• Proceedings of the Korean Nuclear Society Conference
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• 1995.05a
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• pp.925-930
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• 1995

A new approach on the correction for Compton escape component in X-ray unfolding algorithm was investigated to obtain more accurate X-ray source spectrum. The X-ray detector used in this study was a planar type HPGe detector(EG&G ORTEC, GLP-32340/13-P-LP) whose energy response has been blown and ISO narrow beam series were employed as source spectrum. At lower energy Part of measured X-ray spectrum including the correction for Compton escape component more accurate unfolded spectrum was obtained by letting down the starting energy level of the collection in existing spectrum correction procedure to consider multiple scattering effects. It is, from this study, concluded that accurate correction for Compton escape component is needed in X-ray unfolding procedure since Compton scattering becomes more important as incident X-ray energies increase.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.02a
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• pp.181-181
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• 2013

Recently, nanostructure and the molecular orientation of organic thin films have been largely paid attention due to its importance in organic electronics such as organic thin film transistors (OTFTs), organic light emitting diodes (OLEDs), and organic photovoltaics (OPVs). Among various methods, the diffraction and scattering techniques based on synchrotron x-rays have shown powerful results in organic thin film systems. In this work, we introduce the in-situ annealing system installed at PLS-II (Pohang Light Source II) for organic thin films by simultaneously conducting various x-ray scattering measurements of x-ray reflectivity, conventional x-ray scattering, grazing incidence wide angle x-ray scattering (GI-WAXS) and so on. Using the in-situ measurement, we could obtain real time variation of nanostructure as well as molecular orientation during thermal annealing in metal-phthalocyanine thin films. The variation of surface and interface also could be simultaneously investigated by the x-ray reflectivity measurement.

• Tuberculosis and Respiratory Diseases
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• v.40 no.4
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• pp.353-356
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• 1993

Advent of new imaging modalities such as computed tomography, magnetic resonance imaging and ultrasound contributed greately to the specific imaging diagnosis. However plain chest X-ray is still most prequently used for imaging diagnosis of respiratory disease in clinical pratic and it is important to make a good quality of X-ray film and good interpretation. The optimal chest X-ray should be taken with full inspiration without rotation and motion and the exposure is at the level of barely demonstrable thoracic vertebral disc space. It is recommended that higk KVP technique for detection of lesions which is overlaped by mediastinum, heart and rib cage. It is better to examine chest X-ray film start at some distance(6-8 feet) and closer to the film later on and the reader should not read a film in fatigue condition. The reading room should be quiet and relately dark illumination. It is important, to make a good X-ray film and good interpretation to reduce the observer error.

• Proceedings of the Korean Institute of Electrical and Electronic Material Engineers Conference
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• 2003.05a
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• pp.84-87
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• 2003

The interfacial diffusion in Fe/Cr/MgO(001) multilayers has been studied using synchrotron x-ray techniques, such as x-ray reflectivity, extended x-ray absorption fine structures (EXAFS), and anomalous x-ray scattering (AXS). The results of x-ray reflectivity indicated that the interfacial roughness of Fe/Cr multilayers with Cr-$4{\AA}$-thick was larger than that with Cr-$4{\AA}$-thick. The results of EXAFS indicated that the Fe element dominantly diffuse into the stable Cr layers at the Fe/Cr interface. The AXS was certified the existence of the interdiffused Fe element in the Cr layers. Our study revealed that the rough interface of the Fe/Cr multilayers was caused by the interfacia diffusion of Fe element into the Cr layers.

• Bulletin of the Korean Chemical Society
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• v.25 no.11
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• pp.1676-1680
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• 2004

We demonstrate that wide-angle X-ray scattering pattern from photoactive yellow protein (PYP) in solution using a high flux third generation synchrotron X-ray source reflects not only the overall structure, but also fine structures of the protein. X-ray scattering data from PYP in solution have been collected in q ranges from 0.02 ${\AA}^{-1}$ to 2.8 ${\AA}^{-1}$. These data are sensitive to the protein structure and consistent with the calculation based on known crystallographic atomic coordinates. Theoretical scattering patterns were also calculated for the intermediates during the photocycle of PYP to estimate the feasibility of time-resolved wide-angle X-ray scattering experiments on such proteins. These results demonstrate the possibility of using the wide-angle solution X-ray scattering as a quantitative monitor of photo-induced structural changes in PYP.

• Journal of Communications and Networks
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• v.15 no.6
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• pp.547-558
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• 2013

Ultra broadband communication systems operated at THz frequencies will require the thorough knowledge of the propagation channel. Therefore, an extensive measurement campaign of 50 GHz wide indoor radio channels is presented for the frequencies between 275 and 325 GHz. Individual ray paths are resolved spatially according to angle of arrival and departure. A MIMO channel is recorded in a $2{\times}2$ configuration. An advanced frequency domain ray tracing approach is used to deterministically simulate the THz indoor propagation channel. The ray tracing results are validated with the measurement data. Moreover, the measurements are utilized for the calibration of the ray tracing algorithm. Resulting ray tracing accuracies are discussed.

• Carbon letters
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• v.4 no.1
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• pp.10-13
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• 2003

The structural studies of amorphous isotropic carbon prepared from pyrolysis of phenol formaldehyde resin have been carried out using X-ray diffraction. X-ray diffraction from as prepared sample at $1000^{\circ}C$ and a sample treated at $1900^{\circ}C$ revealed that both are amorphous even though there are small differences in short range order. It is found that both are graphite like carbon (GLC) with predominantly $sp^2$ hybridization. Small angle X-ray scattering results show that as prepared sample mainly consists of thin two dimensional platelets of graphitic carbon whereas they grow in thickness to become three dimensional materials of nano dimensions.

• Journal of the Korean Institute of Electrical and Electronic Material Engineers
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• v.24 no.8
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• pp.647-653
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• 2011

In this study, a method to measure the thickness of thin film by EDS (energy dispersive spectroscopy) is suggested. We have developed a model which calculates the thickness of thin film from the characteristic x-ray intensity ratio of the elements in thin film and substrate by considering incident electron beam energy, x-ray generation curve, backscattering and absorption of x-ray, take-off angle of x-ray and tilt angle of the sample. We obtained the relation curve between the film thickness measured experimentally and the x-ray intensity ratio of elements. The film thicknesses calculated from the model agrees quite well with those measured experimentally. Therefore, the thin film thickness can be measured rapidly and accurately by using the model developed in this study and the x-ray intensity ratio obtained in EDS analysis.

• The Transactions of The Korean Institute of Electrical Engineers
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• v.66 no.6
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• pp.942-948
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• 2017

Ray-tracing based method for computing projection image calculates the exact amounts of the intersection between voxels and a ray. Among several different implementations of the ray tracing based methods, Siddon's method is the earliest one. Later faster implementation such as Jacobs's method, Zhao's method, were investigated. To our knowledge, Zhao's method is the fastest one among these. We improve the speed of the Zhao's method by predicting the number of the same intersection length between voxel and a ray. In our experiment, the proposed method showed significantly faster computation speed than Zhao's method.

• Journal of radiological science and technology
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• v.20 no.2
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• pp.28-33
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• 1997

For the Evaluation of X-ray image intensifier, we measured radiation dose at input of I. I., brightness and fluorescence at output of I. I. by using X-ray exposure meter, optometer and fluorescence meter for the relative conversion factor. Especially, by using fluorescence meter, we could easily get relative conversion factor without having regulated machine by JIS. Since using, the quality of image intensifier is going down. Consequently, it needs continuous quality maintenance.