해서는 높은 연마율, 하부층에 대한 적절한 연마선택비, 연마 후의 낮은 표면결함, 슬러리의 안정성 등을 얻어야 한다. 산화망간이 첨가된 MAS의 연마 성능은 연마율 및 비균일도와 같은 CMP 성능, 입도 분석, 표면 형상에 대해 평가하였다. 실험결과, 높은 연마율과 낮은 비균일도 측면에서 볼 때 원액 실리카 슬러리와 대등한 슬러리 특성을 얻을 수 있었다. 따라서 본 연구에서 제안하는 MnO₂-MAS를 사용하면 고가의 소모재인 슬러리를 절약하는데 매우 유용할 것이다.

• 한국전기전자재료학회:학술대회논문집
• /
• 한국전기전자재료학회 2004년도 추계학술대회 논문집 Vol.17
• /
• pp.140-143
• /
• 2004

Chemical mechanical polishing(CMP) is essential technology to secure the depth of focus through the global planarization of wafer. But a variety of defects such as contamination, scratch, dishing, erosion and corrosion are occurred during CMP. Especially, dishing and erosion defects increase the resistance because they decrease the interconnect section area, and ultimately reduce the life time of the semiconductor. Due to this dishing and erosion must be prohibited. The pattern density and size in chip have a significant influence on dishing and erosion occurred over-polishing. Decreasing of abrasive concentration results in advanced pattern selectivity which can lead the uniform removal in chip and decrease of over-polishing. The fixed abrasive pad was applied and tested to reduce dishing and erosion in this paper. Consequently, reduced dishing and erosion was observed in CMP of tungsten pattern wafer with proposed fixed abrasive pad and chemicals.