• 한국전기전자재료학회논문지
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• 제22권9호
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• pp.724-727
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• 2009

We have fabricated (Ba,Sr)TiO3$TiO_3$ thick films doped with various amount of ZnBO dopants (1, 3, and 5 wt%) by screen printing method on the alumina substrates, which were sintered at the temperature below $1200^{\circ}C$. With increasing the amount of ZnBO dopants, the relative dielectric permittivity of ZnBO doped (Ba,Sr)$TiO_3$ was decreased, while loss tangent was increased. 1 wt% ZnBO doped (Ba,Sr)$TiO_3$ thick film has relative dielectric permittivity of 759 at 1 MHz, while 3 and 5 wt% of ZnBO doped (Ba,Sr)$TiO_3$ thick films have 624 and 554, respectively. By introducing ZnBO dopants to the (Ba,Sr)$TiO_3$ thick films, leakage current densities were decreased. The decreased leakage current with increasing ZnBO dopants can be explained by increased density and grain size of thick film on alumina substrate. We believe this decreased leakage current density probably come from the increased grain size and increased density.

• 한국안광학회지
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• 제13권1호
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• pp.71-76
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• 2008

목적: 저온에서 열처리에 의해 소다-라임-실리카 유리 위에 강한 UV방사 나노결정 ZnO박막을 단순하고 효율적 방법으로 개선하고자 한다. 방법: 소다-라임-실리카 유리 위에 코팅되고 전열처리 및 300$^{\circ}C$의 후열처리를 행하여 제조된 나노 결정질 ZnO 박막의 결정 구조적, 표면 형상적 및 광학적 특성을 X-선 회절 분석, 전계방사 주사형 전자 현미경, 원자간력 현미경, ultra violet - visible - near infrared spectrophotometer 및 photoluminescence를 이용하여 분석하였다. 결과: 가시광 영역에서 높은 투과율과 자외부에서 뚜렷한 흡수밴드를 갖는 c-축으로 고배향된 ZnO 박막을 300$^{\circ}C$의 후열처리를 통하여 얻을 수 있었다. 비교적 뚜렷한 near band edge 발광을 보이는 photoluminescence 스펙트럼이 나타났으며, 결함에 의한 완만한 녹색 발광은 거의 관찰되지 않았다. 결론: 앞으로 본 연구는 300$^{\circ}C$ 이하의 저온에서 저렴하고 쉽게 ZnO을 기초로한 광전기 소자에 적용될 것이다.

• 한국결정성장학회지
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• 제19권6호
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• pp.288-292
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• 2009

LPD법을 이용하여 유리 기판 위에 발수/친수 패터닝 기판을 제조하였다. 발수 표면은 거친 표면을 갖는 ZnO 박막을 FAS를 이용한 표면 개질에 의하여 만들어졌고, 친수 표면은 자외선을 조사하여 FAS를 제거함으로써 만들어졌다. Hexagonal ZnO rod는 LPD법에 의하여 ZnO seed 층이 코팅된 유리 기판 위에 수직으로 성장되었다. 침적시간이 증가함에 따라 ZnO rod의 직경과 두께는 증가하였다. 제조된 ZnO 박막의 표면구조, 두께, 결정구조, 투과율과 접촉각은 FE-SEM, XRD, UV-vis와 contact angle meter를 이용하여 측정하였다. $20^{\circ}{\sim}30^{\circ}$의 접촉각을 갖는 친수 ZnO 박막은 FAS 표면 처리에 의해 $145^{\circ}{\sim}161^{\circ}$의 접촉각을 갖는 표면으로 바뀌었다. 제조된 발수 표면은 $300\;{\mu}m$, 3 mm의 dot size를 갖는 shadow mask를 이용하여 자외선을 조사하여 패터닝 되었다. 최종적으로 자외선이 조사된 발수 표면은 친수 표면으로 바뀌었다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2005년도 추계학술대회 논문집 Vol.18
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• pp.55-56
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• 2005

The properties of phosphorus doped ZnO thin films deposited on (001) sapphire substrates by pulsed laser deposition (PLD) were investigated depending on various deposition conditions. The phosphorus (P) doped ZnO target was composed of ZnO + x wt% Al (x=1, 3, 5). The structural, electrical and optical properties of the ZnO thin films were measured by X-ray diffraction (XRD), Hall measurements and photoluminescence (PL). As the deposition temperature optimized, the electrical properties of the phosphorus doped ZnO (ZnO:P) layer showed a electron concentration of $7.76\times10^{16}/cm^3$, a mobility of 10.225 $cm^2/Vs$, a resistivity of 7.932 $\Omega$cm. It was observed the electrical property of the film was changed by dopant activation effect as target variations and deposition conditions.

• 한국전기전자재료학회논문지
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• 제19권8호
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• pp.749-753
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• 2006

The $ZnGa_2O_4$ phosphor thick films were fabricated using a screen printing method on Si(100) substrates at various sintering temperatures. The XRD patterns show that the $ZnGa_2O_4$ thick films have a (311) main peak and a spinel structure with increasing sintering temperatures. The particle sizes of $ZnGa_2O_4$ phosphor were about 100 nm and the thickness of $ZnGa_2O_4$ thick film was $10{\mu}m$. The CL and PL properties of $ZnGa_2O_4$ showed main peak of 420nm and maximum intensity at the sintering temperature of $900^{\circ}C$. These results indicate that $ZnGa_2O_4$ phosphor thick films hold promise for displays such as plasma display panel and field emission display.

• 마이크로전자및패키징학회지
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• 제25권2호
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• pp.31-34
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• 2018

차세대 유연 광전소자 적용을 위한 금속-산화물 샌드위치 구조인 ZnO/Al/ZnO 박막의 유연투명전극 기초연구를 수행하였다. 모든 증착은 유연성을 가지는 PET 기판 상에서 이루어졌으며, 상 하부 ZnO층의 두께가 광 투과도에 미치는 영향을 확인하기 위하여 Al 층의 두께는 모두 8 nm로 고정시킨 채 상부 ZnO 층의 두께는 5-70 nm, 하부 ZnO 층의 두께는 2.5-20 nm까지 변화를 주었다. 가시광선영역(380 nm-770 nm) 파장대를 가지는 광원의 투과도에 대하여 측정한 결과, 상부 ZnO 층의 두께가 30 nm이며 하부 ZnO 층의 경우 2.5 nm 일 때 가장 높은 투과도를 보였다. 400 nm 파장기준 투과도 62%, 면저항 $19{\Omega}/{\Box}$, 그리고 곡률반경 5 mm 조건에서의 휨 테스트 후 면저항과 투과도의 변화가 발생하지 않는 ZnO/Al/ZnO 유연투명전극 결과를 보고한다.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2008년도 추계학술대회 논문집 Vol.21
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• pp.256-256
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• 2008

We report epitaxial growth of ZnO thin films on (100) single-crystalline $LaAlO_3$ (LAO) substrates using pulsed laser deposition (PLD) at different substrate temperatures (400~$800^{\circ}C$). The structural and electrical properties of the films have been investigated by means of X-ray diffraction (XRD), atomic force microscope (AFM), transmission line method (TLM). The poly-crystalline of $\alpha$- and c-axis oriented ZnO film was formed at lower deposition temperature ($T_s$) of $400^{\circ}C$. At higher $T_s$, however, the films exhibit single-crystalline of $\alpha$-axis orientation represented by ZnO[$\bar{1}11$ || LAO <001>. The electrical properties of ZnO thin films depend upon their crystalline orientation, showing lower electrical resistivity values for $\alpha$-axis oriented ZnO films.

• 한국전기전자재료학회:학술대회논문집
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• 한국전기전자재료학회 2006년도 하계학술대회 논문집 Vol.7
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• pp.144-145
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• 2006

ZnO is a promising material to make high efficiency violet or blue light emitting diodes (LEDs) for its large binding energy (60meV) and big bandgap. But the high quality p-type conduction of ZnO is a dilemma to achieve LEDs with it. In present study, we presented a reliable method to prepare ZnO thin films on (100)silicon substrates by RF magnetron sputtering in the mixture ambient of $N_2$ and $O_2$, accompanying with low pressure annealing in the sputtering chamber in $O_2$ at $600^{\circ}C$ and $800^{\circ}C$ respectively. X-ray diffraction and Hail effect with Van der Paul method were performed to test ZnO films. Seeback effect was also carried out to identify carrier types in ZnO films and showed the N-doped ZnO film annealed at $800^{\circ}C$ had achieved p-type conduction.

• 한국정보디스플레이학회:학술대회논문집
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• 한국정보디스플레이학회 2008년도 International Meeting on Information Display
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• pp.1251-1254
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• 2008

ZnO:Zn films have been deposited on the glass substrates using thermal vapor deposition method. Different morphologies such as ZnO slice, pillar and nanorod have been derived. The relationship between photoluminescence and morphology has been studied. Photocatalytic activity has been performed to validate that defects play an important role in the photoluminescence process.

• 한국전기전자재료학회논문지
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• 제21권6호
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• pp.499-502
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• 2008

In this work, Ga-doped ZnO (GZO) thin films for gas sensor application were deposited on low temperature co-fired ceramics (LTCC) substrates, by RF magnetron sputtering method. The LTCC substrate is one of promising materials for this application since it has many advantages (e.g., low cost production, high manufacturing yields and easy realizing 3D structure etc.). The LTCC substrates with thickness of $400\;{\mu}m$ were fabricated by laminating 12 green tapes which consist of alumina and glass particle in an organic binder. The structural properties of the fabricated GZO thin film with thickness of 50 nm is analyzed by X-ray diffraction method (XRD) and field emission scanning electron microscope (FESEM). The film shows good adhesion to the substrate. The GZO gas sensors are tested by gas measurement system and show fast response and recovery characteristics to $NO_x$ gas that is 27.2 and 27.9 sec, recpectively.