• Journal of the Institute of Electronics and Information Engineers
• /
• v.50 no.8
• /
• pp.162-167
• /
• 2013

X-ray or ${\gamma}$-ray spectroscopy systems are widely used for analyzing material characteristics. Pile-up pulses are very often encountered for several reasons in XRF systems. Thus, it is necessary to reject or recover pile-up pulses to accurately analyze the material under test. In this paper, a pile up pulse rejection and recovery method is presented for XRF systems using trapezoidal pulse shaping of the input signals. Since the proposed method is based on the trapezoidal pulse shaping method widely-used in XRF systems, only two counters and a few registers are needed to implement the additional function of pile-up pulse rejection and recovery. Consequently, the proposed system is much simpler than conventional pulse reconstruction systems. It is shown that the proposed method can detect and reject pile-up pulses exactly. It is also shown that the pile-up pulses can be recovered if some conditions are satisfied.

• Magazine of the Korea Concrete Institute
• /
• v.19 no.2
• /
• pp.55-60
• /
• 2007

• Journal of Radiation Protection and Research
• /
• v.23 no.1
• /
• pp.33-47
• /
• 1998

Using a combination of an X-ray generator Installed in radiation calibration laboratory of Korea Atomic Energy Research Institute (KAERI) and a series of 8 radiators and filters described in ISO-4037, monoenergetic fluorescent X-rays from 8.6 keV to 75 keV were produced. This fluorescent X-rays generated by primary X-rays from radiator were discriminated $K_{\beta}$ lines with the aid of filter material and the only $K_{\alpha}$ X-rays were analyzed with the high purity Ge detector and portable MCA. The air kerma rates were measured with the 35 co ionization chamber and compared with the calculational results, and the beam uniformity and the scattered effects of radiation fields were also measured. The beam purities were more than 90 % for the energy range of 8.6 keV to 75 keV and the air kerma rates were from 1.91 mGy/h (radiator : Au, filter : W) to 54.2 mGy (radiator : Mo, filter : Zr) at 43 cm from center of the radiator. The effective area of beam at the measurement point of air kerma rates was 12 cm ${\times}$ 12 cm and the influence of scattered radiation was less than 3 %. The fluorescent X-rays established in this study could be used for the determination of energy response of the radiation measurement devices and the personal dosemeters in low photon energy regions.

• Journal of the Korean Vacuum Society
• /
• v.8 no.1
• /
• pp.13-19
• /
• 1999

Total reflection X-ray fluorescence spectroscopy using synchrotron radiation source called as TRSFA was explored to achieve high sensitivities to impurity metals on Si wafer surface. It consists of monochromating part to select a specific wavelength, slit part to shield direct beam and to control monochromated beam, and main chamber to dectect fluorescent X-ray counts of impurities on si wafer. Monochromated X-ray of 10.90 KeV was selected and the optimum total reflection condition on silicon wafer was obtained through tuning the dead time and fluorescent X-ray count of Si and Fe. TRSFA system could increase the sensitivity as high as 50 times in comparision with TRXFA using normal X-ray source. But the trend was varied since the surface conditions of Si wafers and, therefore, the reflectivities were different. Furthemore, there seems to be a promising path to reaching a detection limit useful to the next generation metal impurities control, because Fe impurity below to the $5\times10^{9}\textrm{atomas/cm}^2$ can be detectable through the developed TRSFA system.

• New Physics: Sae Mulli
• /
• v.68 no.12
• /
• pp.1308-1314
• /
• 2018

$Er^{3+}$ and $Yb^{3+}$ co-doped $Y_3Ga_5O_{12}$ polycrystalline powders were prepared by using a solid-state reaction method, and their crystallinities were measured using X-ray diffraction. According to the results of X-ray diffraction, the powders showed a polycrystalline tetragonal structure. The photoluminescence and the upconversion luminescence properties of the $(Y_{0.85-x}Yb_{0.15})_3Ga_5O_{12}:Er^{3+}_x$ (x = 0.03, 0.06, 0.09, 0.12 and 0.15) phosphors were investigated in detail. Green and red upconversion emissions were observed for the phosphors excited by 980 nm radiation from a semiconductor laser. The powders exhibited strong green and weak red upconversion emission peaks at 553 and 660 nm, respectively. Also, their upconversion processes were explained using an energy-diagram analysis and the strongest upconversion intensity was emitted by the powder with a 0.12 mol $Er^{3+}$ ion concentration.

• The Journal of the Petrological Society of Korea
• /
• v.19 no.4
• /
• pp.245-254
• /
• 2010

Technology of surface investigation using X-ray is one of widely used technology nowadays. This technique has been numerously used for planetary surface investigations for both orbital and rover scientific instruments. Korea has a plan to send an orbiter and lander to the Moon by the early 2020s. Therefore, the time has come for Korean researchers to develop major scientific instruments and start to do research on basic research for the Moon. Because of this situation, we firstly investigate X-ray technology, which is essential as one of core techniques of planetary remote sensing from the orbit and ground. This paper presents the current status of planetary exploration using X-ray techniques and new development of worldwide X-ray technology which could be adapted for prospective planetary missions.

• Proceedings of the Korean Vacuum Society Conference
• /
• 2015.08a
• /
• pp.185.1-185.1
• /
• 2015

본 연구에서는 라디오파 마그네트론 스퍼터링 방법을 사용하여 증착 온도를 변화시켜면서 Eu 이온이 도핑된 MgMoO4 적색 형광체 박막을 사파이어 기판 상부에 성장하였다. 타겟은 고상반응법을 사용하여 직접 제작하였다. 형광체 박막의 구조, 표면, 광학적 특성은 X-선 회절장치, 주사전자현미경, 투과도 및 광여기발광 측정장치를 사용하여 측정하였다, 증착 온도는 100, 200, 300, $400^{\circ}C$이었으며, 증착 후 $870^{\circ}C$에서 열처리 공정을 실행하였다. 이와 더불어, $400^{\circ}C$에서 증착한 박막을 다양한 온도 $770-920^{\circ}C$에서 열처리를 수행하여 각각의 특성을 분석하였다. 증착 온도 $200^{\circ}C$에서 성장한 박막의 경우에 614 nm에 피크를 갖는 주 적색 발광 피크가 관측되었으며, 열처리 온도를 달리한 박막의 경우에는 $920^{\circ}C$에서 가장 강한 발광 피크가 나타났다. UV-VIS 분광광도계를 사용하여 박막의 투과도와 흡광도를 측정하였으며, Tauc의 모델을 사용하여 밴드갭 에너지를 계산하였다. 증착 온도 변화에 따라 성장된 박막의 투과도는 평균 82% 이상 이었으며 밴드갭 에너지는 4.1 eV이었다. 박막의 결정 구조는 단사정계임을 확인하였다. 특히, 결정 입자, 발광 피크의 세기와 투과도의 상관 관계를 조사하였다.

• Progress in Medical Physics
• /
• v.9 no.3
• /
• pp.143-154
• /
• 1998

The image intensifier is the key component which determines the imaging characteristics in a fluoroscopic imaging system. A system performance program for clinical evaluation of two image intensifiers, that is simple, non-invasive and time effective, was described. Tests were grouped into three headings: x-ray generator, image quality, and collimation. For the x-ray generator, the kVp accuracy and the automatic exposure control operation were compared. Low- and high-contrast resolution measurements, and mesh pattern study belong to the image quality tests and those tests were performed for the video monitor and photospot images. For the collimation, usable field diameter and image distortion of image intensifiers were measured and quantified. The procedures and the results are hoped to be used for the clinical evaluation of system performance and/or acceptance tests for image intensifiers.

• Journal of radiological science and technology
• /
• v.37 no.3
• /
• pp.187-193
• /
• 2014

The purpose of this study was to analyze the effect on the selectivity on of high-voltage rectification device that measured the performance of the grid, and the contrast improvement ability (K factor) by measuring the scattered radiation content of the transmitted X-rays. The scattered radiation generated when the X-ray flux comes from the diagnostic X-ray generator that passes through an object. Targeting four different rectifications of X-ray generators, the mean value of the tube voltage and the tube current was measured in order to maximize the accuracy of the generating power dose within the same exposure condition. Using fluorescence meter, the content of the scattered rays that are transmitted through the acrylic was measured depending on the grid usage. When grid is not used, the content of the scattered rays was the lowest (34.158%) with the single-phase rectifier, was increased with the inverter rectifier (37.043%) and the three-phase 24-peak rectification method (37.447%). The difference of the scattered radiation content of each device was significant from the lowest 0.404% to the highest 3.289% while using 8:1 grid, the content of the scattered ray was the lowest with the single content of the scattered ray was the lowest with the single-phase rectifier (18.258%), was increased with the rectifier (25.502%) and the 24-peaks rectification (24.217%). Furthermore, there was difference up to content 7.244% to the lowest content 1.285% within three-phase 24-peaks rectification, inverter rectifications, and single-phase rectifier depending on the selectivity of the grid. Drawn from the statistical analysis, there was a similar relationship between the contrast improvement factor and the K factor. As a result, the grid selectivity and the contrast were increased within the single-phase rectifier rather than the constant voltage rectifier.

• Journal of the Institute of Electronics Engineers of Korea SP
• /
• v.48 no.3
• /
• pp.119-124
• /
• 2011

Interpolation filters are widely used in many communication and multimedia applications. Polynomial interpolation computes the coefficients of the polynomial according to the input information to obtain the interpolated value. Recently, FIR interpolation method using supplementary filters was proposed to improve the performances of polynomial interpolation methods. In this paper, by combining a weighting factor approach with the supplementary filter method, we propose a weighted interpolation method which can be efficiently used to compute the maximum or minimum values of a given curve using only a restricted number of sample values. With application to the interpolation of normal distribution curves used in XRF systems, it is shown that the proposed approach exhibits improved performances compared with conventional interpolation methods.