• KSCE Journal of Civil and Environmental Engineering Research
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• v.26 no.1B
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• pp.107-111
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• 2006

The samples collected from two reactors are analyzed by X-ray diffraction and M$\ddot{o}$ssbauer spectroscopy in this study. It is concluded that the iron oxide crystal attached on anthracite media which possesses catalytic ability is identified to be Ferrihydrite, regardless of the value of pH from the analysis of the iron oxide. Iron oxide in Batch reactor is identified to be Microcrystalline goethite.

• Transactions of the Korean Society of Automotive Engineers
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• v.10 no.6
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• pp.150-157
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• 2002

In textured material, diffraction angle $2{\theta}$ usually shows a nonlinear relation against $sin^2{\psi}$ due to elastic anisotropy of crystals. SPHD and SPCD steel is cold-rolled carbon steel for automobile. The characteristics X-ray for stress measurement is Cr $K_{\alpha}\;and\;Mo\;K_{\alpha}$ characteristic X-ray. The $2{\theta}-sin^2{\psi}$ diagram under elastic strain seems to have a linear behavior using regression line of data but has a nonlinear behavior in distribution of data by Cr $K_{\alpha}$ characteristic X-ray. As the plastic strain of specimen increases, the nonlinearity of $2{\theta}$ with respect to $sin^2{\psi}$ increases remarkably. On the other hand, the diffraction angle $2{\theta}$ by Mo $K_{\alpha}$ characteristic X-ray shows a good linearity on $2{\theta}-sin^2{\psi}$ diagram under plastic strain as well as elastic strain. Therefore, this paper presents the measurement of residual stress in cold-rolled carbon steel for automobile using penetration depth of Mo $K_{\alpha1}$ characteristic X-ray and multiplicity factor of crystal diffraction plane.

• Journal of the Mineralogical Society of Korea
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• v.21 no.3
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• pp.307-312
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• 2008

Rietveld analysis using synchrotron X-ray powder diffraction data collected at 15 K reveals that CFC-13 ($CF_{3}Cl;$ chlorotrifluoromethane) sorbed on Na,K-LSX binds through fluorine to sodium ions around the single 6-ring aperture in the supcrgage.

• Journal of Energy Engineering
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• v.23 no.3
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• pp.13-16
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• 2014

We have surveyed on significant progress in recent developments of accelerator-based pulsed X-ray sources has offered the opportunity for time-resolved studies on fast structure dynamics on the nanometer scale. The required and currently available techniques for time resolved X-ray diffraction measurements using the third-generation synchrotron radiation sources are summarized. Ultrafast X-ray experimental techniques are discussed for femtosecond studies at future synchrotron radiation sources.

• Journal of the Korean Crystal Growth and Crystal Technology
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• v.7 no.2
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• pp.197-206
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• 1997

A SiC epilayer on the 6H-SiC crystal substrate was grown by chemical vapor deposition (CVD). The crystal structure of the SiC epilayer was investigated by using the X-ray diffraction patterns and the Roman scattering spectroscopy. The SiC epilayer on the 6H-SiC substrate was grown to be homoepilayer by CVD. In order to distinguish a certain SiC polytype mixed in the SiC crystal grown by the modified Lely method, we have calculated the X-ray diffraction intensities and Brags angles of the typical SiC crystal powders. By comparing the measured X-ray diffraction pattern with the calculated ones, it was identified that the SiC crystal grown by the modified Lely method was the 6H-SiC crystal mixed some 15R-SiC.

• Analytical Science and Technology
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• v.5 no.4
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• pp.409-415
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• 1992

Factor analysis was applied to X-ray diffraction patterns of the precursor of $BaTiO_3$. For that purpose, the precursor was synthesized in water solvent system using $Ba(NO_3)_2$ and $TiO(NO_3)_2$ as the starting materials and calcined at various temperatures. The samples obtained from the various calcined temperatures were analyzed by the X-ray diffractometer. Factor analysis was applied to the intensity data of the X-ray diffraction patterns. As the results, three factors were found and they were found to be $BaCO_3$, $BaTiO_3$ and $Ba_2TiO_4$. The relative concentrations of the three components were estimated during calcination.

• Analytical Science and Technology
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• v.20 no.6
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• pp.502-507
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• 2007

X-ray diffraction method has been widely used for qualitative and quantitative analysis of a mixture of materials since every crystalline material gives a unique X-ray diffraction pattern independently of others, with the intensity of each pattern proportional to that material's concentration in a mixture. For determination of mixing ratios, extracting source spectra correctly is important and crucial. Based on the source spectra extracted, a regression model with non-negativity constraint is applied for determining mixing ratios. In some mixtures, however, X-ray diffraction spectrum has sharp and narrow peaks, which may result in partial negative source spectrum from independent component analysis. We propose several procedures of extracting non-negative source spectra and determining mixing ratios. The proposed method is validated with experimental data on powder mixtures.

• Korean Journal of Mineralogy and Petrology
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• v.34 no.4
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• pp.227-239
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• 2021

A practical and effective method of X-ray powder diffraction analysis was investigated for quantitative analysis of the mineral content of natural samples. Sample mounting experiments were conducted to select the best randomly oriented powder sample mount. A comparative experiment was also made between a reference intensity ratio (RIR) method, which compares a single peak intensity with standard material, and the Rietveld method, which calculates a full X-ray diffraction pattern, to search for the effective method of mineral quantification. In addition, samples containing amorphous minerals were quantitatively analyzed by the Rietveld method and the efficiency was reviewed. As a result of the study, the optimal random orientation could be reached by the side mounting method. The Rietveld method using the full pattern of X-ray diffraction was more suitable for mineral quantitative analysis, rather than the RIR method using a specific peak. However, either method could depend on the analyst's experience in addition to analytical technique. Moreover, amorphous minerals can be quantitatively analyzed by the Rietveld method, and the analysis results make the geological analysis possible.

• Proceedings of the Korean Vacuum Society Conference
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• 2013.08a
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• pp.238-238
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• 2013

사파이어 단결정은 광학 투명도, 물리적 강도, 충격 저항, 마모 부식, 높은 압력 및 온도 내구성, 생체 호환성 등 다양한 특성을 가지고 있어 다양한 분야에서 사용되고 있으며, 특히 최근에는 백색 또는 청색 LED 소자 분야에서 기판으로 주로 활용되고 있다. 이러한 사파이어 단결정 기판은 공정에서 결정 성장 조건 및 기계적 연마 등의 다양한 요인으로 결정학적 결함이 발생한다. 이러한 결정학적 결함을 제어함으로서 좋은 품질의 단결정 기판을 생산할 수 있다. 이에 따라 각종 결함 제어를 위해서 X-선, EPD, 레이저 편광법 등 다양한 방법으로 결함들을 측정하고 있다. 그 중에서도 X-선 토포그래피는 시료를 비파괴적인 방법으로 단결정의 결함 밀도와 유형 등을 파악하는데 매우 유용한 측정법이며, Lang 토포그래피로 대표되는 X-선 회절 투과법은 기판과 같은 대구경의 시료를 우수한 분해능으로 내부 결함까지 관찰할 수 있는 장점을 지니고 있다. 본 연구에서는 대구경 사파이어 단결정 기판에 내재하는 결정 결함을 확인 및 분석하기 위해 X-선 Lang 토포그래피(X-ray Lang Topography) 장비를 구축하였다. 그리고 4, 6인치 c-면 사파이어 단결정 기판의 (110), (102) 회절면의 X-선 토포그래피 측정을 통해 전위(dislocation), 스크래치(scratch), 표면데미지(surface damage), 트윈(twin), 잔류 응력(strain) 등의 결함의 유형을 식별 및 분석하였으며, 각각의 결함들의 토포그래피 이미지 형성 메커니즘에 대해 분석하였다. 이를 통해 X-선 Lang 토포그래피(X-ray Lang Topography) 장비가 대구경 사파이어 단결정 기판의 결정 결함 평가에 폭넓은 활용이 가능할 것으로 예상된다.

• Korean Journal of Crystallography
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• v.7 no.1
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• pp.20-29
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• 1996

Sr0.6Ca0.4CuO2 single crystal has been synthesized by flux method and characterized by the single crystal X-ray diffraction. The compound has the orthorhombic system and the space group is Cmcm(63), lattice parameters are a=3.4645Å, b=16.1417Å, c=3.8727Å. In the (Sr1-xCax)CuO2 compound the limit of Ca from substitution for Sr was determined by the change of bond length. For this, X-ray diffraction, scanning electron microscopy (SEM), energy dispersive X-ray fluorescence (EDAX) and electron probe micro-analysis (EPMA) were used. From the change of Cu-O bond length as the Ca substitution, we concluded the limit of Ca incorporation Xca≒0.73.