• 제목/요약/키워드: a-SiO:H

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PECVD법에 의해 증착된 $SiO_2$후막 특성에서 $N_2O$/$SiH_4$Flow Ratio와 RF Power가 미치는 영향 (Effects of $N_2O$/$SiH_4$Flow Ratio and RF Power on Properties of $SiO_2$Thick Films Deposited by Plasma Enhanced Chemical Vapor Deposition)

  • 조성민;김용탁;서용곤;임영민;윤대호
    • 한국세라믹학회지
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    • 제38권11호
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    • pp.1037-1041
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    • 2001
  • 저온(32$0^{\circ}C$)에서 SiH$_4$$N_2$O 가스의 혼합을 통해 플라즈마화학기상증착(PECVD)법을 이용하여 실리카 광도파로의 클래딩막으로 사용되는 SiO$_2$후막을 제조하였다. 증착변수가 SiO$_2$후막의 특성에 미치는 영향을 살펴보기 위해 $N_2$O/SiH$_4$flow ratio와 RF power에 변화를 주었다. $N_2$O/SiH$_4$ flow ratio가 감소함에 따라 증착속도는 2.9 $mu extrm{m}$/h), 굴절률은 thermal oxide의 굴절률(n=1.46)에 근접하였다.

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Simultaneous Observations of SiO and $H_2O$ Masers toward Known Stellar $H_2O$-only Maser Sources

  • 김재헌;조세형;김상준
    • 천문학회보
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    • 제36권2호
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    • pp.145.2-145.2
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    • 2011
  • We present the results of simultaneous observations of SiO v = 1, 2, J = 1-0, $^{29}SiO$ v = 0, J = 1-0, and $H_2O$ $6_{16}-5_{23}$ maser lines toward 152 known $H_2O$-only maser sources (the sources which are previously detected only in the 22 GHz $H_2O$ maser emission) using Yonsei and Tamna 21-m radio telescopes of the Korean VLBI Network from 2009 June to 2011 January. Both SiO and $H_2O$ maser emission were detected from 62 sources giving a detection rate of 40.8 %. SiO-only maser emission was detected from 27 sources, while $H_2O$-only maser was detected from 22 sources. We have identified 19 new detections of SiO maser emission for previous non-detection sources and 51 new detections of SiO maser for previously not observed sources. Characteristics of all observed sources in the IRAS two-color diagram is investigated including their evolutionary sequence and mutual relations between SiO and $H_2O$ maser emission. These observational results will be useful for statistical study of asymptotic giant branch (AGB) stars and future VLBI observation.

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알콕사이드로부터 Si-Al-O-N계 분말합성 I. 알콕사이드로부터 Si3N4와 $\beta$-Sialon 초미분말 합성 (Synthesis of Powder of the System Si-Al-O-N from Alkoxides I. Synthesis of Si3N4 and $\beta$-Sialon Ultrafine Powders from Alkoxides)

  • 이홍림;유영창
    • 한국세라믹학회지
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    • 제24권1호
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    • pp.23-32
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    • 1987
  • Synthesis of high purity ultrafine Si3N4 and ${\beta}$-Sialon powders was investigated via the simultaneous reduction and nitriding of amorphous SiO2, SiO2-Al2O3 system prepaerd by hydrolysis of alkoxides, using carbonablack as a reducing agent. In Si(OC2H5)4-C2H5 OH-H2 O-NH4OH system, hydrolysis rate increased with increasing reaction temperature and pH. Pure ${\alpha}$-Si3N4 was formed at 1350$^{\circ}C$ for 5 hrs in N2 atmosphere. In Si(OC2H5)4-Al(OC3H7)3-C6H6-H2 O-NH4OH system, weight loss increased as Si/Al ratio decreased. Single phase ${\beta}$-Sialon consisted of Si/Al=2 was formed at 1350$^{\circ}C$ in N2 and minor phases of ${\alpha}$-Si3N4, AIN, and X-phase were existed besides theSialon phase at other Si/Al ratios. The Si3N4 and Sialon powders synthesized from alkoxides consisted of uniform find particles of 0.05-0.2$\mu\textrm{m}$ in diameter, respectively.

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Electrical Characteristics of SiO2/4H-SiC Metal-oxide-semiconductor Capacitors with Low-temperature Atomic Layer Deposited SiO2

  • Jo, Yoo Jin;Moon, Jeong Hyun;Seok, Ogyun;Bahng, Wook;Park, Tae Joo;Ha, Min-Woo
    • JSTS:Journal of Semiconductor Technology and Science
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    • 제17권2호
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    • pp.265-270
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    • 2017
  • 4H-SiC has attracted attention for high-power and high-temperature metal-oxide-semiconductor field-effect transistors (MOSFETs) for industrial and automotive applications. The gate oxide in the 4H-SiC MOS system is important for switching operations. Above $1000^{\circ}C$, thermal oxidation initiates $SiO_2$ layer formation on SiC; this is one advantage of 4H-SiC compared with other wide band-gap materials. However, if post-deposition annealing is not applied, thermally grown $SiO_2$ on 4H-SiC is limited by high oxide charges due to carbon clusters at the $SiC/SiO_2$ interface and near-interface states in $SiO_2$; this can be resolved via low-temperature deposition. In this study, low-temperature $SiO_2$ deposition on a Si substrate was optimized for $SiO_2/4H-SiC$ MOS capacitor fabrication; oxide formation proceeded without the need for post-deposition annealing. The $SiO_2/4H-SiC$ MOS capacitor samples demonstrated stable capacitance-voltage (C-V) characteristics, low voltage hysteresis, and a high breakdown field. Optimization of the treatment process is expected to further decrease the effective oxide charge density.

실리카 광도파로용 SiON 후막 특성에서 RF Power와 $SiH_4$/($N_2$O+$N_2$) Ratio가 미치는 영향 (The Effect of RF Power and $SiH_4$/($N_2$O+$N_2$) Ratio in Properties of SiON Thick Film for Silica Optical Waveguide)

  • 김용탁;조성민;서용곤;임영민;윤대호
    • 한국세라믹학회지
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    • 제38권12호
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    • pp.1150-1154
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    • 2001
  • 플라즈마 화학기상증착(PECVD)법을 이용하여 실리카 광도파막의 코어로 이용되는 규소질산화막(SiON)을 Si 웨이퍼 위에 SiH$_4$,$N_2$O, $N_2$가스를 혼합하여 저온(32$0^{\circ}C$)에서 증착하였다. Prism coupler 측정을 통해 SiON 굴절률 1.4663~1.5496을 얻었으며, SiH$_4$/($N_2$O+$N_2$) 유량비와 rf power가 각각 0.33과 150W에서 8.67$mu extrm{m}$/h의 증착률을 나타내었다. 또한 SiH$_4$/($N_2$O+$N_2$) 유량비가 감소함에 따라 SiON막의 roughness는 41~6$\AA$까지 감소하였다.

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고선택비 인산공정에서의 식각율 향상과 SiO2 재성장에 관한 연구 (Study on Improvement of Etch Rate and SiO2 Regrowth in High Selectivity Phosphoric Acid Process)

  • 이승훈;모성원;이양호;배정현
    • 한국재료학회지
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    • 제28권12호
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    • pp.709-713
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    • 2018
  • To improve the etch rate of $Si_3N_4$ thin film, $H_2SiF_6$ is added to increase etching rate by more than two times. $SiO_3H_2$ is gradually added to obtain a selectivity of 170: 1 at 600 ppm. Moreover, when $SiO_3H_2$ is added, the etching rate of the $SiO_2$ thin film increases in proportion to the radius of the wafer. In $Si_3N_4$ thin film, there is no difference in the etching rate according to the position. However, in the $SiO_2$ thin film, the etching rate increases in proportion to the radius. At the center of the wafer, the re-growth phenomenon is confirmed at a specific concentration or above. The difference in etch rates of $SiO_2$ thin films and the reason for regrowth at these positions are interpreted as the result of the flow rate of the chemical solution replaced with fresh solution.

a-, c-, m-면방향의 4H-SiC 기판에 형성된 ZnO 나노선 가스센서의 300℃에서 CO 가스 감지 특성 (CO Gas Sensing Characteristic of ZnO Nanowires Based on the a-, cand m-plane Oriented 4H-SiC Substrate at 300℃)

  • 정경환;이정호;강민석;구상모
    • 한국전기전자재료학회논문지
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    • 제26권6호
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    • pp.441-445
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    • 2013
  • ZnO nanowires on the a-, c- and m-plane oriented 4H-SiC substrates were grown by using a high temperature tube furnace. Ti/Au electrodes were deposited on ZnO nanowires and a-, c- and m-plane 4H-SiC substrates, respectively. The shape and density of the ZnO nanowires were investigated by field emission scanning electron microscope. It was found that the growth direction of nanowires depends strongly on growth parameters such as growth temperature and pressure. In this work, The sensitivity of nanowires formed a-, c- and m-plane oriented 4H-SiC gas sensor was measured at $300^{\circ}C$ with CO gas concentration of 80%. The nanowires grown on a-plane oriented 4H-SiC show improved sensing performance than those on c- and m-plane oriented 4H-SiC due to the increased density of nanowire on a-plane 4H-SiC.

CO/p a-SiC:H 계면의 버퍼층에 따른 비정질 실리콘 박막태양전지 동작특성 (Performances of a-Si:H thin-film solar cells with buffer layers at TCO/p a-SiC:H interface)

  • 이지은;장지훈;정진원;박상현;조준식;윤경훈;송진수;김동환;이정철
    • 한국신재생에너지학회:학술대회논문집
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    • 한국신재생에너지학회 2009년도 춘계학술대회 논문집
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    • pp.32-32
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    • 2009
  • 실리콘 박막 태양전지에서 전면 투명전도막(TCO)은 태양전지의 전기, 광학적 특성을 결정하는 중요한 기능을 한다. ZnO:Al TCO는 기존에 사용되던 $SnO_2:F$와는 비정질 실리콘(a-Si:H) 박막 태양전지의 윈도우 층으로 사용되는 p a-SiC:H와의 일함수(work function) 차이로 인해 접촉전위(contact barrier)를 형성하게 되며 이로 인해 태양전지의 충진율(fill factor)이 $SnO_2:F$에 비해 감소하는 단점을 보인다. 본 연구에서는 ZnO:Al/p a-SiC:H 계면의 접촉전위 발생원인 및 태양전지 충진율 감소현상에 관한 정확한 원인규명을 위해 다양한 특성을 갖는 버퍼층을 삽입하여 계면특성 및 태양전지의 동작특성을 분석하고자 한다.

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Simultaneous source frequency phase referencing observations of H2O and SiO masers toward VX Sgr

  • Yoon, Dong-Hwan;Cho, Se-Hyung;Yun, Young-Joo;Choi, Yoon Kyung;Kim, Jaeheon
    • 천문학회보
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    • 제40권2호
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    • pp.40.3-41
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    • 2015
  • We performed simultaneous observations of H2O and SiO masers toward VX Sgr using the Korean VLBI Network (KVN) and Source Frequency Phase Referencing (SFPR) method. The observations were carried out at 5 epochs from 2014 February to 2015 June. The relative locations of the SiO with respect to the H2O maser emission were determined at two epochs by SFPR for the first time. The H2O masers show well developed asymmetric outflow features which are spread up to ~300 mas in diameter. On the other hand, the SiO masers show a ring-like structure close to the central star with ~ 30 mas diameter. The SFPR observational results at two epochs (${\varphi}=0.83$ and 0.99) provide similar relative locations of H2O and SiO maser features. These superposed maps of H2O and SiO masers lead us to investigate the development of outflow motions from relatively spherical SiO maser regions close to central star to aspherical H2O maser regions according to optical phase of stellar pulsation together with the prediction of the position of central star.

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Statistical Studies Based on SiO and $H_2O$ Maser Survey toward Evolved Stars

  • 김재헌;조세형;김상준
    • 천문학회보
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    • 제37권2호
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    • pp.237.1-237.1
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    • 2012
  • We report extensive statistical analyses based on the simultaneous observational results of SiO and $H_2O$ masers toward 166 known both SiO and $H_2O$ maser sources (Kim et al. 2010), 83 known SiO maser sources (Cho & Kim 2012 submitted), and 152 known $H_2O$ maser sources (Kim et al. 2012 in preparation). We investigate mutual relations between SiO and $H_2O$ maser properties (peak and total flux density ratios, full line width ratios, and velocity structures etc.) according to stellar pulsation phases and type of evolved stars. These statistical results are compared with monitoring observational results of some individual stars. In addition, a relation between the full line width of SiO/$H_2O$ masers and stellar mass loss rates is examined. For 401 observed stars, we also investigate characteristics of SiO and $H_2O$ maser properties related with evolutionary stages in the IRAS two-color diagram.

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