• Journal of the Korea Academia-Industrial cooperation Society
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• v.18 no.10
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• pp.97-101
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• 2017

X-ray diffractometers are used to characterize material properties, such as the phase, texture, lattice constant and residual stress, based on the diffracted beams obtained from specimens. Quantitative analyses using X-rays are typically conducted by measuring the peak positions of the diffracted beams. However, the long-term use of the diffractomer, like any other machine, results in errors associated with the mechanical parts, which can deteriorate the accuracy of the quantitative analyses. In this study, the process of correcting systematic errors in the $2{\theta}$ range of $30{\sim}90^{\circ}$ is discussed, for which strain-free Si powders from NIST were used as the standard specimens. For the evaluation of the impact of such error correction, we conducted a quantitative analysis of the true lattice constant for tungsten thin films.

• Journal of the Mineralogical Society of Korea
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• v.20 no.4
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• pp.351-356
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• 2007

The crystal structure of $Li(ND_4)SO_4$ was analyzed by X-ray and neutron diffraction methods. The crystal is a deuterated $Li(NH_4)SO_4$ and one of the ferroelectric materials with hydrogen atoms. The crystal is orthorhombic at room temperature, $P2_1nb$, with lattice parameters of $a=5.2773(5)\;{\AA},\;b=9.1244(23)\;{\AA},\;c=8.7719(11)\;{\AA}$ and Z=4. Neutron intensity data were collected on the Four-Circle diffractometer (FCD) at HANARO in Korea Atomic Energy Research Institute and X-ray date were given by Prof. Y. Noda of Tohoku University Japan. The structure was refined by full-matrix least-square to final R value of 0.070 for 1450 observed reflections by X-ray diffraction and to final R=0.049 for 745 observed reflections by neutron diffraction. With X-ray data we obtained only one hydrogen atomic position. However, not only all atomic positions of four hydrogen atoms at $NH_4$ but also the occupation factors of D and H were refined with neutron data. From this results we obtained the average chemical structure of this sample, $LiND_{3.05}H_{0.95}SO_4$.

• Journal of the Korean Vacuum Society
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• v.10 no.1
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• pp.93-97
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• 2001

We introduce the structure and the capability of a UHV x-ray scattering system constructed for surface structural studies. The system consists of vacuum parts required for surface preparation and a vertical-horizontal diffractometer using the S2D2 geometry. To illustrate the capability of the system, we measured the 7$\times$7 reconstruction peak of a Si (111) surface. The peak count rate was 216 counts/sec and the domain size of the 7$\times$7 reconstruction was larger than 1600 $\AA$. This demonstrates that the system is capable of providing surface structural information.

• Composites Research
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• v.18 no.2
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• pp.38-45
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• 2005

Phase transformation behaviors and crystal structures of Nitinol shape memory alloy $(54.5Ni-45.5Tiwt\%)$ are investigated by varying annealing heat treatment conditions through DSC (Differential Scanning Calorimetry) and XRD (X-Ray Diffraction). Annealing heat treatment conditions were considered as heat treated times of 5min, 15min. 30m1n, and 45min, as well as heat treated temperatures of $400^{\circ}C,\;500^{\circ}C,\;525^{\circ}C,\;550^{\circ}C,\;575^{\circ}C,\;600^{\circ}C,\;700^{\circ}C,\;800^{\circ}C,\;and\;900^{\circ}C$ According to the results, annealing heat treatment conditions such as heat treated times and heat treated temperatures were found to affect significantly on phase transformation behaviors and crystal structures of Nitinol shape memory alloy.

• Electrical & Electronic Materials
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• v.6 no.6
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• pp.565-572
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• 1993

LPE(liquid phase epiraxy)법으로 성장시킨 $Al_{x}$ Ga$_{1-x}$As (0.15.leq.x.leq.0.67) 에피층의 구조적 특성을 이중결정 X-선 회절장치를 사용하여 조사하였다. GaAs기판과 $Al_{x}$ Ga$_{1-x}$As 에피층의 격자상수 차이로 인해 피이크가 분리되었고 이는 조성비가 증가함에 따라 선형적으로 증가하였다. 그리고 조성비는 Vegard의 법칙으로 구한 값과 기판 및 에피층 피이크 사이 각도분리(.DELTA..theta.)를 측정함으로써 구한 값이 일치하였으며 이때 관계식은 .DELTA..theta.=354.x을 얻었다. 또한 성장된 에피층은 compressive stress를 받고 있으며 조성비(x)가 0.15에서 0.67로 증가함에 따라 응력은 증가하였으며 그리고 피이크의 반치폭으로 부터 계산된 전위밀도가 역시 증가하였다.

• Journal of the Korean Society of Radiology
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• v.6 no.6
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• pp.477-481
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• 2012

An X-ray diffractometer which has various X-ray optics can give qualitative and quantitative information for a sample using a nondestructive analysis method. A parallel beam optic passes the parallel beam and removes divergent beam generated from an X-ray tube. The parallel beam optic used in the X-ray diffractometer was fabricated by wire cut and grading of stainless steel plates and was evaluated its performance using an X-ray imaging system. The measured parallelization of 6.6 mrad for the fabricated the parallel beam optic was a very close to the expected value of 6 mrad. An X-ray imaging technique for evaluating the parallel beam optics can estimate parallelization for each plate and can be used to other X-ray optics.

• Electrical & Electronic Materials
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• v.5 no.3
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• pp.295-301
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• 1992

본 연구는 고분자 압전 재료인 PVDF 필름을 시료로 사용하고 분극 조건을 변화시켜 가며 분극화 시킨후 압전계수를 측정하였다. 또한 X-선 회절 장치와 DSC 장치를 이용하여 결정구조 변화를 조사하였으며 또한 분극에 의해 생성된 결정의 용융특성도 관찰하였다. 분극되지 않은 시료의 용융 온도는 약 175.deg.C 부근에서 나타났으나 분극된 시료는 분극 전압이 증가함에 따라 184.deg.C부근에서 새로운 용융점이 나타나기 시작하였으며 분극 전압이 증가할수록 새로운 용융점이 점차 뚜렷해졌다.

• Korean Journal of Crystallography
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• v.4 no.1
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• pp.25-35
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• 1993

Tetra-tert-butyl-tetrapropionycalix (4) arena (C56H7208) is Triclinic, space group Pl, with a=13.664(5), b=17.585(5), c=12.863(2)A, a=109.33(2), B=111.97(2), γ=76.45(3) ˚, Z=2, V=2684.08A3, D, =1.152g/cm3, Dm=1.15g/cm3. The intensity data were collected on an Enraf-Nonius CAD-4 Diffractometer with a graphite monochromated Mo-Ka radiation. The structure was solved by direct methods and refined by leastsquares methods. The final R factor was 0.084 for 2561 observed reflections. The configuration of the molecule from the X-ray crystallographic investigation has the partial cone conformation, three tort-butylphenyls are down and a tort-butylphenyl is up. Three propionyloxy groups direct toward the exterior of the macrocycle cavity.

• Korean Journal of Crystallography
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• v.6 no.2
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• pp.80-87
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• 1995

The structure of Tetrapropionyloxycalix[4]arene(C40H40O8) has been studied by X-ray diffraction method. The crystal is monoclinic a=13.921(3), b=13.552(2), c=19.840(5)Å, β=110.38(2)°, Z=4 T=297K, Dc=1.23gcm-3, F(000)=1376, Systematic absences : hkl none, h0l : h+l=2n, 0k0: k=2n define space group P21/n. The structure was solved by direct method and refined by full-matrix least-squares methods to final R of 0.06 for 2514 observed reflections. The macrocycle exists in partial cone conformation. Three propionyl groups direct toward the exterior of the macrocycle cavity.

• Proceedings of the Korea Crystallographic Association Conference
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• 2003.05a
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• pp.23-23
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• 2003

Cu 단결정과 다결정 Cu 막대(rod)를 시료로 하여 구부린 완전결정(bent perfect crystal, BPC)을 이용한 중성자 단색기의 특성을 평가함으로써 단결정 회절 및 집합조직 측정장치인 4축 단결정 회절장치(FCD)에 BPC 단색기를 적용할 수 있는지 시험하였다. 측정은 한국원자력연구소의 연구용 원자로인 하나로의 571 수평공에 구성된 test station에서 수행하였다. 단색기와 시료 사이의 거리는 3000mm, 시료와 검출기 사이는 600mm, 단색화빔 인출각도(2θ/sub M/)는 44.6°로 고정하여 FCD와 거의 같은 배치를 구현하였다 직사빔의 단면분포와 강도는 저효율 2차원 위치민감형 검출기(2-D PSD)를 이용하여 확인하였다. 이 검출기는 검출면적 90x90㎟, 공간 분해능 1.2mm, 검출효율 약 1%인 저효율 검출기이다. 회절빔은 검출면적 190x190㎟, 검출효율은 1Å에서 60%인 고효율 2-D PSD를 이용하여 측정하였다. Cu 단결정 측정에 사용한 ePC 단색화 결정은 200×40×3.4㎣ 크기의 Si(220) 슬랩이며, 비대칭 기하로 Si(331)면을 사용하여 파장 λ=0.954Å으로 중성자빔을 단색화시켰다. BPC-Si를 구부려 슬랩의 곡률반경을 변화시키면서 단색기-시료-검출기가 평행배치일 때 Cu(200), (220), (400), (420)면의 rocking curve를 측정하여 각 조건에서의 분해능과 강도를 평가하였다. BPC 단색기를 집합조직 측정에 적용할 수 있는지 시험하기 위하여 다결정 Cu 막대(직경 4.5mm, 길이 18mm)를 시료로 선택하였다. 207x30x3.0㎣ 크기의 Si 슬랩을 단색화 결정으로 사용하였다. 이 슬랩은 다양한 결정면을 이용한 특별한 기하를 구현할 수 있도록 Si(111)면에서 10° 벗어난 면을 절단한 것이다. 비대칭 기하로 Si(311)면을 사용하여 파장 λ=1.253Å의 단색화된 중성자빔으로 측정하였다 BPC-Si를 구부려 슬랩의 곡률반경을 변화시키면서 단색기-시료-검출기가 평행파 반평행배치일 때 Cu(111), (200), (220), (311), (331), (420)면의 회절선을 측정하여 각 조건에서 분해능과 강도를 평가하였다.